JPS6294592U - - Google Patents

Info

Publication number
JPS6294592U
JPS6294592U JP18602185U JP18602185U JPS6294592U JP S6294592 U JPS6294592 U JP S6294592U JP 18602185 U JP18602185 U JP 18602185U JP 18602185 U JP18602185 U JP 18602185U JP S6294592 U JPS6294592 U JP S6294592U
Authority
JP
Japan
Prior art keywords
workpiece
contact electrode
contacts
socket
dropping guide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18602185U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18602185U priority Critical patent/JPS6294592U/ja
Publication of JPS6294592U publication Critical patent/JPS6294592U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の１実施例を示し、垂直断面を
模式化して描いた説明図である。第２図は薄形Ｉ
Ｃの斜視図、第３図は従来のＩＣソケツトの説明
図である。 １……パツケージ、２……リード、３……ソケ
ツト本体、３ａ……凹部、４……コンタクト電極
、５……落下ガイド、５ａ……テーパ状斜面、６
……薄形ＩＣ、７……ハンマ、７ａ……枢支軸、
７ｂ……アーム、Ａ……ＩＣの所定の位置、Ｄ…
…ハンマ駆動装置。 FIG. 1 shows one embodiment of the present invention, and is an explanatory diagram schematically depicting a vertical cross section. Figure 2 shows thin type I
A perspective view of C and FIG. 3 are explanatory diagrams of a conventional IC socket. DESCRIPTION OF SYMBOLS 1... Package cage, 2... Lead, 3... Socket body, 3a... Recessed part, 4... Contact electrode, 5... Drop guide, 5a... Tapered slope, 6
... Thin IC, 7 ... Hammer, 7a ... Pivot shaft,
7b...Arm, A...Predetermined position of IC, D...
...Hammer drive device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ＩＣのリードに対向、当接して導通するコンタ
クト電極と、ＩＣのパツケージに摺触して該ＩＣ
を所定の位置に誘導するテーパ状斜面とを設けた
ワーク落下ガイドとを備えたＩＣソケツトにおい
て、上記のワーク落下ガイドに対して衝撃および
振動の少なくとも何れか一方を与える手段を設け
たことを特徴とする、ＩＣの挿入を容易にならし
めたＩＣソケツト。 A contact electrode that faces and contacts the leads of an IC and is electrically conductive, and a contact electrode that contacts the IC package and connects the IC.
An IC socket equipped with a workpiece dropping guide provided with a tapered slope for guiding the workpiece to a predetermined position, characterized in that means is provided for applying at least one of shock and vibration to the workpiece dropping guide. An IC socket that makes it easy to insert an IC.
JP18602185U 1985-12-04 1985-12-04 Pending JPS6294592U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18602185U JPS6294592U (en) 1985-12-04 1985-12-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18602185U JPS6294592U (en) 1985-12-04 1985-12-04

Publications (1)

Publication Number Publication Date
JPS6294592U true JPS6294592U (en) 1987-06-16

Family

ID=31135196

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18602185U Pending JPS6294592U (en) 1985-12-04 1985-12-04

Country Status (1)

Country Link
JP (1) JPS6294592U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005339894A (en) * 2004-05-25 2005-12-08 Three M Innovative Properties Co Socket for testing ball grid array integrated circuit
JP2015072158A (en) * 2013-10-02 2015-04-16 三菱電機株式会社 Semiconductor test jig, transportation jig thereof, and foreign substance removing method using the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005339894A (en) * 2004-05-25 2005-12-08 Three M Innovative Properties Co Socket for testing ball grid array integrated circuit
JP2015072158A (en) * 2013-10-02 2015-04-16 三菱電機株式会社 Semiconductor test jig, transportation jig thereof, and foreign substance removing method using the same

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