JPS6295641A - Collecting system for fault information on system diagnosing device - Google Patents

Abstract

PURPOSE:To attain the effective use of an external memory part 60 and also to graspl accurately the generating tendency of fault, by deciding whether a produced fault is equal to the type of the fault already stored, then storing additionally the fault generating time point only when said fault is the same type as that already stored. CONSTITUTION:A system diagnosing device 10 is provided with a fault imformation collecting means 20 which collects the fault information when one of processors 1, 2...n has a fault, a fault information discriminating means 30 which checks whether or not the fault information having the same time as that collected by the means 20 is already stored in an external memory part 60, a fault generating time point storing means 40 which stores only the fault generating time point in the part 60 as long as the fault information stored in the part 60 is the same type as that collected by the means 20, a fault information storing means 50 which stores the collected fault information in the part 60 if the information of the part 60 is different from that collected by the means 20, and the part 60 which stores the fault information and the fault generating time poiint respectively.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a failure information collection method for a system diagnostic device in a computer system including a plurality of processing units, and particularly relates to the collection of failure information when the same type of failure occurs frequently.

[Conventional technology]

Conventionally, in this type of computer system, in the case of a minor failure that does not cause the system to stop, such as a command retry success failure in the main unit, the failed part is not immediately replaced, and if the failure occurs frequently (if the problem occurs, then the corrective action is to replace it). is taken.

The conventional fault information collection method for system diagnostic equipment to understand trends in the frequency of such faults is to store a large amount of fault information that occurs each time a fault occurs in an external storage unit. For new failures, the accompanying failure information is stored as is in the external storage unit, but in the case of a failure of the same type as a previous failure, only the number of times the failure has occurred is counted and stored in the external storage unit. There are methods to replace the failed part, and it is determined whether or not a failed part needs to be replaced by referring to the external storage unit at the necessary time.

[Problem that the invention seeks to solve]

In the conventional fault information collection method of the system diagnostic device described above, in the case of a method in which a large amount of fault information that occurs accompanying each fault is stored directly in the external storage section, the capacity of the external storage section is limited. Therefore, it has the disadvantage that it cannot accumulate enough information to know the tendency of occurrence of similar types of failures.

Furthermore, in the case of the method of storing the number of failure occurrences, there is a drawback that it is not possible to determine the appropriate time to replace the failed part because the interval between failure occurrences is not known.

In view of the above-mentioned points, an object of the present invention is to provide a fault information collection method for a system diagnostic device that can accurately know the trend of fault occurrence while effectively using an external storage unit.

(Means for Solving the Problems) The fault information collection method of the system diagnostic device of the present invention is a system diagnostic system that includes an external storage unit that is connected to a plurality of processing units via a diagnostic interface and has a plurality of fault information storage areas. In the apparatus, a failure information collecting means collects failure information of the processing apparatus via the diagnostic interface when the processing apparatus has a failure, and a failure information collecting means collects the failure information collected by the failure information collecting means in one of the external storage units. A fault information storage means for storing fault information in a fault information storage area, and determining whether a fault of the same type as the fault information has already occurred and the fault information is stored in one fault information storage area of the external storage unit. Fault information determining means; and a fault occurrence time storage for additionally storing the time of occurrence of the fault in the corresponding fault information storage area of the external storage unit when the fault information discriminating means determines that the same type of fault information is stored. means.

〔Example〕

Next, the present invention will be explained with reference to the drawings.

FIG. 1 is a block diagram showing one embodiment of the present invention. The fault information collection method of the system diagnostic device of this embodiment is based on a plurality of processing devices 1, 2, . ..., n and system diagnostic device 10
It consists of a processing device 1, 2. ....

n are the system diagnostic device lO and the diagnostic interface 71, 72 . ...? connected via n.

The system diagnostic device IO includes processing devices 1.2. ....

A failure information collection means 20 that collects failure information when any one of n is in a failure state, and failure information of the same type as the failure information collected by the failure information collection means 20 is stored in an external storage unit (fault information file) 60. Fault information determination means 30 checks whether the fault information has already been stored in the external storage unit 60, fault occurrence time storage means 40 stores the time at which the fault occurred in the external storage unit 60 if the fault is of the same type; The fault information storage means 50 is configured to be stored in a storage section 60, and an external storage section 60 is used to store fault information and the time of occurrence of the fault.

Next, the operation of the failure information collection method of the system diagnostic apparatus of this embodiment configured as described above will be described in detail with reference to the drawings.

Now, if a failure occurs in the processing device l, the failure information collection means 20 in step 21 calls the diagnostic interface 71.
The fault information (1) is collected from the processing device 1 via the processor 1, temporarily stored in its own memory, and the fault information determining means 30 is activated.

Fault information ■ generally includes processing device name Im, occurrence time IT,
It consists of failure type (retry success and others Mt, retry success detailed type (■), and failure detailed data Il).

In step 31, the fault information determining means 30 checks whether the fault type (■) of the fault information I in its own memory is a retry successful failure, and in step 32, the processing device name (■) is determined.

and retry success details type ■. It is checked whether matching failure information already exists in the external storage unit 60.

If either of the judgment conditions in step 31 or step 32 is not satisfied, it is regarded as a new type of failure, and the failure information stored in the own memory is transferred to the failure information storage means 50 to be stored in the external storage unit 60. Transfer control. In step 51, the failure information storage means 50 transfers the failure information in its own memory to the "next storage position" in the corresponding group of the retry success failure information group or other failure information groups in the external storage unit 60. do. For example, the fault information is stored as new fault information Z or α in the next storage location ■ or ■.

Further, if both the determination conditions of step 31 and step 32 are satisfied, control is transferred to the failure occurrence time storage means 40 to store the failure occurrence time. Failure occurrence time storage means 4
0 stores the occurrence time of the fault information in its own memory in the "next storage position" of the fault occurrence time storage area of the matching fault information in the external storage unit 60 in step 41. That is, if the failure information collected due to the occurrence of a failure is of the same type as the failure information that has already been collected and stored, only the time of occurrence of the failure is recorded. Then, the time of failure occurrence is stored in the next storage position ■ in the failure time storage area of failure information A.

〔Effect of the invention〕

As described above, the present invention has the effect of accurately grasping the trend of failure occurrence while effectively using the capacity of the external storage unit by additionally storing only the failure occurrence time for the same type of failure information.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 is a flowchart showing processing in the failure information collection method of the system diagnostic apparatus shown in FIG. In the figure, 1 to n...processing device, 10...system diagnostic device, 20...failure information collection means, 30...fault information determination means, 40... Failure occurrence time storage means, 50...
Failure information storage means, 60...external storage unit ([harm information file), 71
~7n... Diagnostic interface.

Claims (1)

[Scope of Claims] A system diagnostic device comprising an external storage unit connected to a plurality of processing devices via a diagnostic interface and having a plurality of fault information storage areas, wherein the processing is performed via the diagnostic interface when a failure occurs in the processing device. a failure information collection means for collecting failure information of the device; a failure information storage means for storing the failure information collected by the failure information collection means in one failure information storage area of the external storage unit; and the failure information. a fault information discriminating means for determining whether the same kind of fault has already occurred and the fault information is stored in one fault information storage area of the external storage unit; Fault information collection for a system diagnostic device, comprising: a fault occurrence time storage means for additionally storing the fault occurrence time in a corresponding fault information storage area of the external storage unit when it is determined that the fault has occurred. method.