JPS6310410U - - Google Patents

Info

Publication number
JPS6310410U
JPS6310410U JP10441086U JP10441086U JPS6310410U JP S6310410 U JPS6310410 U JP S6310410U JP 10441086 U JP10441086 U JP 10441086U JP 10441086 U JP10441086 U JP 10441086U JP S6310410 U JPS6310410 U JP S6310410U
Authority
JP
Japan
Prior art keywords
thin plate
tip
probe
reference shaft
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10441086U
Other languages
Japanese (ja)
Other versions
JPH057533Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986104410U priority Critical patent/JPH057533Y2/ja
Publication of JPS6310410U publication Critical patent/JPS6310410U/ja
Application granted granted Critical
Publication of JPH057533Y2 publication Critical patent/JPH057533Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Details Of Measuring And Other Instruments (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図は本案の一実施例に係るもので、第1図は第
2図に示すX―X線矢視における装置全体の部分
断面側面図、第2図はベース面の平面図、第3図
は薄片板の測定状態の説明図である。 1:ベース、2:支柱、3:アーム、4:検出
器、5:測定子、6:測定子の先端弧状部、7:
調整台、9:基準軸、9a:軸上部、9b:基準
軸の先端弧状部、A:薄片板。
The figures relate to one embodiment of the present invention, in which Fig. 1 is a partial cross-sectional side view of the entire device taken along the line X--X shown in Fig. 2, Fig. 2 is a plan view of the base surface, and Fig. 3 is FIG. 3 is an explanatory diagram of a measurement state of a thin plate. 1: Base, 2: Support, 3: Arm, 4: Detector, 5: Measuring head, 6: Arc-shaped tip of measuring head, 7:
Adjustment table, 9: Reference shaft, 9a: Upper part of shaft, 9b: Arc-shaped tip of reference shaft, A: Thin plate.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ベース上に被測定物である薄片板を載置し、上
方より検出器の測定子を接触させ、もつて薄片板
の厚さを測定するようにしたものにおいて、測定
子と同一軸芯上で対向するベース位置に、薄片板
の載置水平レベル面より上方に先端を適宜量突出
できるように上下に進退自在にした基準軸を設け
、該基準軸と測定子のそれぞれの先端を弧状に形
成したことを特徴とする薄片板の厚さ測定装置。
A thin plate as the object to be measured is placed on a base, and the probe of the detector is brought into contact with it from above to measure the thickness of the plate. A reference shaft that can be moved up and down so that the tip can protrude an appropriate amount above the horizontal level surface on which the thin plate is placed is provided at the opposing base position, and the reference shaft and the tip of the probe are each formed into an arc shape. A thin plate thickness measuring device characterized by:
JP1986104410U 1986-07-07 1986-07-07 Expired - Lifetime JPH057533Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986104410U JPH057533Y2 (en) 1986-07-07 1986-07-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986104410U JPH057533Y2 (en) 1986-07-07 1986-07-07

Publications (2)

Publication Number Publication Date
JPS6310410U true JPS6310410U (en) 1988-01-23
JPH057533Y2 JPH057533Y2 (en) 1993-02-25

Family

ID=30977878

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986104410U Expired - Lifetime JPH057533Y2 (en) 1986-07-07 1986-07-07

Country Status (1)

Country Link
JP (1) JPH057533Y2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58193671U (en) * 1982-06-17 1983-12-23 富士通株式会社 photo drawing machine
JPS5919847A (en) * 1982-07-26 1984-02-01 Seiko Instr & Electronics Ltd Positioning method of standard sample
JPS6051553U (en) * 1983-09-16 1985-04-11 凸版印刷株式会社 automatic drawing device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6051553B2 (en) * 1981-08-06 1985-11-14 東燃料株式会社 Metalized polypropylene film

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58193671U (en) * 1982-06-17 1983-12-23 富士通株式会社 photo drawing machine
JPS5919847A (en) * 1982-07-26 1984-02-01 Seiko Instr & Electronics Ltd Positioning method of standard sample
JPS6051553U (en) * 1983-09-16 1985-04-11 凸版印刷株式会社 automatic drawing device

Also Published As

Publication number Publication date
JPH057533Y2 (en) 1993-02-25

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