JPS6274836A - Handling apparatus for ic test - Google Patents

Abstract

PURPOSE:To obtain the handling apparatus, economizing labor and space, by loading a case after discharging ICs onto a transport belt on the loading side of an IC tester and detecting only the case which is perfectly made empty by a sensor and transporting said case to the unloading side. CONSTITUTION:A case 17 into which the ICs before test are accommodated is inserted into a chute part 12, and a case 17' after discharging ICs is loaded onto a transport belt 11 by driving a motor 13. Then, the rest ICs in the case 17' are detected by a sensor 16, and if ICs are detected, the elevation mechanism of the first stock part 151 is operated to accommodate the case as a case 18. When IC is not detected, the elevation mechanism of the second stock parts 152 is operated to accommodate the case as a vacant case 19. The case 19 is sent onto the transport belt 11 at a desired time, and the ICs 20 judged as good through test are accommodated in a certain quantity. Therefore, the handling apparatus for IC test can be obtained, economizing labor and space.

Description

DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in a handling device for IC testing.

[Technical background of the invention]

As a conventional handling device for IC testing, one having the structure shown in FIG. 3 is known. That is, A in the figure is the load side, and on this load side A, a first stock part 2 is arranged for stocking cases 1 containing ICs before testing. The case 1 is inserted into the test chute 3, and after the tC in the case 1 is discharged, the chute 3 is rotated and supplied to the second stock section 4.

Further, B in the figure is an unloading side, and a third stocking section 6 for stocking empty cases 5 is arranged on the unloading side B. Tested ICs are supplied to the empty case 5 through the chute section 3, and after a certain amount of the ICs are stored, they are supplied to the fourth stock section 7.

(Problems with Background Art) However, the above-mentioned handling device for IC testing shown in FIG. 3 has the following problems.

(2) Four stocking sections 2.4.6.7 are required for stocking cases on the loading side A and the unloading side B, making it difficult to save space in the handling device.

(2) As shown in FIG. 2, it is necessary to set the case 1 containing the IC before testing and the empty case 5 in the stack section 2.6, respectively, which reduces work efficiency.

[Purpose of the invention]

The present invention saves space and improves work efficiency by using only the case from which all ICs have been ejected from the case on the loading side as a storage case for tested ICs on the unloading side. The present invention aims to provide a handling device for IC testing.

[Summary of the invention]

The present invention includes a test chute section in which a case containing ICs is set and which sequentially supplies the ICs in the case to a test device, and a test chute section in which a tC determined as a non-defective product by the test device is stored in the case again. A conveyor belt having a terminal end located in an IC storage area, a moving means for moving a case set in the chute portion to a position near a starting end of the conveyor belt, and a means for determining whether or not there is an IC in the case moved onto the conveyor belt. a first stock part that is placed across the conveyor belt and stores a case that is determined to have an IC by the sensor; The present invention is characterized by comprising a second stock section that stores the cases determined to be the same and sends the cases onto the conveyor belt at a desired time. According to the present invention, as described above, only the case in which all the ICs have been ejected from the cases after ejecting the ICs on the loading side is used as a storage case for tested ICs on the unloading side, thereby saving money. It is possible to obtain an IC testing handling device that saves space and improves work efficiency.

C Embodiments of the Invention] Hereinafter, embodiments of the present invention will be described in detail with reference to FIGS. 1 and 2.

11 in the figure is a pair of conveyor belts for conveying a case for storing ICs, 12 is a case into which a case containing an IC is inserted, and the ICs in the case are sequentially supplied to a test device (not shown). This is the chute section for use. The conveyor belt 11 has a terminal end located in a tested IC storage area where ICs determined as good by the testing device are stored in the case again. Further, the chute section 12 can be rotated near the starting end of the conveyor belt 11 by a motor 13 serving as a moving means. In other words, the chute section 1
After ejecting the ICs in the cases inserted in the case 2 into the testing device from the chute section 12 one after another, the chute section 12 is rotated by the motor 13 to place the case above the starting end of the conveyor belt 11. It can be moved.

A sensor 16 for detecting the presence or absence of an IC in a case moved from the chute section 12 and conveyed by the belt 11 is located near the conveyor belt 11.
It is located across the . In addition, a first stock portion 15 supported by a support plate 141 is located near the conveyor belt 11.
1 is placed across the belt 11. This stock portion 151 is provided with a vertical deep groove (not shown) for storing and sending out the IC ejected cases transported by the transport belt 11. A second stock part 152 supported by a support plate 142 is arranged near the belt 11 located on the downstream side of the first stock part 151 (on the side in the moving direction of the Wi feed belt 11), straddling the belt 11. ing.

This stock portion 152 is provided with a vertical deep groove (not shown) for storing and sending out the IC ejected cases transported by the transport belt 11. In addition, sensor 1
6 is connected to the elevating mechanism of the first stock section 152, and when the sensor 16 detects that an IC remains in the ejected case, the elevating mechanism of the first stock section 151 is raised. A signal for storing the case in the first stock section 151 is output. Further, the sensor 16 is connected to the second
The sensor 1 is connected to the lifting mechanism of the stock part 152 of
6, when it is detected that there is no IC in the ejected case, a signal is outputted to raise the elevating mechanism of the second stock section 152 and store the case in the second stock section 152. The case stored in the second stock section 152 is sent out at a desired time, that is, when a predetermined number of good ICs have been stored in the case in the tested IC storage area near the end of the conveyor belt 11, as shown in the figure. This is done by outputting a signal to the elevating mechanism from the detecting section that does not move.

Next, the operation of the handling device for IC testing of the present invention will be explained.

First, the case 17 containing the IC before the test is inserted into the test chute 12, and the IC inside the case is discharged into the chute 12. The IC discharged into the chute section 12 is subjected to various reliability tests while passing through a testing device (not shown) to determine whether it is good or bad. After the ICs are ejected into the test chute section 12, the chute section 12 is rotated by the motor 13 toward the vicinity of the starting end of the conveyor belt 11, as shown in FIG. 11
It is placed on the belt 11 and conveyed to the sensor 16 side arranged on the belt 11. In the ejected case 17-, I
Since C may remain without being discharged, sensor 1
6, the presence or absence of an IC in the ejected case 17' is detected. At this time, when the IC is detected, the sensor 16 sends the first stock part 15! The detection signal is fed back to the elevating mechanism, and the elevating mechanism operates to stock the case 18 in which the IC remains in the first stocking section 151. On the other hand, if the IC is not detected, the signal is fed back from the sensor 16 to the elevating mechanism of the second stock section 152, and the elevating mechanism operates to store the empty case 19 in the second stock section. The empty cases 19 stocked in the second stock section 152 in this manner are delivered from the second stock section 152 onto the conveyor belt 11 at a desired time, and sent to the tested IC storage area near the end of the belt 11. Here, a predetermined amount of IC20 determined as a non-defective product by the above-mentioned test is stored.

Therefore, according to the handling device of the present invention, the sensor 16 selects only the case (one empty case) in which all ICs have been ejected from among the IC ejection and ejection cases 17' after the ICs have been ejected on the load side. By moving only one empty case to the tested IC storage area on the unloading side, it is possible to store the ICs 20 that have been determined to be good. As a result, the space required for the stock section can be significantly reduced compared to conventional equipment, and the handling operation is simply setting the case 17 containing the IC before testing into the test chute 12, which saves space and reduces work. A handling device with improved efficiency can be obtained.

In the above embodiment, a motor that rotates the chute was used as a moving means for transporting the ejected cases from the test chute onto the conveyor belt, but other moving means such as an air cylinder could also be used. May be used.

〔Effect of the invention〕

As detailed above, according to the present invention, only the case from which all ICs have been ejected after ejecting the ICs on the loading side can be used as a storage case for tested ICs on the unloading side, thereby saving space. , it is possible to provide a handling device for IC testing that achieves improved work efficiency.

[Brief explanation of drawings]

FIG. 1 is a perspective view of a handling device for IC testing showing an embodiment of the present invention, FIG. 2 is a plan view of the handling device shown in FIG. 1, and FIG. 3 is a diagram of a conventional handling device for IC testing. It is a schematic perspective view. 11... Conveyor belt, 12... Test chute section,
13...Motor, 14r, 142...Support plate, 1
51.152...Stock part, 16...Sensor, 1
7... Case containing tC before testing, 17'...
・IC discharge case, 18...Case where IC remains, 19...Empty case, 20...IC0 Applicant's agent Patent attorney Takehiko Suzue Figure 1 Figure 2

Claims (1)

[Claims] A case containing an IC is set, and the IC inside the case is
a test chute section that sequentially supplies ICs to the test device; a conveyor belt whose end is located near the tested IC storage area for storing ICs determined as good by the test device in the case again; a moving means for moving the case moved to near the starting end of the conveyor belt; a sensor for detecting the presence or absence of an IC in the case moved onto the conveyor belt; A first stock section that stores cases determined to have a
An IC characterized by comprising: a second stock section that stores a case determined by the sensor to have no IC and sends the case onto the conveyor belt at a desired time.
Test handling equipment.