JPS63109673U - - Google Patents
Info
- Publication number
- JPS63109673U JPS63109673U JP132287U JP132287U JPS63109673U JP S63109673 U JPS63109673 U JP S63109673U JP 132287 U JP132287 U JP 132287U JP 132287 U JP132287 U JP 132287U JP S63109673 U JPS63109673 U JP S63109673U
- Authority
- JP
- Japan
- Prior art keywords
- main body
- semiconductor element
- jig main
- measuring jig
- lead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims 2
- 238000005259 measurement Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図ａ，ｂはこの考案の一実施例による半導
体素子の特性測定治具を示す構成図、第２図は従
来の測定治具の斜視図、第３図はＦＥＴの斜視図
である。
１……測定治具本体、２……測定治具の蓋、３
……プリント基板、４，５，６，７……接触端子
、４ａ，５ａ，６ａ，７ａ……ＦＥＴの各リード
端子、８……押えピン、９……ＦＥＴ、１０……
向き検出ピン、１１……マイクロスイツチ、１２
ａ，１２ｂ……切換リレー、１３……電源、１４
，１４ａ，１４ｂ，１４ｃ，１４ｄ……測定治具
より引き出されたケーブル、１５，１５ａ，１５
ｂ，１５ｃ，１５ｄ……ＤＣテスターへ接続され
るケーブル。
1A and 1B are block diagrams showing a jig for measuring characteristics of a semiconductor device according to an embodiment of the present invention, FIG. 2 is a perspective view of a conventional measurement jig, and FIG. 3 is a perspective view of an FET. 1... Measuring jig main body, 2... Measuring jig lid, 3
...Printed circuit board, 4, 5, 6, 7...Contact terminal, 4a, 5a, 6a, 7a...FET lead terminals, 8...Press pin, 9...FET, 10...
Orientation detection pin, 11...Micro switch, 12
a, 12b...Switching relay, 13...Power supply, 14
, 14a, 14b, 14c, 14d...Cables pulled out from the measurement jig, 15, 15a, 15
b, 15c, 15d...Cables connected to the DC tester.
Claims (1)
触させる複数個の接触端子を互いに絶縁して形成
した絶縁基板と、前記絶縁基板を搭載した測定治
具本体と、前記測定治具本体に開閉自在に結合さ
せ前記半導体素子のリード端子を押える押えピン
および半導体素子の表裏の向きを検出する向き検
出ピンを有する蓋と、前記向き検出ピンの位置に
対応してオン、オフするスイツチと、前記スイツ
チのオン、オフに対応して前記接触端子のリード
を切換える回路切換リレーとを備えたことを特徴
とする半導体素子の特性測定治具。 An insulating substrate formed by insulating each other with a plurality of contact terminals that respectively contact a plurality of lead terminals of a semiconductor element, a measuring jig main body on which the insulating substrate is mounted, and a measuring jig main body that is openably and closably coupled to the measuring jig main body. a lid having a holding pin for holding down the lead terminal of the semiconductor element and an orientation detection pin for detecting the front and back orientation of the semiconductor element; a switch that turns on and off in accordance with the position of the orientation detection pin; , and a circuit switching relay that switches the lead of the contact terminal in response to an OFF state.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP132287U JPS63109673U (en) | 1987-01-08 | 1987-01-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP132287U JPS63109673U (en) | 1987-01-08 | 1987-01-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63109673U true JPS63109673U (en) | 1988-07-14 |
Family
ID=30779120
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP132287U Pending JPS63109673U (en) | 1987-01-08 | 1987-01-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63109673U (en) |
-
1987
- 1987-01-08 JP JP132287U patent/JPS63109673U/ja active Pending