JPS6255729B2 - - Google Patents

Info

Publication number
JPS6255729B2
JPS6255729B2 JP56127736A JP12773681A JPS6255729B2 JP S6255729 B2 JPS6255729 B2 JP S6255729B2 JP 56127736 A JP56127736 A JP 56127736A JP 12773681 A JP12773681 A JP 12773681A JP S6255729 B2 JPS6255729 B2 JP S6255729B2
Authority
JP
Japan
Prior art keywords
main terminal
thyristor
semiconductor switch
variable impedance
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56127736A
Other languages
Japanese (ja)
Other versions
JPS5757030A (en
Inventor
Hiroyasu Uehara
Jun Ueda
Hideo Suzuki
Masae Oogoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Oki Electric Industry Co Ltd
Original Assignee
Nippon Telegraph and Telephone Corp
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, Oki Electric Industry Co Ltd filed Critical Nippon Telegraph and Telephone Corp
Priority to JP12773681A priority Critical patent/JPS5757030A/en
Publication of JPS5757030A publication Critical patent/JPS5757030A/en
Publication of JPS6255729B2 publication Critical patent/JPS6255729B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/72Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices having more than two PN junctions; having more than three electrodes; having more than one electrode connected to the same conductivity region

Landscapes

  • Power Conversion In General (AREA)
  • Thyristor Switches And Gates (AREA)
  • Electronic Switches (AREA)
  • Use Of Switch Circuits For Exchanges And Methods Of Control Of Multiplex Exchanges (AREA)

Description

【発明の詳細な説明】 本発明はサイリスタ等を用いた交換機通話路等
における半導体スイツチに関し、特にオフ電圧上
昇率耐量(以下dv/dt耐量と略記する。)を改善
した半導体スイツチに関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor switch using a thyristor or the like in an exchange communication path, and more particularly to a semiconductor switch with improved off-voltage rise rate tolerance (hereinafter abbreviated as DV/DT tolerance). .

従来のdv/dt特性を改善した半導体スイツチ
回路を第1図に示す。第1図において1a,1b
は主スイツチの入出力端子、2は制御信号入力端
子、3は変位電流を可変インピーダンス回路4に
供給するためのコンデンサ、5はpnpn構造を有
するサイリスタの如く構成されている。第1図に
おいて、主スイツチ端子1aに急激な電位変動が
あつた場合、過渡電流がコンデンサ3を通り、可
変インピーダンス回路4を駆動し、サイリスタ5
のゲート―カソード間を低電圧にクランプし、誤
動作を防止できるが、主スイツチ端子1aに比較
的遅い電位変動があつた場合には、コンデンサ3
が極めて大きくない限り可変インピーダンス回路
4を駆動できない欠点があり、このため集積化が
困難である欠点があつた。
Figure 1 shows a semiconductor switch circuit with improved conventional dv/dt characteristics. 1a, 1b in Figure 1
2 is an input/output terminal of the main switch, 2 is a control signal input terminal, 3 is a capacitor for supplying a displacement current to a variable impedance circuit 4, and 5 is constructed like a thyristor having a pnpn structure. In FIG. 1, when there is a sudden change in potential at the main switch terminal 1a, a transient current passes through the capacitor 3, drives the variable impedance circuit 4, and drives the thyristor 5.
The voltage between the gate and cathode of the capacitor 3 can be clamped to a low voltage to prevent malfunction, but if there is a relatively slow potential fluctuation at the main switch terminal 1a, the capacitor 3
This has the drawback that the variable impedance circuit 4 cannot be driven unless the impedance is extremely large, which makes integration difficult.

本発明は、交換機通話路等に用いる半導体スイ
ツチ駆動回路中に、これと無関係に動作する可変
インピーダンス回路を付加した回路に於て、アク
テイブ素子を用いた回路構成による過渡電流検出
回路を更に付加すると共にこの過渡電流検出回路
の入出力端を耐圧及び動作とも双方向化すること
によりdv/dtによる誤動作を確実に防止すると
共に集積回路化が可能な半導体スイツチを得たこ
とを特徴とするものであり、以下実施例に従い詳
細に説明する。
The present invention further adds a transient current detection circuit with a circuit configuration using active elements to a semiconductor switch drive circuit used for an exchange communication path, etc., in which a variable impedance circuit that operates independently of the semiconductor switch drive circuit is added. In addition, by making the input/output terminals of this transient current detection circuit bidirectional in terms of voltage resistance and operation, a semiconductor switch is obtained which can reliably prevent malfunctions due to DV/DT and which can be integrated into an integrated circuit. This will be explained in detail below according to examples.

第2図は本発明の実施例であつて、6aは第1
主端子、6bは第2主端子、7,8は駆動端子、
9はサイリスタである。10はトランジスタ、1
1は抵抗であつて前記サイリスタ9のゲート―カ
ソード間に接続されて一方の可変インピーダンス
回路を構成している。9aはサイリスタであつ
て、サイリスタ9と逆極性で第1主端子6aと第
2主端子6b間に接続されている。10aはトラ
ンジスタ、11aは抵抗であつて、前記サイリス
タ9aのゲート―カソード間に接続されてもう1
つの可変インピーダンス回路を構成している。
又、ダイオード17及び17aは前記可変インピ
ーダンス回路を成す各トランジスタ10及び10
aのベース―エミツタ間に接続されている。更に
前記各サイリスタ9及び9aの各ゲートはそれぞ
れダイオード15及び15aを介し、トランジス
タ16から成る駆動回路に接続されている。この
発明に於ける特徴的な構成の1つは、過渡電流検
出回路の一方の入出力端13が、もう1つの可変
インピーダンス回路を成すトランジスタ10aの
ベースに接続されている点である。
FIG. 2 shows an embodiment of the present invention, in which 6a is the first
Main terminal, 6b is the second main terminal, 7 and 8 are drive terminals,
9 is a thyristor. 10 is a transistor, 1
A resistor 1 is connected between the gate and cathode of the thyristor 9 to constitute one variable impedance circuit. A thyristor 9a is connected between the first main terminal 6a and the second main terminal 6b with the opposite polarity to the thyristor 9. 10a is a transistor, 11a is a resistor, and is connected between the gate and cathode of the thyristor 9a.
It constitutes two variable impedance circuits.
Further, the diodes 17 and 17a are connected to the respective transistors 10 and 10 forming the variable impedance circuit.
It is connected between the base and emitter of a. Furthermore, each gate of each of the thyristors 9 and 9a is connected to a drive circuit consisting of a transistor 16 via a diode 15 and 15a, respectively. One of the characteristic configurations of this invention is that one input/output terminal 13 of the transient current detection circuit is connected to the base of a transistor 10a forming another variable impedance circuit.

さて本発明の過渡電流検出回路を有する半導体
スイツチの動作を説明すると、第1主端子6aと
第2主端子6b間に電源を接続し、駆動端子7,
8からトランジスタ16を順バイアスすると、ダ
イオード15又は15aを通してサイリスタ9、
又は9aのゲートを駆動し、サイリスタ9又は9
aを導通させる訳であるが、サイリスタ9又は9
aが動作状態にない時に第1主端子6aに正の又
は第2主端子6bに負の急激な電位変動があつた
場合、過渡電流は6a→17a(これが付加され
ていない場合は10aのエミツタ―ベース間)→
12のルートで流れ、トランジスタ10を駆動
し、第2主端子6bに至る。
Now, to explain the operation of the semiconductor switch having the transient current detection circuit of the present invention, a power supply is connected between the first main terminal 6a and the second main terminal 6b, and the drive terminal 7,
When the transistor 16 is forward biased from the thyristor 9 through the diode 15 or 15a,
Or drive the gate of 9a, thyristor 9 or 9
A is made conductive, but thyristor 9 or 9
If there is a sudden positive potential change at the first main terminal 6a or a negative potential at the second main terminal 6b when terminal a is not in the operating state, the transient current will change from 6a to 17a (if this is not added, the emitter of 10a - between bases)→
12, drives the transistor 10, and reaches the second main terminal 6b.

又第1主端子6aに負の或は第2主端子6bに
正の急激な電位変動があつた場合、過渡電流は6
b→17(これがない場合は10のエミツタ―ベ
ース間)→12のルートで流れトランジスタ10
aを駆動し、第1主端子6aに至る。
In addition, when there is a sudden change in potential that is negative at the first main terminal 6a or positive at the second main terminal 6b, the transient current
Transistor 10 flows through the route b → 17 (if this is not available, between the emitter and base of 10) → 12
a to the first main terminal 6a.

この時、いずれの場合も過渡電流はトランジス
タ12によつて増幅され、より大きな電流を得
る。その結果サイリスタ9又は9aのゲート―カ
ソード間をトランジスタ10又は10aのコレク
タ―エミツタ間電圧にクランプし、サイリスタ
9,9aいずれの誤動作も防止し得る。
At this time, in either case, the transient current is amplified by the transistor 12 to obtain a larger current. As a result, the voltage between the gate and cathode of thyristor 9 or 9a is clamped to the voltage between the collector and emitter of transistor 10 or 10a, and malfunction of either thyristor 9 or 9a can be prevented.

以上説明した様に、本発明半導体スイツチは、
サイリスタ9或は9aに対して急激な電位変動が
生じた場合でも、又その変化があまり遠くない場
合でも過渡電流検出回路が可変インピーダンス回
路を確実に作動させdv/dtによる誤動作を防止
することができる。
As explained above, the semiconductor switch of the present invention has
Even if a sudden potential change occurs in the thyristor 9 or 9a, or even if the change is not far away, the transient current detection circuit can reliably operate the variable impedance circuit to prevent malfunctions due to dv/dt. can.

又、本発明の半導体スイツチに於ける過渡電流
検出回路は入出力端が同一構成である為双方向動
作が実現できることから、2個のサイリスタを相
互に逆極性で接続して成る双方向半導体スイツチ
に於ては、単方向半導体スイツチと同様に1つの
過渡電流回路が共用でき、部品点数の低減と共
に、この種スイツチを複数個用いてアレイを構成
する場合、高集積化が実現できる。
Furthermore, since the transient current detection circuit in the semiconductor switch of the present invention has the same configuration at the input and output terminals, bidirectional operation can be achieved. In this case, one transient current circuit can be shared in the same way as with unidirectional semiconductor switches, and the number of parts can be reduced, and when an array is constructed using a plurality of switches of this type, high integration can be achieved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のdv/dt特性を改善した半導体
スイツチ回路図例、第2図は本発明の一実施例の
回路図。 6a…第1主端子、6b…第2主端子、7,8
…制御端子、9,9a…サイリスタ、10,10
a,12,16…トランジスタ、11,11a…
抵抗、13,14…入出力端子、15,15a,
17,17a…ダイオード。
FIG. 1 is an example of a circuit diagram of a conventional semiconductor switch with improved dv/dt characteristics, and FIG. 2 is a circuit diagram of an embodiment of the present invention. 6a...first main terminal, 6b...second main terminal, 7,8
...Control terminal, 9,9a...Thyristor, 10,10
a, 12, 16...transistor, 11, 11a...
Resistor, 13, 14... Input/output terminal, 15, 15a,
17, 17a...diode.

Claims (1)

【特許請求の範囲】[Claims] 1 第1主端子と第2主端子間にPNPN構造の1
対のサイリスタを逆極性で並列接続し、前記第2
主端子と前記1対のサイリスタのゲートとの間
に、エミツタ―コレクタ間に抵抗を接続したトラ
ンジスタから成る1対の可変インピーダンス回路
を各サイリスタの順バイアスされるPN接合が短
絡されるように接続して成る半導体スイツチに於
て、前記可変インピーダンス回路のトランジスタ
の各各のベース間に、ベースを開放した双方向耐
圧を有するPNP型トランジスタで構成される過渡
電流検出回路を接続した事を特徴とする半導体ス
イツチ。
1 1 with PNPN structure between the 1st main terminal and the 2nd main terminal
A pair of thyristors are connected in parallel with opposite polarity, and the second
A pair of variable impedance circuits consisting of transistors with a resistor connected between the emitter and collector are connected between the main terminal and the gates of the pair of thyristors so that the forward biased PN junction of each thyristor is short-circuited. The semiconductor switch is characterized in that a transient current detection circuit consisting of a PNP type transistor with an open base and having a bidirectional withstand voltage is connected between the bases of the transistors of the variable impedance circuit. semiconductor switch.
JP12773681A 1981-08-17 1981-08-17 Semiconductor switch Granted JPS5757030A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12773681A JPS5757030A (en) 1981-08-17 1981-08-17 Semiconductor switch

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12773681A JPS5757030A (en) 1981-08-17 1981-08-17 Semiconductor switch

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP52002943A Division JPS5923134B2 (en) 1977-01-17 1977-01-17 semiconductor switch

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP616587A Division JPS6326023A (en) 1987-01-16 1987-01-16 Semiconductor switch

Publications (2)

Publication Number Publication Date
JPS5757030A JPS5757030A (en) 1982-04-06
JPS6255729B2 true JPS6255729B2 (en) 1987-11-20

Family

ID=14967406

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12773681A Granted JPS5757030A (en) 1981-08-17 1981-08-17 Semiconductor switch

Country Status (1)

Country Link
JP (1) JPS5757030A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5243350A (en) * 1975-10-01 1977-04-05 Hitachi Ltd Semi-conductor switch

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5243350A (en) * 1975-10-01 1977-04-05 Hitachi Ltd Semi-conductor switch

Also Published As

Publication number Publication date
JPS5757030A (en) 1982-04-06

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