JPS63129862U - - Google Patents

Info

Publication number
JPS63129862U
JPS63129862U JP2219887U JP2219887U JPS63129862U JP S63129862 U JPS63129862 U JP S63129862U JP 2219887 U JP2219887 U JP 2219887U JP 2219887 U JP2219887 U JP 2219887U JP S63129862 U JPS63129862 U JP S63129862U
Authority
JP
Japan
Prior art keywords
magnetic
test article
flaw detector
magnetic flux
magnetic sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2219887U
Other languages
English (en)
Japanese (ja)
Other versions
JP2519501Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987022198U priority Critical patent/JP2519501Y2/ja
Publication of JPS63129862U publication Critical patent/JPS63129862U/ja
Application granted granted Critical
Publication of JP2519501Y2 publication Critical patent/JP2519501Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP1987022198U 1987-02-18 1987-02-18 磁気探傷器 Expired - Lifetime JP2519501Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987022198U JP2519501Y2 (ja) 1987-02-18 1987-02-18 磁気探傷器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987022198U JP2519501Y2 (ja) 1987-02-18 1987-02-18 磁気探傷器

Publications (2)

Publication Number Publication Date
JPS63129862U true JPS63129862U (cs) 1988-08-24
JP2519501Y2 JP2519501Y2 (ja) 1996-12-04

Family

ID=30819353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987022198U Expired - Lifetime JP2519501Y2 (ja) 1987-02-18 1987-02-18 磁気探傷器

Country Status (1)

Country Link
JP (1) JP2519501Y2 (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011001771A1 (ja) * 2009-07-01 2011-01-06 国立大学法人 岡山大学 漏洩磁束探傷方法及び装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52167087U (cs) * 1977-06-16 1977-12-17
JPS61161659U (cs) * 1985-03-28 1986-10-07

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52167087U (cs) * 1977-06-16 1977-12-17
JPS61161659U (cs) * 1985-03-28 1986-10-07

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011001771A1 (ja) * 2009-07-01 2011-01-06 国立大学法人 岡山大学 漏洩磁束探傷方法及び装置
US9146214B2 (en) 2009-07-01 2015-09-29 National University Corporation Okayama University Leakage magnetic flux flaw inspection method and device

Also Published As

Publication number Publication date
JP2519501Y2 (ja) 1996-12-04

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