JPS6258154U - - Google Patents
Info
- Publication number
- JPS6258154U JPS6258154U JP14893485U JP14893485U JPS6258154U JP S6258154 U JPS6258154 U JP S6258154U JP 14893485 U JP14893485 U JP 14893485U JP 14893485 U JP14893485 U JP 14893485U JP S6258154 U JPS6258154 U JP S6258154U
- Authority
- JP
- Japan
- Prior art keywords
- axis
- view
- grinding jig
- optical
- present
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 6
- 238000001514 detection method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985148934U JPH0632288Y2 (ja) | 1985-10-01 | 1985-10-01 | 光▲ほう▼い研削盤 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985148934U JPH0632288Y2 (ja) | 1985-10-01 | 1985-10-01 | 光▲ほう▼い研削盤 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6258154U true JPS6258154U (US07655746-20100202-C00011.png) | 1987-04-10 |
| JPH0632288Y2 JPH0632288Y2 (ja) | 1994-08-24 |
Family
ID=31063661
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985148934U Expired - Lifetime JPH0632288Y2 (ja) | 1985-10-01 | 1985-10-01 | 光▲ほう▼い研削盤 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0632288Y2 (US07655746-20100202-C00011.png) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9339223B2 (en) | 1997-03-04 | 2016-05-17 | Dexcom, Inc. | Device and method for determining analyte levels |
| US9439589B2 (en) | 1997-03-04 | 2016-09-13 | Dexcom, Inc. | Device and method for determining analyte levels |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5877439A (ja) * | 1981-10-29 | 1983-05-10 | Washino Kikai Kk | 光倣い研削盤の自動化方法 |
| JPS58126056A (ja) * | 1982-01-25 | 1983-07-27 | Toshiba Corp | 斜め溝加工方法 |
-
1985
- 1985-10-01 JP JP1985148934U patent/JPH0632288Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5877439A (ja) * | 1981-10-29 | 1983-05-10 | Washino Kikai Kk | 光倣い研削盤の自動化方法 |
| JPS58126056A (ja) * | 1982-01-25 | 1983-07-27 | Toshiba Corp | 斜め溝加工方法 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9339223B2 (en) | 1997-03-04 | 2016-05-17 | Dexcom, Inc. | Device and method for determining analyte levels |
| US9439589B2 (en) | 1997-03-04 | 2016-09-13 | Dexcom, Inc. | Device and method for determining analyte levels |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0632288Y2 (ja) | 1994-08-24 |
