JPS63120177U - - Google Patents
Info
- Publication number
- JPS63120177U JPS63120177U JP1143587U JP1143587U JPS63120177U JP S63120177 U JPS63120177 U JP S63120177U JP 1143587 U JP1143587 U JP 1143587U JP 1143587 U JP1143587 U JP 1143587U JP S63120177 U JPS63120177 U JP S63120177U
- Authority
- JP
- Japan
- Prior art keywords
- power transistor
- thyristor element
- predetermined time
- test device
- power source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000006378 damage Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は本考案の一実施例を示す回路構成図、
第２図は本考案の一実施例での各制御信号のタイ
ミングチヤート、第３図は従来の試験装置を示す
回路概要図、第４図は従来の試験装置でのコレク
タ電流とターンオフサイリスタ（ＧＴＯ）のゲー
ト電流と電力用トランジスタ（ＧＴＲ）のベース
電流との関係を示した図である。
２１…ターンオフサイリスタ（サイリスタ素子
）、２３…電力用トランジスタ、３４…コレクタ
電流検出器（検出手段）、３５…スイツチング制
御回路（制御手段）、３６…破壊検出判定回路（
検出手段）、３７…タイマー（タイマー手段）。
FIG. 1 is a circuit diagram showing an embodiment of the present invention;
Fig. 2 is a timing chart of each control signal in an embodiment of the present invention, Fig. 3 is a circuit schematic diagram showing a conventional test equipment, and Fig. 4 is a diagram showing the collector current and turn-off thyristor (GTO) in the conventional test equipment. ) is a diagram showing the relationship between the gate current of the power transistor (GTR) and the base current of the power transistor (GTR). 21...Turn-off thyristor (thyristor element), 23...Power transistor, 34...Collector current detector (detection means), 35...Switching control circuit (control means), 36...Destruction detection judgment circuit (
detection means), 37...timer (timer means).
Claims (1)
素子と、このサイリスタ素子を介して流れる過電
流を遮断する過電流保護回路とを有し、電力用ト
ランジスタの逆バイアス安全動作領域を試験する
試験装置において、所定の時間を設定するタイマ
ー手段と、このタイマー手段に設定された所定時
間に応じて、前記サイリスタ素子と前記電力用ト
ランジスタにＯＮ／ＯＦＦのタイミング信号を与
え、前記サイリスタ素子と前記電力用トランジス
タを制御する制御手段と、前記電力用トランジス
タが破壊されたか否かを検出する検出手段とを具
備することを特徴とする試験装置。 In a test device for testing the reverse bias safe operating area of a power transistor, which includes a power source, a thyristor element connected in series with the power source, and an overcurrent protection circuit that blocks overcurrent flowing through the thyristor element. , timer means for setting a predetermined time, and applying an ON/OFF timing signal to the thyristor element and the power transistor according to the predetermined time set in the timer means; A test device comprising: a control means for controlling the power transistor; and a detection means for detecting whether or not the power transistor is destroyed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1143587U JPS63120177U (en) | 1987-01-30 | 1987-01-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1143587U JPS63120177U (en) | 1987-01-30 | 1987-01-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63120177U true JPS63120177U (en) | 1988-08-03 |
Family
ID=30798650
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1143587U Pending JPS63120177U (en) | 1987-01-30 | 1987-01-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63120177U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010175509A (en) * | 2009-02-02 | 2010-08-12 | Mitsubishi Electric Corp | Device for measuring reverse-bias area of safe operation |
| JP2012032327A (en) * | 2010-08-02 | 2012-02-16 | Advantest Corp | Testing device and testing method |
| CN102565657A (en) * | 2010-12-15 | 2012-07-11 | 爱德万测试株式会社 | Test apparatus |
-
1987
- 1987-01-30 JP JP1143587U patent/JPS63120177U/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010175509A (en) * | 2009-02-02 | 2010-08-12 | Mitsubishi Electric Corp | Device for measuring reverse-bias area of safe operation |
| JP2012032327A (en) * | 2010-08-02 | 2012-02-16 | Advantest Corp | Testing device and testing method |
| CN102565657A (en) * | 2010-12-15 | 2012-07-11 | 爱德万测试株式会社 | Test apparatus |
| US9057756B2 (en) | 2010-12-15 | 2015-06-16 | Advantest Corporation | Test apparatus |
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