JPS63152243U - - Google Patents

Info

Publication number
JPS63152243U
JPS63152243U JP4374987U JP4374987U JPS63152243U JP S63152243 U JPS63152243 U JP S63152243U JP 4374987 U JP4374987 U JP 4374987U JP 4374987 U JP4374987 U JP 4374987U JP S63152243 U JPS63152243 U JP S63152243U
Authority
JP
Japan
Prior art keywords
wiring pattern
protrusion
probe card
insulating substrate
flexible insulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4374987U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4374987U priority Critical patent/JPS63152243U/ja
Publication of JPS63152243U publication Critical patent/JPS63152243U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP4374987U 1987-03-25 1987-03-25 Pending JPS63152243U (US06262066-20010717-C00315.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4374987U JPS63152243U (US06262066-20010717-C00315.png) 1987-03-25 1987-03-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4374987U JPS63152243U (US06262066-20010717-C00315.png) 1987-03-25 1987-03-25

Publications (1)

Publication Number Publication Date
JPS63152243U true JPS63152243U (US06262066-20010717-C00315.png) 1988-10-06

Family

ID=30860905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4374987U Pending JPS63152243U (US06262066-20010717-C00315.png) 1987-03-25 1987-03-25

Country Status (1)

Country Link
JP (1) JPS63152243U (US06262066-20010717-C00315.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000200812A (ja) * 1990-02-16 2000-07-18 Glenn J Leedy 高密度探触点を使用した集積回路の製作および試験方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000200812A (ja) * 1990-02-16 2000-07-18 Glenn J Leedy 高密度探触点を使用した集積回路の製作および試験方法

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