JPS63128411U - - Google Patents

Info

Publication number
JPS63128411U
JPS63128411U JP1871687U JP1871687U JPS63128411U JP S63128411 U JPS63128411 U JP S63128411U JP 1871687 U JP1871687 U JP 1871687U JP 1871687 U JP1871687 U JP 1871687U JP S63128411 U JPS63128411 U JP S63128411U
Authority
JP
Japan
Prior art keywords
measuring device
length measuring
correction
measurement
measurement beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1871687U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1871687U priority Critical patent/JPS63128411U/ja
Publication of JPS63128411U publication Critical patent/JPS63128411U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)
JP1871687U 1987-02-13 1987-02-13 Pending JPS63128411U (nl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1871687U JPS63128411U (nl) 1987-02-13 1987-02-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1871687U JPS63128411U (nl) 1987-02-13 1987-02-13

Publications (1)

Publication Number Publication Date
JPS63128411U true JPS63128411U (nl) 1988-08-23

Family

ID=30812642

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1871687U Pending JPS63128411U (nl) 1987-02-13 1987-02-13

Country Status (1)

Country Link
JP (1) JPS63128411U (nl)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006133035A (ja) * 2004-11-04 2006-05-25 Nec Electronics Corp レーザ干渉測定装置およびレーザ干渉測定方法
JP2009236554A (ja) * 2008-03-26 2009-10-15 Mitsutoyo Corp 2波長レーザ干渉計評価校正方法、評価校正装置および評価校正システム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006133035A (ja) * 2004-11-04 2006-05-25 Nec Electronics Corp レーザ干渉測定装置およびレーザ干渉測定方法
JP2009236554A (ja) * 2008-03-26 2009-10-15 Mitsutoyo Corp 2波長レーザ干渉計評価校正方法、評価校正装置および評価校正システム

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