JPS6258735U - - Google Patents
Info
- Publication number
- JPS6258735U JPS6258735U JP14997785U JP14997785U JPS6258735U JP S6258735 U JPS6258735 U JP S6258735U JP 14997785 U JP14997785 U JP 14997785U JP 14997785 U JP14997785 U JP 14997785U JP S6258735 U JPS6258735 U JP S6258735U
- Authority
- JP
- Japan
- Prior art keywords
- base material
- utility
- model registration
- measuring tape
- continuous pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 claims description 4
- 239000000853 adhesive Substances 0.000 claims 1
- 230000001070 adhesive effect Effects 0.000 claims 1
- 230000003749 cleanliness Effects 0.000 claims 1
- 239000002390 adhesive tape Substances 0.000 description 3
Landscapes
- Sampling And Sample Adjustment (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14997785U JPS6258735U (fi) | 1985-10-02 | 1985-10-02 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14997785U JPS6258735U (fi) | 1985-10-02 | 1985-10-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6258735U true JPS6258735U (fi) | 1987-04-11 |
Family
ID=31065685
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14997785U Pending JPS6258735U (fi) | 1985-10-02 | 1985-10-02 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6258735U (fi) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012073160A (ja) * | 2010-09-29 | 2012-04-12 | Toppan Printing Co Ltd | 塵埃モニター用キット、およびそれを用いた評価方法 |
JP2012208080A (ja) * | 2011-03-30 | 2012-10-25 | Toppan Printing Co Ltd | 塵埃モニター用キット及びそれを用いた評価方法 |
JP2014044135A (ja) * | 2012-08-28 | 2014-03-13 | Ntt-At Creative Corp | 検出対象物の測定方法 |
JP2017535768A (ja) * | 2014-10-22 | 2017-11-30 | ジェデックス インコーポレイテッド | クリーンルームの表面粒子検出用試験フィルム |
-
1985
- 1985-10-02 JP JP14997785U patent/JPS6258735U/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012073160A (ja) * | 2010-09-29 | 2012-04-12 | Toppan Printing Co Ltd | 塵埃モニター用キット、およびそれを用いた評価方法 |
JP2012208080A (ja) * | 2011-03-30 | 2012-10-25 | Toppan Printing Co Ltd | 塵埃モニター用キット及びそれを用いた評価方法 |
JP2014044135A (ja) * | 2012-08-28 | 2014-03-13 | Ntt-At Creative Corp | 検出対象物の測定方法 |
JP2017535768A (ja) * | 2014-10-22 | 2017-11-30 | ジェデックス インコーポレイテッド | クリーンルームの表面粒子検出用試験フィルム |