JPS63120177U - - Google Patents
Info
- Publication number
- JPS63120177U JPS63120177U JP1143587U JP1143587U JPS63120177U JP S63120177 U JPS63120177 U JP S63120177U JP 1143587 U JP1143587 U JP 1143587U JP 1143587 U JP1143587 U JP 1143587U JP S63120177 U JPS63120177 U JP S63120177U
- Authority
- JP
- Japan
- Prior art keywords
- power transistor
- thyristor element
- predetermined time
- test device
- power source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000006378 damage Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1143587U JPS63120177U (de) | 1987-01-30 | 1987-01-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1143587U JPS63120177U (de) | 1987-01-30 | 1987-01-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63120177U true JPS63120177U (de) | 1988-08-03 |
Family
ID=30798650
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1143587U Pending JPS63120177U (de) | 1987-01-30 | 1987-01-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63120177U (de) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010175509A (ja) * | 2009-02-02 | 2010-08-12 | Mitsubishi Electric Corp | 逆バイアス安全動作領域測定装置 |
JP2012032327A (ja) * | 2010-08-02 | 2012-02-16 | Advantest Corp | 試験装置及び試験方法 |
CN102565657A (zh) * | 2010-12-15 | 2012-07-11 | 爱德万测试株式会社 | 测试装置 |
-
1987
- 1987-01-30 JP JP1143587U patent/JPS63120177U/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010175509A (ja) * | 2009-02-02 | 2010-08-12 | Mitsubishi Electric Corp | 逆バイアス安全動作領域測定装置 |
JP2012032327A (ja) * | 2010-08-02 | 2012-02-16 | Advantest Corp | 試験装置及び試験方法 |
CN102565657A (zh) * | 2010-12-15 | 2012-07-11 | 爱德万测试株式会社 | 测试装置 |
US9057756B2 (en) | 2010-12-15 | 2015-06-16 | Advantest Corporation | Test apparatus |