JPS63129874U - - Google Patents
Info
- Publication number
- JPS63129874U JPS63129874U JP2313587U JP2313587U JPS63129874U JP S63129874 U JPS63129874 U JP S63129874U JP 2313587 U JP2313587 U JP 2313587U JP 2313587 U JP2313587 U JP 2313587U JP S63129874 U JPS63129874 U JP S63129874U
- Authority
- JP
- Japan
- Prior art keywords
- connector
- hybrid
- terminals
- terminal connected
- contact pins
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006243 chemical reaction Methods 0.000 claims description 3
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2313587U JPS63129874U (bs) | 1987-02-18 | 1987-02-18 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2313587U JPS63129874U (bs) | 1987-02-18 | 1987-02-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63129874U true JPS63129874U (bs) | 1988-08-24 |
Family
ID=30821176
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2313587U Pending JPS63129874U (bs) | 1987-02-18 | 1987-02-18 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63129874U (bs) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5834375A (ja) * | 1981-08-13 | 1983-02-28 | エンバイロシメンタル・プロセツシング・インコ−ポレイテツド | 集積回路デバイスのバ−ン・イン試験方法および装置 |
JPS6134482A (ja) * | 1984-07-26 | 1986-02-18 | Toshiba Corp | バ−ンインボ−ド |
-
1987
- 1987-02-18 JP JP2313587U patent/JPS63129874U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5834375A (ja) * | 1981-08-13 | 1983-02-28 | エンバイロシメンタル・プロセツシング・インコ−ポレイテツド | 集積回路デバイスのバ−ン・イン試験方法および装置 |
JPS6134482A (ja) * | 1984-07-26 | 1986-02-18 | Toshiba Corp | バ−ンインボ−ド |