JPS628534Y2 - - Google Patents

Info

Publication number
JPS628534Y2
JPS628534Y2 JP10378580U JP10378580U JPS628534Y2 JP S628534 Y2 JPS628534 Y2 JP S628534Y2 JP 10378580 U JP10378580 U JP 10378580U JP 10378580 U JP10378580 U JP 10378580U JP S628534 Y2 JPS628534 Y2 JP S628534Y2
Authority
JP
Japan
Prior art keywords
pulse
noise
voltage
test object
coupler
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10378580U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5728381U (sv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10378580U priority Critical patent/JPS628534Y2/ja
Publication of JPS5728381U publication Critical patent/JPS5728381U/ja
Application granted granted Critical
Publication of JPS628534Y2 publication Critical patent/JPS628534Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP10378580U 1980-07-22 1980-07-22 Expired JPS628534Y2 (sv)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10378580U JPS628534Y2 (sv) 1980-07-22 1980-07-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10378580U JPS628534Y2 (sv) 1980-07-22 1980-07-22

Publications (2)

Publication Number Publication Date
JPS5728381U JPS5728381U (sv) 1982-02-15
JPS628534Y2 true JPS628534Y2 (sv) 1987-02-27

Family

ID=29465171

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10378580U Expired JPS628534Y2 (sv) 1980-07-22 1980-07-22

Country Status (1)

Country Link
JP (1) JPS628534Y2 (sv)

Also Published As

Publication number Publication date
JPS5728381U (sv) 1982-02-15

Similar Documents

Publication Publication Date Title
Zhang et al. Measurement of noise source impedance of off-line converters
Cataliotti et al. High-frequency experimental characterization and modeling of six pack IGBTs power modules
CN110275125B (zh) 一种校准冲击电流测量装置动态特性的系统和方法
Langkowski et al. Spectral grid impedance identification on different voltage levels—Challenges and realization
JPS628534Y2 (sv)
Diouf et al. Wideband impedance measurements and modeling of DC motors for EMI predictions
ATE40751T1 (de) Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz.
Suriano et al. Prediction of radiated emissions from DC motors
Krotov et al. Comparison of PD patterns at power and very low frequency: Is diagnostic possible?
Morrison et al. Continuous overvoltages on AC traction systems
US2890410A (en) Impulse testing
US4451764A (en) Ignition system high voltage cable with minimized radio interference
Xie et al. Development of the 10 kV Wideband Combined Resistance-capacitance Voltage Divider Unit
DE2829407C2 (de) Prüfverfahren für Fehlerstrom- bzw. Fehlerspannungsschutzschalter in einer elektrischen Anlage und Schaltungsanordnung zur Durchführung des Prüfverfahrens
Liu et al. Behavioral modeling of an off-the-shelf damped sinusoidal transient generator
Sudhakar et al. Low cost Verification method for PC based Harmonics Power Analyzer
Mejecaze et al. Common mode modelling of a current injection source for susceptibility study
Meier Voltage stress on Y capacitors from indirect lightning pulses according to ED-14/DO-160
Ferraz et al. Construction of an impulse current generator prototype applied in electrical grounding systems
Digã et al. Considerations for some immunity tests to the disturbances to which LED luminaires are subjected
Othman et al. An improved circuit-based grounding electrode considering frequency dependence of soil parameters
CN212514979U (zh) 一种标定用高压纳秒脉冲发生器
Shiling Optimization Design Method of Impulse Current Generation Using MATLAB/SIMULINK
CN108957265B (zh) 高凝露地区瓷套vfto闪络特性下降率试验装置及方法
Zhao et al. One factor for oscillation on the front of impulse voltage waveforms