JPS63148863U - - Google Patents

Info

Publication number
JPS63148863U
JPS63148863U JP4191987U JP4191987U JPS63148863U JP S63148863 U JPS63148863 U JP S63148863U JP 4191987 U JP4191987 U JP 4191987U JP 4191987 U JP4191987 U JP 4191987U JP S63148863 U JPS63148863 U JP S63148863U
Authority
JP
Japan
Prior art keywords
circuit
eddy current
flaw detector
current flaw
impedance measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4191987U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4191987U priority Critical patent/JPS63148863U/ja
Publication of JPS63148863U publication Critical patent/JPS63148863U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Description

【図面の簡単な説明】
第1図は本考案渦電流探傷器の一実施例の系統
図である。 1…探触子、2…高周波発生回路、3…インピ
ーダンス測定回路、4…増巾回路、5…メーター
、6…インピーダンス基準設定・比較回路、7…
表示回路。

Claims (1)

    【実用新案登録請求の範囲】
  1. 高周波発生回路を内蔵している渦電流探傷器に
    おける探触子のコイルに、インピーダンス測定回
    路を接離可能に接続するとともに、同インピーダ
    ンス測定回路出力側にインピーダンス基準設定・
    比較回路を接続したことを特徴とする渦電流探傷
    器。
JP4191987U 1987-03-20 1987-03-20 Pending JPS63148863U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4191987U JPS63148863U (ja) 1987-03-20 1987-03-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4191987U JPS63148863U (ja) 1987-03-20 1987-03-20

Publications (1)

Publication Number Publication Date
JPS63148863U true JPS63148863U (ja) 1988-09-30

Family

ID=30857359

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4191987U Pending JPS63148863U (ja) 1987-03-20 1987-03-20

Country Status (1)

Country Link
JP (1) JPS63148863U (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010271317A (ja) * 2009-05-20 2010-12-02 Prueftechnik Dieter Busch Ag 誘導測定用の装置ならびに方法
JP2011247631A (ja) * 2010-05-24 2011-12-08 Jtekt Corp 渦電流検出方法および渦電流検出センサ

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010271317A (ja) * 2009-05-20 2010-12-02 Prueftechnik Dieter Busch Ag 誘導測定用の装置ならびに方法
US9091717B2 (en) 2009-05-20 2015-07-28 Prüftechnik Dieter Busch AG Device and method for inductive measurements—self test
JP2011247631A (ja) * 2010-05-24 2011-12-08 Jtekt Corp 渦電流検出方法および渦電流検出センサ

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