JPS63134542U - - Google Patents
Info
- Publication number
- JPS63134542U JPS63134542U JP2755487U JP2755487U JPS63134542U JP S63134542 U JPS63134542 U JP S63134542U JP 2755487 U JP2755487 U JP 2755487U JP 2755487 U JP2755487 U JP 2755487U JP S63134542 U JPS63134542 U JP S63134542U
- Authority
- JP
- Japan
- Prior art keywords
- internal circuit
- utility
- model registration
- scale integrated
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2755487U JPS63134542U (da) | 1987-02-26 | 1987-02-26 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2755487U JPS63134542U (da) | 1987-02-26 | 1987-02-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63134542U true JPS63134542U (da) | 1988-09-02 |
Family
ID=30829700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2755487U Pending JPS63134542U (da) | 1987-02-26 | 1987-02-26 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63134542U (da) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0954141A (ja) * | 1995-08-16 | 1997-02-25 | Nec Corp | テスト回路 |
-
1987
- 1987-02-26 JP JP2755487U patent/JPS63134542U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0954141A (ja) * | 1995-08-16 | 1997-02-25 | Nec Corp | テスト回路 |