JPS626498Y2 - - Google Patents

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Publication number
JPS626498Y2
JPS626498Y2 JP8374681U JP8374681U JPS626498Y2 JP S626498 Y2 JPS626498 Y2 JP S626498Y2 JP 8374681 U JP8374681 U JP 8374681U JP 8374681 U JP8374681 U JP 8374681U JP S626498 Y2 JPS626498 Y2 JP S626498Y2
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JP
Japan
Prior art keywords
temperature
variable resistor
switch
parallel circuit
resistor
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Expired
Application number
JP8374681U
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Japanese (ja)
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JPS57196341U (en
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Priority to JP8374681U priority Critical patent/JPS626498Y2/ja
Publication of JPS57196341U publication Critical patent/JPS57196341U/ja
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Description

【考案の詳細な説明】 本考案はリードスイツチと永久磁石及び感温磁
性体とを組合せて成る互いに異なる動作温度を有
する複数の温度スイツチを利用した温度検出装置
に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a temperature detection device that utilizes a plurality of temperature switches having mutually different operating temperatures, each of which is a combination of a reed switch, a permanent magnet, and a temperature-sensitive magnetic material.

この種の温度スイツチの構成を第1図及び第2
図に示す。
The configuration of this type of temperature switch is shown in Figures 1 and 2.
As shown in the figure.

第1図の温度スイツチは、リードスイツチ1に
その接点部に対向するように所定のキユリー点を
有する環状感温磁性体2を嵌着し、この感温磁性
体2の両側には環状永久磁石3,3を嵌着したも
のである。温度検出動作は、感温磁性体2の温度
がそのキユリー点よりも低い間はリードスイツチ
1はその接点部を通る閉磁路が形成されて閉成状
態にあり、キユリー点を越えると感温磁性体2は
常磁性を呈してリードスイツチ1が開離する、い
わゆる常閉型である。
The temperature switch shown in FIG. 1 has a reed switch 1 fitted with an annular temperature-sensitive magnetic material 2 having a predetermined Kyrie point so as to face its contact portion, and an annular permanent magnet on both sides of the temperature-sensitive magnetic material 2. 3.3 is fitted. In the temperature detection operation, while the temperature of the temperature-sensitive magnetic material 2 is lower than its Curie point, the reed switch 1 is in a closed state by forming a closed magnetic path passing through its contact portion, and when the temperature exceeds the Curie point, the reed switch 1 is in a closed state. The body 2 exhibits paramagnetism and the reed switch 1 opens and opens, which is a so-called normally closed type.

これに対し第2図の温度スイツチは、二つの環
状感温磁性体2,2の間に環状常磁性体4を介在
させることにより、上述した温度スイツチとは逆
の動作、すなわち感温磁性体2の温度がそのキユ
リー点を越えるとリードスイツチ1が閉成するよ
うにした常開型である。
On the other hand, the temperature switch shown in FIG. 2 has an annular paramagnetic material 4 interposed between the two annular temperature-sensitive magnetic materials 2, 2, so that the temperature switch shown in FIG. It is a normally open type in which the reed switch 1 is closed when the temperature of the reed switch 2 exceeds its Curie point.

これらはいずれも感温磁性体2のキユリー点を
選択することにより所望の温度検出を行なうこと
ができ、小型で高信頼性且つ安価であるため多く
の産業分野で使用されている。
All of these devices can perform desired temperature detection by selecting the Curie point of the temperature-sensitive magnetic material 2, and are used in many industrial fields because they are small, highly reliable, and inexpensive.

ところでこのような温度スイツチを使用して数
段階の温度を検出しようとする場合、それぞれの
検出温度に対応するキユリー点を有する感温磁性
体を組付けた温度スイツチを被温度検出部に併設
し、各温度スイツチからリード線を所要本数導出
して検出信号を直接取出すか、切換スイツチを挿
入接続して所望の温度スイツチだけから検出信号
を得るようにしていた。
By the way, when trying to detect multiple levels of temperature using such a temperature switch, it is necessary to install a temperature switch equipped with a temperature-sensitive magnetic material that has a Curie point corresponding to each detected temperature on the temperature-detected part. The required number of lead wires are drawn out from each temperature switch to directly take out the detection signal, or a changeover switch is inserted and connected to obtain the detection signal only from the desired temperature switch.

本考案の目的は、このように互いに異なる動作
温度を有する複数の温度スイツチを用いて温度検
出を行なうに際し、切換スイツチを用いずに所望
の検出温度を選択可能にすることである。
An object of the present invention is to enable selection of a desired detection temperature without using a changeover switch when temperature detection is performed using a plurality of temperature switches having different operating temperatures.

本考案による温度検出装置は、互いに異なる動
作温度を有する複数の温度スイツチのそれぞれに
抵抗器を直列接続し、これら直列接続回路をそれ
ぞれ単一の抵抗器に並列接続して並列回路を構成
し、更に該並列回路に直列に可変抵抗器を接続す
ると共に、該並列回路と可変抵抗器とにより分圧
された電圧でオン、オフするように半導体スイツ
チング素子を接続し、前記可変抵抗器の調整によ
り検出温度を任意に選択できるようにしたことを
特徴とする。
The temperature detection device according to the present invention connects a resistor in series to each of a plurality of temperature switches having different operating temperatures, and connects each of these series connected circuits in parallel to a single resistor to form a parallel circuit, Furthermore, a variable resistor is connected in series to the parallel circuit, and a semiconductor switching element is connected so as to be turned on and off by the voltage divided by the parallel circuit and the variable resistor, and by adjusting the variable resistor. A feature is that the detected temperature can be arbitrarily selected.

以下に本考案の実施例を説明する。 Examples of the present invention will be described below.

第3図は本考案による温度検出装置の一実施例
の回路図を示す。
FIG. 3 shows a circuit diagram of an embodiment of the temperature detection device according to the present invention.

図において、13,14は被温度制御負荷及び
交流電源であり、リレーRLを介して温度検出装
置と結合されている。TS1,TS2,TS3は負荷1
3と熱的に結合された被温度検出部に配置された
第2図に示した構造の常開型温度スイツチで、そ
れぞれ動作温度がT1,T2,T3(T1<T2<T3とす
る)である。これらの温度スイツチTS1,TS2
TS3にはそれぞれ、抵抗値R1,R2,R3の抵抗器
5,6,7が直列に接続された後抵抗値R4の抵
抗器9と共に互いに並列に接続されて並列回路1
2が構成され、この並列回路12と直列に接続さ
れた可変抵抗器8を介して直流電源VDC及びアー
ス端に接続されている。更にトランジスタQのコ
レクタ端子がリレーRLを介して直流電源VDC
に、エミツタ端子が並列回路12のアース端に、
ベース端子が並列回路12と可変抵抗器8との接
続点10に接続されている。
In the figure, 13 and 14 are a temperature-controlled load and an AC power source, which are connected to a temperature detection device via a relay RL. TS 1 , TS 2 , TS 3 are load 1
A normally open type temperature switch having the structure shown in FIG . T 3 ). These temperature switches TS 1 , TS 2 ,
Resistors 5, 6, and 7 with resistance values R 1 , R 2 , and R 3 are connected in series to TS 3 , and then connected in parallel with a resistor 9 with resistance value R 4 to form a parallel circuit 1.
2 is constructed, and is connected to a DC power supply V DC and a ground terminal via a variable resistor 8 connected in series with this parallel circuit 12 . Furthermore, the collector terminal of transistor Q is connected to DC power supply V DC via relay RL.
, the emitter terminal is connected to the ground terminal of the parallel circuit 12,
A base terminal is connected to a connection point 10 between the parallel circuit 12 and the variable resistor 8.

さて温度スイツチTS1が閉成状態の時の接点部
の接触抵抗と抵抗器5の抵抗値R1とを合せた抵
抗をR′1とする。温度スイツチTS2と抵抗器6の
抵抗値R2、温度スイツチTS3と抵抗器7の抵抗値
R3についても同様に閉成状態の時の合計値を
R′2,R′3とする。また並列回路12の合成抵抗を
R0(=1/1/R′+1/R′+1/R′+1/
R′)とし、並列 回路12の端子10−11間電圧をVi、直流電
源電圧をVp、可変抵抗器8の抵抗値をで表わ
すと、Vi=R/R+RV0…(1)で示される。
Now, let R' 1 be the sum of the contact resistance of the contact portion when the temperature switch TS 1 is in the closed state and the resistance value R 1 of the resistor 5. Resistance value R 2 of temperature switch TS 2 and resistor 6, resistance value of temperature switch TS 3 and resistor 7
Similarly, for R 3 , the total value in the closed state is
Let R′ 2 and R′ 3 . Also, the combined resistance of parallel circuit 12 is
R 0 (=1/1/R' 1 +1/R' 2 +1/R' 3 +1/
R' 4 ), the voltage between terminals 10 and 11 of the parallel circuit 12 is represented by Vi , the DC power supply voltage is represented by Vp , and the resistance value of the variable resistor 8 is represented by Vi = R p /R p +RV 0 . Indicated by (1).

温度スイツチTS1,TS2,TS3は常開型である
ので、温度が上昇するにしたがつて第4図に示す
ように並列回路12の合成抵抗値Rpは階段状に
変化する。即ち温度T1に達するまでは、Rp1
1/1/R=R4、温度がT1とT2の間では温度スイツチ TS1が閉成しているので、Rp1=1/1/R′+1/
R′、 T2とT3の温度範囲内では、Rp2
1/1/R′+1/R′+1/R′であり、温度
がT3以上では 温度スイツチTS1〜TS3がすべて閉成しているの
で、Rp3=1/1/R′+1/R′+1/R′
+1/R′であ る。したがつて並列回路12の端子間電圧Vi
温度の上昇につれまた可変抵抗器8の抵抗値によ
り変化する。
Since the temperature switches TS 1 , TS 2 , and TS 3 are of the normally open type, as the temperature rises, the combined resistance value R p of the parallel circuit 12 changes stepwise as shown in FIG. That is, until the temperature T 1 is reached, R p1 =
1/1/R 4 = R 4 , and since the temperature switch TS 1 is closed when the temperature is between T 1 and T 2 , R p1 = 1/1/R' 1 + 1/
Within the temperature range of R′ 4 , T 2 and T 3 , R p2 =
1/1/R' 1 + 1/R' 2 + 1/R' 4 , and since all temperature switches TS 1 to TS 3 are closed when the temperature is T 3 or higher, R p3 = 1/1/R ' 1 +1/R' 2 +1/R' 3
+1/ R'4 . Therefore, the voltage V i between the terminals of the parallel circuit 12 also changes as the temperature rises and depending on the resistance value of the variable resistor 8.

例えばR′1=12kΩ,R′2=6kΩ,R′3=2kΩ,
R4=4KΩとするとRpp=4kΩ,Rp1=3kΩ,R
p2=2kΩ,Rp3=1kΩであり、この場合のVi
と可変抵抗器8の抵抗値との関係を示すと第5
図の如くとなる。
For example, R′ 1 = 12kΩ, R′ 2 = 6kΩ, R′ 3 = 2kΩ,
If R 4 = 4KΩ, R pp = 4kΩ, R p1 = 3kΩ, R
p2 = 2kΩ, R p3 = 1kΩ, and in this case V i
The relationship between the resistance value of the variable resistor 8 and the resistance value of the variable resistor 8 is shown in the fifth
It will look like the figure.

今、リレーRLを動作させるに必要な電流を流
すためにトランジスタQのベースに付加すべき電
圧VONを0.4V0とすると、第5図において実線VO
の上方領域でリレーRLの接点が閉成状態にあ
り、負荷13に交流電源14が通電され、下方領
域ではリレーRLの接点が開離状態である。した
がつて可変抵抗器8の抵抗値を第5図に示した
,,のそれぞれの範囲内に設定することに
よつて温度スイツチTS1,TS2,TS3の動作をリ
レーRLの動作として取り出すことができる。
Now, if the voltage V ON to be added to the base of transistor Q in order to flow the current necessary to operate relay RL is 0.4V 0 , then in Fig. 5, the solid line V O
In the upper region of N , the contacts of the relay RL are in a closed state, and the AC power supply 14 is energized to the load 13, and in the lower region, the contacts of the relay RL are in an open state. Therefore , by setting the resistance value of the variable resistor 8 within the respective ranges shown in FIG. be able to.

例えば、範囲の中央値5.2kΩに可変抵抗器8
の抵抗値を設定すると、被検出部温度がT1
満では端子10−11間電圧ViがVONより大で
あるのでリレーRLの接点は閉成している。温度
がT1をこえると、温度スイツチTS1が動作(閉
成)して電圧Viが矢印で示すように曲線Rpp
の値から曲線Rp1上でしかもVONより小さい値
に変化してリレーRLの接点が開離する。温度が
さらに上昇してT2,T3に達し温度スイツチ
TS2,TS3が動作しても電圧ViはVONより低くリ
レーRLの接点は開離したままである。逆に温度
が高温から低下して温度T1未満になり温度スイ
ツチTS1が復帰動作(開離)するとリレーRLの
接点が閉成状態に変化する。
For example, a variable resistor 8
When the resistance value is set, when the temperature of the detected part is less than T1 , the voltage V i between the terminals 10 and 11 is greater than V ON , so the contact of the relay RL is closed. When the temperature exceeds T 1 , the temperature switch TS 1 operates (closes) and the voltage V i changes from a value on the curve R pp to a value on the curve R p 1 and smaller than V ON as shown by the arrow. The contacts of relay RL open. The temperature rises further and reaches T 2 and T 3 , and the temperature switch is activated.
Even if TS 2 and TS 3 operate, voltage V i is lower than V ON and the contacts of relay RL remain open. Conversely, when the temperature decreases from a high temperature to less than temperature T1 and temperature switch TS1 returns (opens), the contact of relay RL changes to the closed state.

次に可変抵抗器8の抵抗値を範囲の中央値
3.8kΩに設定した場合、温度がT1に達し温度ス
イツチTS1が閉成すると電圧Viが破線矢印で示す
ように曲線Rpp上からRp1上に変化するが、VO
より大であるのでリレーRLの接点は閉成したま
まであり、温度がT2に達し温度スイツチTS2が閉
成した時Viが矢印で示すようにVONを下回るよ
うに変化しリレーRLの接点が開離する。
Next, set the resistance value of variable resistor 8 to the median value of the range.
When set to 3.8 kΩ, when the temperature reaches T 1 and the temperature switch TS 1 is closed, the voltage V i changes from on the curve R pp to on the R p 1 as shown by the dashed arrow, but V O
Since it is larger than N , the contact of relay RL remains closed, and when the temperature reaches T 2 and temperature switch TS 2 closes, V i changes to become less than V ON as shown by the arrow, and the relay The RL contact opens.

同様に、抵抗値を範囲の中央値2.3kΩとす
ることによつて温度スイツチTS3の温度T3におけ
る動作をリレーRLの動作に反映させ温度T3を検
出することができる。
Similarly, by setting the resistance value to the median value of the range, 2.3 kΩ, the operation of the temperature switch TS 3 at the temperature T 3 can be reflected in the operation of the relay RL to detect the temperature T 3 .

上述したように本考案の温度検出装置は、複数
個の互いに異なる動作温度をもつ温度スイツチの
うちの任意の温度スイツチの開閉信号を可変抵抗
器の抗抗値を調整することにより得ることができ
る。
As described above, the temperature detection device of the present invention can obtain the opening/closing signal of any one of a plurality of temperature switches having different operating temperatures by adjusting the resistance value of the variable resistor. .

なお実施例では常開型温度スイツチを用いた場
合について説明したが、常閉型温度スイツチを用
いても同様に選択的な温度検出ができることは明
らかである。但しこの場合は、メイク接点を有す
るリレーを用いることになる。またリレーRLの
代りに半導体スイツチング素子を用いる等の様々
な変更が可能であり、実施例に限定されるもので
はない。
Although the embodiment has been described using a normally open temperature switch, it is clear that selective temperature detection can be similarly performed using a normally closed temperature switch. However, in this case, a relay with a make contact will be used. Further, various changes such as using a semiconductor switching element in place of relay RL are possible, and the present invention is not limited to the embodiment.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図はそれぞれ、本考案に用いら
れる常閉型及び常開型温度スイツチを示し、第3
図は本考案による温度検出装置の一実施例の回路
図、第4図は第3図における並列回路の合成抵抗
と温度との関係を示した図、第5図は、可変抵抗
器の抵抗値とトランジスタ入力電圧Viとの関
係を示した図である。 1……リードスイツチ、2……感温磁性体、3
……永久磁石、4……常磁性体、TS1,TS2
TS3……温度スイツチ、8……可変抵抗器、RL
……リレー、13……負荷、14……交流電源。
1 and 2 respectively show a normally closed type temperature switch and a normally open type temperature switch used in the present invention;
The figure is a circuit diagram of one embodiment of the temperature detection device according to the present invention, Figure 4 is a diagram showing the relationship between the combined resistance of the parallel circuit in Figure 3 and temperature, and Figure 5 is the resistance value of the variable resistor. FIG. 2 is a diagram showing the relationship between V i and transistor input voltage V i . 1...Reed switch, 2...Temperature-sensitive magnetic material, 3
...Permanent magnet, 4...Paramagnetic material, TS 1 , TS 2 ,
TS 3 ...Temperature switch, 8...Variable resistor, RL
...Relay, 13...Load, 14...AC power supply.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] リードスイツチと永久磁石及び感温磁性体とを
組合せて成る互いに異なる動作温度を有する複数
の温度スイツチのそれぞれに抵抗器を直列接続
し、これら直列接続回路をそれぞれ単一の抵抗器
に並列接続して並列回路を構成し、更に該並列回
路に直列に可変抵抗器を接続すると共に、該並列
回路と可変抵抗器とにより分圧された電圧により
オン、オフするように半導体スイツチング素子を
接続し、前記可変抵抗器の調整により検出温度を
任意に選択できるようにしたことを特徴とする温
度検出装置。
A resistor is connected in series to each of a plurality of temperature switches having mutually different operating temperatures, each of which is a combination of a reed switch, a permanent magnet, and a temperature-sensitive magnetic material, and each of these series-connected circuits is connected in parallel to a single resistor. to form a parallel circuit, further connecting a variable resistor in series to the parallel circuit, and connecting a semiconductor switching element so as to be turned on and off by a voltage divided by the parallel circuit and the variable resistor, A temperature detection device characterized in that the detected temperature can be arbitrarily selected by adjusting the variable resistor.
JP8374681U 1981-06-09 1981-06-09 Expired JPS626498Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8374681U JPS626498Y2 (en) 1981-06-09 1981-06-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8374681U JPS626498Y2 (en) 1981-06-09 1981-06-09

Publications (2)

Publication Number Publication Date
JPS57196341U JPS57196341U (en) 1982-12-13
JPS626498Y2 true JPS626498Y2 (en) 1987-02-14

Family

ID=29879147

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8374681U Expired JPS626498Y2 (en) 1981-06-09 1981-06-09

Country Status (1)

Country Link
JP (1) JPS626498Y2 (en)

Also Published As

Publication number Publication date
JPS57196341U (en) 1982-12-13

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