JPS6284762U - - Google Patents

Info

Publication number
JPS6284762U
JPS6284762U JP17574385U JP17574385U JPS6284762U JP S6284762 U JPS6284762 U JP S6284762U JP 17574385 U JP17574385 U JP 17574385U JP 17574385 U JP17574385 U JP 17574385U JP S6284762 U JPS6284762 U JP S6284762U
Authority
JP
Japan
Prior art keywords
guide block
lead
component
guide
prober
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17574385U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17574385U priority Critical patent/JPS6284762U/ja
Publication of JPS6284762U publication Critical patent/JPS6284762U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP17574385U 1985-11-15 1985-11-15 Pending JPS6284762U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17574385U JPS6284762U (ko) 1985-11-15 1985-11-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17574385U JPS6284762U (ko) 1985-11-15 1985-11-15

Publications (1)

Publication Number Publication Date
JPS6284762U true JPS6284762U (ko) 1987-05-29

Family

ID=31115342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17574385U Pending JPS6284762U (ko) 1985-11-15 1985-11-15

Country Status (1)

Country Link
JP (1) JPS6284762U (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015117991A (ja) * 2013-12-18 2015-06-25 アキム株式会社 プローブユニットおよびそれを用いた温度特性計測装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015117991A (ja) * 2013-12-18 2015-06-25 アキム株式会社 プローブユニットおよびそれを用いた温度特性計測装置

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