JPS6255568A - Inspection for short-circuit disconnection of multiple wiring - Google Patents

Abstract

PURPOSE:To achieve a higher reliability and higher working efficiency of inspection, by providing an input switch and an output switch from a power source on each of wiring to be inspected to scan the application of voltage connecting them sequentially. CONSTITUTION:Leader terminals Tn are connected to ends (A) of respective wiring of a wiring group to be inspected; power sources are connected in parallel to the respective terminals through input switch elements Sin, and so are current detection resistances (R) through output switches Son and simultaneously short-circuiting means 1 are provided at the ends (B) thereof in such a manner as to free to separate therefrom and approach them. A current source is supplied with the short-circuiting means 1 separating from the ends (B) through a switch elements Sin connected to a specified leader terminal Tn while a short-circuiting between adjacent wires is detected according to the presence of the detection of current when a switch element Son+1 is connected to an adjacent leader terminal. A power source current is supplied through a switch element Sin to a specified leader terminal Tn with the short-circuiting means 1 contacting the ends (B), and a disconnection of the wire linked to a specific terminal is detected depending on the presence of current flowing through at least one switch Sox connected to a remaining leader terminal.

Description

[Detailed Description of the Invention] [Summary] An input switch and an output switch from a power supply are provided for each wiring to be inspected of a large number of high-density parallel fine wiring used in electronic equipment, and voltage is applied while sequentially selecting and connecting them. The present invention provides an inspection method that performs scanning, detects short circuits and disconnections in each wiring, and identifies terminals to be inspected by counting the number of scanning steps, thereby improving the reliability and efficiency of inspection.

[Industrial application field]

The present invention relates to an inspection method for detecting short-circuits and disconnections in a large number of high-density parallel fine interconnects used in electronic equipment, particularly in film interconnects with a width and pitch of several hundred microns, such as those in display panels.

This type of fine wiring is inspected for shorts and breaks in the component state, but there has been a need to establish a method for accurately and efficiently inspecting up to 1,000 wirings per panel.

[Conventional technology]

Conventionally, in order to inspect this kind of thin wiring, 8) Visual inspection using a microscope; B) Bringing an electromagnetic induction coil close to the wiring to be inspected and moving it directly to the wiring while passing a current through the wiring to be inspected. The following methods have been used to detect the presence or absence of current in the wiring.

[Problem that the invention seeks to solve]

However, in the visual inspection in step 8 of the above conventional method, the width is 100 microns and the length is 300 microns.
Inspecting 1,000 millimeter-sized membrane wirings one by one depends too much on the skill and tension of the inspection worker, which poses problems of low inspection reliability and efficiency.

Method B) using a current detection coil is effective for inspecting disconnections, but is insufficient for inspecting short circuits with adjacent wiring. Furthermore, a complicated mechanism was required for the detection coil to know the address of the wiring under test.

This invention solves these problems and provides a method for electronically and automatically inspecting a large number of high-density parallel fine interconnects, thereby improving the reliability and work efficiency of the inspection. be.

[Means for solving problems]

FIG. 1 shows a block diagram of the principle of the present invention, and FIG. 2 shows terminals of the wiring to be inspected in relation to FIG. 1.

Each wire in the group of wires to be inspected, for example, the n-th wiring IaL7
On the other hand, at one end of the wiring, the A end, the lead terminal T7
The terminals are connected to the power source 2 through the input switch element S1, and the output switch element S is connected to the power source 2 through the input switch element S1. Connect to the current detection resistor R through 7.

The terminal voltage of the current detection resistor R and the synchronization signal from the synchronization signal generation circuit 3 are input to a quality determination circuit 4.

To test for a short circuit between wires, open the other end of the wire to be tested L7, that is, the B end, close the input switch element Sln, and connect the output switch element S connected to the adjacent wire Ln+l.
. □1 is closed, and a voltage is applied from the power supply 2 to the wiring to be inspected via terminal 1'1 to n. This operation is repeated while sequentially scanning from one end of the wiring group array to be inspected to the other end.

To test for wire breakage, all the B ends of the wire to be tested on the side opened in the short circuit test are short-circuited by the simultaneous shorting means 1 consisting of a group of contact terminals, and the input switch element S+r+ for the nth wire is connected. Close and place nth. At least one output switch element S08 other than that for the voltage is closed, and a voltage is applied to the wiring from the power source 2 through the terminals T, .

Also, an input switch element group S and an output switch element group S.

An input switch scanning circuit 5 and an output switch scanning circuit 6 are provided for each, and the above-mentioned inspection operation is performed on one end of the wiring group array to be inspected. This is repeated while sequentially scanning from 1aLl to the other end.

These scanning circuits 5 , 6 are configured to advance one step of scanning by one synchronizing signal from the synchronizing signal generating circuit 3 , which is also connected to the counter 7 .

The output of the pass/fail judgment circuit 4 is input to a storage device 8, and a display device 9-1 and a printer device 9-2 are connected to the storage device as an output device 9 for the stored test results.

[For production]

The wiring connections described in "Means for solving problems" will be explained using principle diagrams and judgment tables for each inspection purpose.

In the case of short circuit inspection, connections and judgment tables are shown in Figures 3 and 4. For example, there must be no conduction between the wiring to be inspected 7 and its adjacent wirings L+ and +1. Therefore, the connection state of the switch elements as shown in FIG. 3, that is, Sln+Son++
is closed, S OI'l+ S I++1 is open, and the power supply voltage is on the wiring to be tested. When a short circuit occurs between these two adjacent wires, the applied voltage flows into the detection resistor R as a current and a voltage drop (output voltage) occurs.If there is no short circuit, a voltage drop occurs. do not.

In the case of a disconnection test, connection and determination tables are shown in FIGS. 5 and 6. For example, the wiring fi to be inspected and at least one wiring X selected simply for return are short-circuited at their tips B by the simultaneous shorting means 1, so naturally there must be continuity between them.

Therefore, when a pulse is applied with the switch element connected as shown in Figure 5, the applied voltage will flow into the detection resistor R as a current only if there is no disconnection in the wiring Ln or the return line to be inspected. However, if there is an open circuit failure, no voltage will be generated.

The probability of disconnection in the return line LX is extremely low by using a plurality of wiring lines, and it can be eliminated by inspecting the return line as a line to be inspected.

In this way, the pass/fail judgment circuit 4 is programmed in advance to judge whether there is a short circuit or disconnection according to the judgment table shown in Figs. I'll keep it.

On the other hand, the test is started from one end of the array of wirings to be inspected, and the synchronization signal that instructs the application of voltage to the first wiring to be inspected is the first, and the voltage is applied to the adjacent wirings in sequence. Scanning is performed, and the result of counting the number of scanning steps, that is, the number of times the synchronizing signal is applied, is used as the address of the wiring to be inspected.

Therefore, the address of each wiring to be inspected and the inspection result are recorded in the storage device 8 in association with each other.

(Example〕 FIG. 7 shows an embodiment of the invention.

A PNP transistor is used as the input switch element S1, and the negative gate pulse P1 is connected to the capacitor C.
conducts for the period applied to the base. Also, an output switch element S. As a result, an NPN type transistor is used, which conducts during the period when a positive gate pulse P2 is applied to the base via the capacitor C. The gate pulses PI and Pg in the figure are for testing a short circuit between wiring and L n+1.

The synchronizing signal generation circuit 3, the counter 7, the pass/fail determination circuit 4, and the storage device 8 are integrated into a small electronic computer Q (0), and the output device 9 is a display device 9-1 or a printer 9-
2 is used. Note that 2 is a power source.゛The input switch scanning circuit 5 and the output switch scanning circuit 6 each have their respective scanning start positions specified by the pass/fail judgment circuit 4 according to the inspection purpose, and each time they receive or receive one synchronization signal, a gate pulse P is generated.
Apply IIP2 to the base circuit of the specified transistor,
Further, one step of scanning is carried out to the next transistor.

The extraction terminal T and the simultaneous short-circuiting means 1 shown in FIG. 2 are connectors in which contact terminals are arranged, and the respective terminals of the simultaneous short-circuiting means are connected to each other.

Although a typical circuit example is shown above, the simultaneous shorting means 1 may be a connector (a plate-shaped conductor may also be used).
Alternatively, electronic switches such as transistors can also be used.

〔Effect of the invention〕

By using the inspection method of this invention, there is no need for a P-trainer to inspect multiple wiring for shorts and breaks, the accuracy of inspection for both shorts and breaks is 100x, and the number of man-hours is 1710.
In addition, the working time is shortened to less than 1 minute, which is extremely useful for reducing manufacturing costs of electronic devices.

[Brief explanation of drawings]

FIG. 1 is a block diagram of the principle of this invention. Figure 2 is a connection diagram of the wiring group to be inspected and its terminals, Figure 3 is a connection diagram of the wiring to be inspected during short-circuit inspection, Figure 4 is the judgment table for short-circuit inspection, and Figure 5 is during open-circuit inspection. A connection diagram of the wiring to be inspected, FIG. 6 is a determination table for disconnection inspection, and FIG. 7 is a configuration diagram of an embodiment of the present invention. In the figure, L is the nth wiring to be inspected, T7 is the nth lead-out terminal, SI, is the nth large scale inch element, So, is the nth output scale inch element, R is the current detection resistor, 1 2 is a simultaneous short circuit means, 2 is a power supply, 3 is a synchronization signal generation circuit, 4 is a pass/fail judgment circuit, 5 is an input switching circuit, 6 is an output switching circuit, 7 is a total f2I device, 8 is a storage device, 9 is the output device. Figure 3 Figure 43 Figure 5 Figure 6

Claims (3)

[Claims] (1) Connect the lead terminal (Tn) corresponding to the wiring to one end (A) of each wiring in the wiring group to be inspected, and connect the power supply to the terminal via the input switch element (S_1_n) and the output switch element. Current detection resistors (R) are connected in parallel via (S_0_n), and the simultaneous shorting means (1) that commonly shorts the other end (B) of each of the above wirings can be freely connected to and separated from the end row. With the shorting means (1) separated from the wiring end (B), supply current is supplied through the input switch element (S_1_n) connected to a specific lead-out terminal (Tn), and the supply current is supplied to the adjacent lead-out terminal. A series of output switch elements (S_0_
A short circuit between the adjacent wirings is detected depending on whether or not current is detected when the terminal (Tn_+_1) is closed. ) A power supply current is supplied through the input switch element (S_1_n) connected to the remaining lead terminal, and a break in the wiring connected to a specific terminal is detected based on the presence or absence of current flowing through at least one output switch (S_0_x) connected to the remaining extraction terminal. A short circuit/disconnection inspection method for multiple wiring lines. (2) When inspecting for disconnection, connect the short-circuiting means (1) to the connection point between the output switch (S_1) and the current detection resistor (R), and connect the output switch (S_0_n) connected to the wiring terminal to be inspected.
A method for inspecting multiple wirings for short circuits and disconnections as set forth in claim (1), characterized in that: . (3) Scanning circuits (5) and (6) that sequentially scan and turn on and off the input and output switch elements related to the specific wiring terminal to be inspected for each synchronizing signal pulse, and a counting circuit that counts the number of pulses. A method for inspecting multiple wirings for short circuits and disconnections according to claims (1) and (2), characterized in that the address of the wiring to be inspected is identified by the output of the pulse counting circuit.