JPS6287487A - Formation of single crystal doped with impurity - Google Patents

Formation of single crystal doped with impurity

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Publication number
JPS6287487A
JPS6287487A JP22938185A JP22938185A JPS6287487A JP S6287487 A JPS6287487 A JP S6287487A JP 22938185 A JP22938185 A JP 22938185A JP 22938185 A JP22938185 A JP 22938185A JP S6287487 A JPS6287487 A JP S6287487A
Authority
JP
Japan
Prior art keywords
single crystal
impurity
compound
halogen
doped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22938185A
Other languages
Japanese (ja)
Inventor
Yoshiro Akagi
与志郎 赤木
Yoshiharu Nakajima
義晴 中嶋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP22938185A priority Critical patent/JPS6287487A/en
Publication of JPS6287487A publication Critical patent/JPS6287487A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To obtain a compound single crystal uniformly doped with an impurity, by using a reaction product of a halogen (compound) with at least one constituent element of the single crystal as a transporting substance. CONSTITUTION:At least one of constituent element of a single crystal, e.g. ZnS or CdS, is mixed with a doping impurity, e.g. Mn or Cr and, as necessary, heat-treated at 800-900 deg.C for several hours. The resultant mixture 2 is then put in a single crystal growth vessel 1 hermetically sealing a halogen (compound) selected from Cl, Br, I or hydrides thereof and heated at a temperature gradient to provide the maximum temperature in the mixture part 2. The aimed single crystal doped with the impurity is grown on the substrate 3.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は不純物を均質にドープした化合物単結晶の形成
方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for forming a compound single crystal homogeneously doped with impurities.

(従来技術およびその問題点) 従来、不純物をドープした結晶を形成する方法としては
薄膜へのイオン注入法、化学気相反応法(CVD)等の
気相成長法の他に、液相成長、ゾリッンマン法なとが存
在′fl−ろ。これらの中に(」大規模生産技術として
確立したしのムあるか、tilt Ir’f−したもの
の殆んどは弔−元素から成る結晶の場合であり、二種以
上の元素から成る化合物半導体等には多くの困難が伴う
。二種以」二の元素の単結晶に不純物をドープする場合
に上記方法を用いろと、不純物の偏析、母結晶の組成ず
れ等の種々の問題が発生する。特に、n−vt族あるい
はm −v族化合物は構成元素の蒸気圧が元素の種類に
より大きく異っており、結晶形成の際の組成ズレ等の問
題は−・層深刻かつ複雑となる。
(Prior art and its problems) Conventionally, methods for forming impurity-doped crystals include ion implantation into thin films, chemical vapor deposition (CVD), and other vapor phase growth methods, as well as liquid phase growth, The Zollinman method does exist. Some of these are crystals that have been established as large-scale production technology, and most of them are crystals made of elements, and compound semiconductors made of two or more elements. If the above method is used to dope a single crystal of two or more elements with impurities, various problems will occur such as segregation of impurities and compositional deviation of the mother crystal. In particular, in n-vt group or m-v group compounds, the vapor pressure of the constituent elements varies greatly depending on the type of element, and problems such as compositional deviation during crystal formation become even more serious and complicated.

この様な問題のうち化合物結晶の組成ズレを防ぐために
いくつかの単結晶形成法が提案されている。代表的な方
法として分子線エピタキシ 法(MBE法)が挙げられ
ろ。この方法(」化合物元素を交互に一層づつ結晶化さ
せることにより薄膜単結晶を形成させろものである。原
理的にMIIE法は良質の薄膜単結晶か得られ、制御さ
れた不純物トピングら可能である。しかしながら、現(
1:のところ、この方法は対象元素が限定され、かつ非
常に高価な装置を使用しなければならない。
Among these problems, several single crystal formation methods have been proposed to prevent compositional deviations in compound crystals. Molecular beam epitaxy (MBE) is a typical method. This method involves forming thin film single crystals by crystallizing compound elements layer by layer alternately. In principle, the MIIE method can yield high quality thin film single crystals and allows for controlled impurity topping. .However, currently (
1: However, in this method, the target elements are limited and very expensive equipment must be used.

また、化学的に活性なハロゲン単体あるいはハロゲン化
合物を化学輸送物質として使用し、気相を介して結晶成
長を行なう気相化学成長法も提案されている。この方法
はハロゲン単体あるいはハロゲン化合物の持つ化学的性
質を利用したもので、成長単結晶の本来の融解温度以下
の低温で化合物単結晶を成長させる。しかしながら、こ
の方法は純度の高い化合物単結晶の形成のみに利用され
、不純物のドーピングには用いられていない。
Further, a vapor phase chemical growth method has also been proposed in which a chemically active halogen alone or a halogen compound is used as a chemical transport substance and crystal growth is performed through the vapor phase. This method utilizes the chemical properties of a single halogen or a halogen compound, and grows a compound single crystal at a low temperature below the original melting temperature of the growing single crystal. However, this method is used only for forming a highly pure compound single crystal, and is not used for doping with impurities.

(発明の構成) 本発明は、不純のドーピングにハロゲン単化またはその
化合物を用いるものである。即ち、本発明はハロゲン単
体および/またはハロゲンと単結晶構成元素の少なくと
も一種との反応物を輸送物質として用いることによる不
純物ドープ化合物単結晶の形成方法を提供する。
(Structure of the Invention) The present invention uses a single halogen or a compound thereof for impurity doping. That is, the present invention provides a method for forming an impurity-doped compound single crystal by using an elemental halogen and/or a reaction product of a halogen and at least one of the constituent elements of the single crystal as a transport substance.

ハロゲン元素はその電子構造から一般に化学的活性に富
み、はとんど全ての遷移金属元素及びB族金属で構成さ
れる約80種の金属元素はノ10ゲン元素と1つ以」二
の化合物を形成する。これらの化合物は常温ではイオン
結晶から融点の低い分子性結晶、液体と様々な相で存在
ずろなと化合物の種類、存在状態の種類は非常に多岐に
亘っている。
Halogen elements are generally rich in chemical activity due to their electronic structure, and about 80 metal elements, which are composed of almost all transition metal elements and group B metals, are compounds with one or more halogen elements. form. These compounds exist in various phases such as ionic crystals, molecular crystals with low melting points, and liquids at room temperature, and the types of compounds and the types of states in which they exist are extremely diverse.

これらの事実は適当なハロゲン単体あるいはハロゲン化
合物を単結晶気相成長の際の輸送物質として活用すれば
比較的1j広い濃度で不純物を母結晶原料と同時に輸送
でき、従って均質に不純物ドープされた良質の母結晶を
母結晶の融点以下の比較的低温で育成しうろことを可能
にずろものである。
These facts show that if a suitable single halogen or a halogen compound is used as a transport material during single crystal vapor phase growth, impurities can be transported simultaneously with the mother crystal raw material in a relatively wide range of concentrations. It is possible to grow the mother crystal at a relatively low temperature below the melting point of the mother crystal.

使用し得るハロゲンはフッ素、塩素、臭素、ヨウ素等で
あるが、取扱いが容易な塩素、臭素、ヨウ素、あるいは
それらの水素化物が好ましい。
Usable halogens include fluorine, chlorine, bromine, and iodine, but chlorine, bromine, iodine, or hydrides thereof are preferred because they are easy to handle.

ハロゲンと単結晶構成元素の少なくとも一種との反応物
としては、例えば単結晶構成元素(不純物かドーピング
されたもの)がZnS、CdSなどである場合には各々
ZnI2、CdL、ZnCρ2、CdCl27等が挙げ
られる。
Examples of reactants of halogen and at least one of the single crystal constituent elements include ZnI2, CdL, ZnCρ2, CdCl27, etc. when the single crystal constituent element (impurity or doped) is ZnS, CdS, etc. It will be done.

化合物単結晶の母結晶としてはI−Vl族化合物、11
−■族化合物、n−v族化合物、n−vr族化合物、I
−V族化合物、III−Vl族化合物、IV−Vl族化
合物、MA−Vl族化合物、V−IV族化合物、■族混
晶等が例示される。また、上記母結晶中にドープされる
不純物としては、Mn、Cr、Vなどの遷移金属、Nd
、Pm55mなどのランタニド系金属をはじめとし、お
よそハロゲンと化合物を形成する元素は全て対象となり
うる。
As the mother crystal of the compound single crystal, I-Vl group compounds, 11
-■ group compound, n-v group compound, n-vr group compound, I
Examples thereof include -V group compounds, III-Vl group compounds, IV-Vl group compounds, MA-Vl group compounds, V-IV group compounds, and group II mixed crystals. In addition, impurities doped into the mother crystal include transition metals such as Mn, Cr, and V, Nd
All elements that form compounds with halogens, including lanthanide metals such as Pm55m and Pm55m, can be targeted.

本発明の化合物単結晶の形成方法は上記ハロゲンまたは
ハロゲン化合物を輸送物質として従来の気相化学反応法
に応用することができる。
The method for forming a compound single crystal of the present invention can be applied to a conventional gas phase chemical reaction method using the above halogen or halogen compound as a transport substance.

本発明の実施例を図面を参照して説明する。Embodiments of the present invention will be described with reference to the drawings.

寒嵐飢 不純物ドープした化合物単結晶育成の原料としては母結
晶の粉末結晶(ZnS)とドープ不純物(Mn、マンガ
ン)を混合したものを用い、必要によっては事前に 8
00〜900℃数時間の熱処理を行なう。この原料を閉
じた単結晶育成容器(1)内の一方(2)に置き、この
部分が最高温度になる様に容器を炉内に配置する。炉内
にばあらかしめ単結晶育成容器の全長に亘って原料部(
2)を最高温度として温度勾配がつけられており、基板
(3)に単結晶が生長する。結晶は最低温度部から育成
するが、単結晶育成容器内はハロゲン単体あるいはハロ
ゲン化合物を封入しである。炉の形態、種類は問わず鉛
直あるいは水平方向のどちらでも不純物ドープ化合物単
結晶育成は可能である。
As a raw material for growing compound single crystals doped with impurities, a mixture of mother crystal powder (ZnS) and doping impurities (Mn, manganese) is used.
Heat treatment is performed at 00 to 900°C for several hours. This raw material is placed in one side (2) of a closed single crystal growth container (1), and the container is placed in the furnace so that this part has the highest temperature. The raw material section (
A temperature gradient is set with 2) as the highest temperature, and a single crystal grows on the substrate (3). Crystals are grown from the lowest temperature region, and a single halogen or a halogen compound is sealed inside the single crystal growth container. It is possible to grow single crystals of impurity-doped compounds either vertically or horizontally, regardless of the shape or type of furnace.

また本実施例では閉じた容器内での反応をあげたが開管
式ではハロゲン化合物を原料部から単結晶育成部に向っ
てフローさせることにより上記実施例と同等の効果を生
み出しうる。
Further, in this example, the reaction was performed in a closed container, but in an open tube system, the same effect as in the above example can be produced by causing the halogen compound to flow from the raw material section to the single crystal growth section.

以上の様な方法により単結晶成長させた微量不純物マン
ガンドープ立方晶系硫化亜鉛(ZnS  :Mn”)に
ついて得られた結果を上記実施例の一例として述べる。
The results obtained for cubic zinc sulfide (ZnS:Mn'') doped with a small amount of manganese, which was grown as a single crystal by the method described above, will be described as an example of the above embodiment.

単結晶成長したZnS  : Mn”中のMn”+濃度
は原料多結晶中のM n ”+の濃度と比べると約09
7倍でありほぼIとみなせることが分った。
Single-crystal grown ZnS: The Mn''+ concentration in Mn'' is approximately 0.09% compared to the Mn''+ concentration in the raw material polycrystal.
It turns out that it is 7 times as large and can be considered almost I.

±2%程度の実験誤差を考慮すれば育成結晶中の不純物
は原料部の組成とほぼ同一の組成でドープされているこ
とを示しており不純物ドーピングの際量的な制御が十分
可能である事を意味する。
Considering the experimental error of about ±2%, this shows that the impurities in the grown crystal are doped with almost the same composition as the raw material, and it is possible to fully control the amount of impurity doping. means.

更に単結晶成長したZnS  : Mn’+中のM n
 ” ”イオンの囲わりの局所構造は立方対称であると
いう結果が電子スピン共鳴(第2図に示す。)実験の結
果から分ったが、これはMn’+イオンが非常に対称性
のよい位置に置換しておりこれは結晶性劣化の原因とな
る様な格子間への不純物原子の侵入がない事を意味して
おり良質な結晶が得られていることを示している。この
事はX線回折(第3図に示す。)の実験結果とも一致し
ている。
Further single crystal grown ZnS: Mn in Mn'+
`` ``It was found from the results of the electron spin resonance (shown in Figure 2) experiment that the local structure surrounding the ion has cubic symmetry, but this is because the Mn'+ ion has very good symmetry. This means that there is no intrusion of impurity atoms into the interstitial space that would cause deterioration of crystallinity, indicating that a high-quality crystal is obtained. This is consistent with the experimental results of X-ray diffraction (shown in Figure 3).

(発明の効果) 以上詳細に説明した様にこの発明によれば従来純粋な化
合物単結晶を育成する方法として用いられているハロゲ
ン単体あるいはハロゲン化合物を化学輸送物質とした気
相化学輸送法を用いることにより不純物を量的にも制御
性よく又母結晶の持つ結晶性を損うことなく母体化合物
結晶の融解温度よりも低温で育成できることが分った。
(Effects of the Invention) As explained in detail above, according to the present invention, a gas phase chemical transport method using a simple halogen or a halogen compound as a chemical transport substance, which has been conventionally used as a method for growing pure compound single crystals, is used. As a result, it was found that the amount of impurities can be controlled well and the growth can be performed at a temperature lower than the melting temperature of the parent compound crystal without impairing the crystallinity of the parent crystal.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は実施例で用いた反応容器を示す図である。図中
、(1)は単結晶育成容器、(2)は原料部、(3)は
基板を示す。 第2図は実施例により得られたマンガンドープ立方晶系
硫化亜鉛の電子スピン共鳴を示す図である。(9GH2
,100KHz変調、室温測定)=第3図には!ソ料の
X線透過ウラニ写真を示す。  、=8− 第3図 手続補正書動式) %式% 1事件の表示 昭和60年特許願第  229381   号2、発明
の名称 不純物ドープ単結晶形成方法 3、補正をする者 事件との関係 特許出願人 住所 大阪府大阪市阿倍野区長池町22番22号名称 
(504)   シャープ株式会社代表者    佐 
伯  旭 4、代理人 5補正命令の日付 昭和61年1月28日(発送1」)
6、補正の対象 明細書の図面の簡単な説明の欄および
図面の第3図 7、補正の内容 (1)明細書のV図面の簡単な説明」の欄、第8頁第7
行、[X線透過ウラエ写真」とあるを、「X線写真」に
訂正ずろ。 (2)明細書に添付した図面の第3図を別紙のとおり訂
正する。 以上 第3図
FIG. 1 is a diagram showing a reaction vessel used in Examples. In the figure, (1) shows a single crystal growth container, (2) shows a raw material part, and (3) shows a substrate. FIG. 2 is a diagram showing the electron spin resonance of the manganese-doped cubic zinc sulfide obtained in the example. (9GH2
, 100KHz modulation, room temperature measurement) = Figure 3! An X-ray transmission urani photograph of the SO material is shown. , = 8 - Figure 3 Procedural amendment written format) % formula % 1 Indication of case Patent application No. 229381 of 1985 2. Name of invention Impurity-doped single crystal formation method 3. Person making amendment Relationship with case Patent Applicant Address 22-22 Nagaike-cho, Abeno-ku, Osaka-shi, Osaka Name
(504) Sharp Corporation Representative Sa
Date of amendment order for Haku Asahi 4 and Agent 5: January 28, 1986 (Shipping 1)
6. Subject of amendment Column of brief explanation of the drawings in the specification and Figure 3, Figure 7 of the drawings, Contents of amendment (1) Column of ``V brief explanation of drawings'' of the specification, page 8, No. 7
In the line, the text "X-ray transmission urae photograph" should be corrected to "X-ray photograph." (2) Figure 3 of the drawings attached to the specification is corrected as shown in the attached sheet. Figure 3 above

Claims (1)

【特許請求の範囲】 1、ハロゲン単体および/またはハロゲン化合物と単結
晶構成元素の少なくとも一種との反応物を輸送物質とし
て用いることによる不純物ドープ化合物単結晶の形成方
法。 2、ハロゲンが塩素、臭素、ヨウ素、あるいはそれらの
水素化物である第1項記載の方法。 3、不純物ドープ化合物単結晶が不純物(M)ドープ硫
化セレン化亜鉛混晶(ZnSxSe_1_−_X:M、
0≦X≦1)である第1項記載の方法。
[Scope of Claims] 1. A method for forming an impurity-doped compound single crystal by using a reaction product of an elemental halogen and/or a halogen compound with at least one constituent element of the single crystal as a transport substance. 2. The method according to item 1, wherein the halogen is chlorine, bromine, iodine, or a hydride thereof. 3. Impurity-doped compound single crystal is impurity (M)-doped zinc sulfide selenide mixed crystal (ZnSxSe_1_-_X:M,
The method according to item 1, wherein 0≦X≦1).
JP22938185A 1985-10-14 1985-10-14 Formation of single crystal doped with impurity Pending JPS6287487A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22938185A JPS6287487A (en) 1985-10-14 1985-10-14 Formation of single crystal doped with impurity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22938185A JPS6287487A (en) 1985-10-14 1985-10-14 Formation of single crystal doped with impurity

Publications (1)

Publication Number Publication Date
JPS6287487A true JPS6287487A (en) 1987-04-21

Family

ID=16891286

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22938185A Pending JPS6287487A (en) 1985-10-14 1985-10-14 Formation of single crystal doped with impurity

Country Status (1)

Country Link
JP (1) JPS6287487A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2652358A1 (en) * 1989-09-26 1991-03-29 Episystems Oy Ltd METHOD OF DOPING A ZINC SULFIDE LAYER.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2652358A1 (en) * 1989-09-26 1991-03-29 Episystems Oy Ltd METHOD OF DOPING A ZINC SULFIDE LAYER.

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