JPS63135202U - - Google Patents

Info

Publication number
JPS63135202U
JPS63135202U JP2722187U JP2722187U JPS63135202U JP S63135202 U JPS63135202 U JP S63135202U JP 2722187 U JP2722187 U JP 2722187U JP 2722187 U JP2722187 U JP 2722187U JP S63135202 U JPS63135202 U JP S63135202U
Authority
JP
Japan
Prior art keywords
sample
stand
fixes
top surface
polishing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2722187U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2722187U priority Critical patent/JPS63135202U/ja
Publication of JPS63135202U publication Critical patent/JPS63135202U/ja
Pending legal-status Critical Current

Links

Landscapes

  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Details Of Measuring And Other Instruments (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本案の一実施例のゼロ点校正を行う時
の試料台周辺部の縦断面図、第2図は試料を研摩
するために試料貼付面を上にした状態を示す試料
台周辺部の縦断面図である。 1……試料台、2……試料、3……試料テーブ
ル、4……グラインダー(任意に上下に移動でき
る)。
Figure 1 is a vertical cross-sectional view of the area around the sample stand when performing zero point calibration in an embodiment of the present invention, and Figure 2 is a longitudinal cross-sectional view of the area around the sample stand when the surface to which the sample is attached is facing up for polishing the sample. FIG. 1...sample stand, 2...sample, 3...sample table, 4...grinder (can be moved up and down arbitrarily).

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料を固定する試料台と試料台を固定する試料
テーブルからなる研摩装置の試料保持部において
、上下対称形の試料台とこの試料台に試料を固定
した状態で上下どちら向きでも試料台の上面が同
じ高さになるような試料テーブルを設けたことを
特徴とする試料研摩装置。
In the sample holding part of the polishing device, which consists of a sample stand that fixes the sample and a sample table that fixes the sample stand, the top surface of the sample stand is vertically symmetrical and the top surface of the sample stand is fixed in either direction. A sample polishing device characterized by having sample tables that are at the same height.
JP2722187U 1987-02-27 1987-02-27 Pending JPS63135202U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2722187U JPS63135202U (en) 1987-02-27 1987-02-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2722187U JPS63135202U (en) 1987-02-27 1987-02-27

Publications (1)

Publication Number Publication Date
JPS63135202U true JPS63135202U (en) 1988-09-05

Family

ID=30829043

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2722187U Pending JPS63135202U (en) 1987-02-27 1987-02-27

Country Status (1)

Country Link
JP (1) JPS63135202U (en)

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