JPS63129862U - - Google Patents
Info
- Publication number
- JPS63129862U JPS63129862U JP2219887U JP2219887U JPS63129862U JP S63129862 U JPS63129862 U JP S63129862U JP 2219887 U JP2219887 U JP 2219887U JP 2219887 U JP2219887 U JP 2219887U JP S63129862 U JPS63129862 U JP S63129862U
- Authority
- JP
- Japan
- Prior art keywords
- magnetic
- test article
- flaw detector
- magnetic flux
- magnetic sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005284 excitation Effects 0.000 claims description 5
- 230000004907 flux Effects 0.000 claims description 5
- 238000000034 method Methods 0.000 claims 1
- 229920006395 saturated elastomer Polymers 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 4
- 229910000831 Steel Inorganic materials 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 230000005415 magnetization Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987022198U JP2519501Y2 (ja) | 1987-02-18 | 1987-02-18 | 磁気探傷器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987022198U JP2519501Y2 (ja) | 1987-02-18 | 1987-02-18 | 磁気探傷器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63129862U true JPS63129862U (cs) | 1988-08-24 |
JP2519501Y2 JP2519501Y2 (ja) | 1996-12-04 |
Family
ID=30819353
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987022198U Expired - Lifetime JP2519501Y2 (ja) | 1987-02-18 | 1987-02-18 | 磁気探傷器 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2519501Y2 (cs) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011001771A1 (ja) * | 2009-07-01 | 2011-01-06 | 国立大学法人 岡山大学 | 漏洩磁束探傷方法及び装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52167087U (cs) * | 1977-06-16 | 1977-12-17 | ||
JPS61161659U (cs) * | 1985-03-28 | 1986-10-07 |
-
1987
- 1987-02-18 JP JP1987022198U patent/JP2519501Y2/ja not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52167087U (cs) * | 1977-06-16 | 1977-12-17 | ||
JPS61161659U (cs) * | 1985-03-28 | 1986-10-07 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011001771A1 (ja) * | 2009-07-01 | 2011-01-06 | 国立大学法人 岡山大学 | 漏洩磁束探傷方法及び装置 |
US9146214B2 (en) | 2009-07-01 | 2015-09-29 | National University Corporation Okayama University | Leakage magnetic flux flaw inspection method and device |
Also Published As
Publication number | Publication date |
---|---|
JP2519501Y2 (ja) | 1996-12-04 |
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