JPS6310474U - - Google Patents

Info

Publication number

JPS6310474U

JPS6310474U JP10473686U JP10473686U JPS6310474U JP S6310474 U JPS6310474 U JP S6310474U JP 10473686 U JP10473686 U JP 10473686U JP 10473686 U JP10473686 U JP 10473686U JP S6310474 U JPS6310474 U JP S6310474U

Authority

JP

Japan

Prior art keywords

semiconductor device

measuring device

under test

measurement terminals

substrate

Prior art date

1986-07-08

Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Pending

Links

• Espacenet
• Global Dossier
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• 239000004065 semiconductor Substances 0.000 claims description 5
• 239000000758 substrate Substances 0.000 claims description 3
• 238000005259 measurement Methods 0.000 claims 2
• 239000006096 absorbing agent Substances 0.000 claims 1
• 238000010586 diagram Methods 0.000 description 3
• WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 3
• 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
• XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
• 229910052782 aluminium Inorganic materials 0.000 description 1
• 229910000859 α-Fe Inorganic materials 0.000 description 1