JPS63111651U - - Google Patents

Info

Publication number
JPS63111651U
JPS63111651U JP400887U JP400887U JPS63111651U JP S63111651 U JPS63111651 U JP S63111651U JP 400887 U JP400887 U JP 400887U JP 400887 U JP400887 U JP 400887U JP S63111651 U JPS63111651 U JP S63111651U
Authority
JP
Japan
Prior art keywords
cell
sample holding
chamber
retention chamber
retention
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP400887U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP400887U priority Critical patent/JPS63111651U/ja
Publication of JPS63111651U publication Critical patent/JPS63111651U/ja
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例を示すガス透過率測定
装置本体の概略縦断面図、第2図は試料挾持セル
を上側より視た要部の平面図、第3図は第2図上
X―X線部分の横断側面図、第4図は本考案の測
定原理を示す概略説明図である。 11……試料挾持セル、11A……上側セル、
11B……下側セル、12……ガス供給源、16
……循環恒温槽、20……高圧室、21……低圧
室、22……ガス導入口、32A,32B……停
留室。
Figure 1 is a schematic vertical sectional view of the main body of the gas permeability measuring device showing an embodiment of the present invention, Figure 2 is a plan view of the main parts of the sample holding cell viewed from above, and Figure 3 is the upper X in Figure 2. - A cross-sectional side view of the X-ray section, FIG. 4 is a schematic explanatory diagram showing the measurement principle of the present invention. 11...Sample holding cell, 11A...Upper cell,
11B...Lower cell, 12...Gas supply source, 16
...Circulation thermostat, 20...High pressure chamber, 21...Low pressure chamber, 22...Gas inlet, 32A, 32B...Retention chamber.

Claims (1)

【実用新案登録請求の範囲】 (1) 薄膜状の試料25を介して夫々、ガス供給
源12に連通する高圧室20と、真空ポンプ13
及び微圧ガスセンサー14に連通する低圧室21
とを有する試料挾持セル11内に適宜停留室32
A,32Bを設けて、循環恒温槽16より該停留
室32A,32B内に湯水を循環送給せしめてガ
ス透過率を任意の温度で測定すべく成した温度制
御型ガス透過率測定装置。 (2) 実用新案登録請求の範囲第1項の記載に於
いて、停留室32Aを試料挾持セル11の上側セ
ル11A内に設けると共に、他方の停留室32B
を試料挾持セル11の下側セル11B内に設けて
、該停留室32Aと停留室32Bとの中間に試料
25を位置付けした温度制御型ガス透過率測定装
置。
[Claims for Utility Model Registration] (1) A high pressure chamber 20 and a vacuum pump 13, each communicating with a gas supply source 12 via a thin film sample 25.
and a low pressure chamber 21 communicating with the low pressure gas sensor 14
An appropriate retention chamber 32 is provided in the sample holding cell 11 having a
This is a temperature-controlled gas permeability measuring device which is equipped with thermostats A and 32B and is configured to circulate hot water from a circulation constant temperature bath 16 into the retention chambers 32A and 32B to measure gas permeability at an arbitrary temperature. (2) In the description of claim 1 of the utility model registration claim, the retention chamber 32A is provided in the upper cell 11A of the sample holding cell 11, and the retention chamber 32B is provided in the upper cell 11A of the sample holding cell 11.
is provided in the lower cell 11B of the sample holding cell 11, and the sample 25 is positioned between the retention chamber 32A and the retention chamber 32B.
JP400887U 1987-01-14 1987-01-14 Pending JPS63111651U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP400887U JPS63111651U (en) 1987-01-14 1987-01-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP400887U JPS63111651U (en) 1987-01-14 1987-01-14

Publications (1)

Publication Number Publication Date
JPS63111651U true JPS63111651U (en) 1988-07-18

Family

ID=30784285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP400887U Pending JPS63111651U (en) 1987-01-14 1987-01-14

Country Status (1)

Country Link
JP (1) JPS63111651U (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5027355U (en) * 1973-07-03 1975-03-29
JPS5127355U (en) * 1974-08-21 1976-02-27
JPS5912337A (en) * 1982-07-12 1984-01-23 Toshiba Corp Filter testing device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5027355U (en) * 1973-07-03 1975-03-29
JPS5127355U (en) * 1974-08-21 1976-02-27
JPS5912337A (en) * 1982-07-12 1984-01-23 Toshiba Corp Filter testing device

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