JPS6310410U - - Google Patents
Info
- Publication number
- JPS6310410U JPS6310410U JP10441086U JP10441086U JPS6310410U JP S6310410 U JPS6310410 U JP S6310410U JP 10441086 U JP10441086 U JP 10441086U JP 10441086 U JP10441086 U JP 10441086U JP S6310410 U JPS6310410 U JP S6310410U
- Authority
- JP
- Japan
- Prior art keywords
- thin plate
- tip
- probe
- reference shaft
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Details Of Measuring And Other Instruments (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
図は本案の一実施例に係るもので、第1図は第
2図に示すX―X線矢視における装置全体の部分
断面側面図、第2図はベース面の平面図、第3図
は薄片板の測定状態の説明図である。
1:ベース、2:支柱、3:アーム、4:検出
器、5:測定子、6:測定子の先端弧状部、7:
調整台、9:基準軸、9a:軸上部、9b:基準
軸の先端弧状部、A:薄片板。
The figures relate to one embodiment of the present invention, in which Fig. 1 is a partial cross-sectional side view of the entire device taken along the line X--X shown in Fig. 2, Fig. 2 is a plan view of the base surface, and Fig. 3 is FIG. 3 is an explanatory diagram of a measurement state of a thin plate. 1: Base, 2: Support, 3: Arm, 4: Detector, 5: Measuring head, 6: Arc-shaped tip of measuring head, 7:
Adjustment table, 9: Reference shaft, 9a: Upper part of shaft, 9b: Arc-shaped tip of reference shaft, A: Thin plate.
Claims (1)
方より検出器の測定子を接触させ、もつて薄片板
の厚さを測定するようにしたものにおいて、測定
子と同一軸芯上で対向するベース位置に、薄片板
の載置水平レベル面より上方に先端を適宜量突出
できるように上下に進退自在にした基準軸を設け
、該基準軸と測定子のそれぞれの先端を弧状に形
成したことを特徴とする薄片板の厚さ測定装置。 A thin plate as the object to be measured is placed on a base, and the probe of the detector is brought into contact with it from above to measure the thickness of the plate. A reference shaft that can be moved up and down so that the tip can protrude an appropriate amount above the horizontal level surface on which the thin plate is placed is provided at the opposing base position, and the reference shaft and the tip of the probe are each formed into an arc shape. A thin plate thickness measuring device characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986104410U JPH057533Y2 (en) | 1986-07-07 | 1986-07-07 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986104410U JPH057533Y2 (en) | 1986-07-07 | 1986-07-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6310410U true JPS6310410U (en) | 1988-01-23 |
JPH057533Y2 JPH057533Y2 (en) | 1993-02-25 |
Family
ID=30977878
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986104410U Expired - Lifetime JPH057533Y2 (en) | 1986-07-07 | 1986-07-07 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH057533Y2 (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58193671U (en) * | 1982-06-17 | 1983-12-23 | 富士通株式会社 | photo drawing machine |
JPS5919847A (en) * | 1982-07-26 | 1984-02-01 | Seiko Instr & Electronics Ltd | Positioning method of standard sample |
JPS6051553U (en) * | 1983-09-16 | 1985-04-11 | 凸版印刷株式会社 | automatic drawing device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6051553B2 (en) * | 1981-08-06 | 1985-11-14 | 東燃料株式会社 | Metalized polypropylene film |
-
1986
- 1986-07-07 JP JP1986104410U patent/JPH057533Y2/ja not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58193671U (en) * | 1982-06-17 | 1983-12-23 | 富士通株式会社 | photo drawing machine |
JPS5919847A (en) * | 1982-07-26 | 1984-02-01 | Seiko Instr & Electronics Ltd | Positioning method of standard sample |
JPS6051553U (en) * | 1983-09-16 | 1985-04-11 | 凸版印刷株式会社 | automatic drawing device |
Also Published As
Publication number | Publication date |
---|---|
JPH057533Y2 (en) | 1993-02-25 |