JPS6251279U - - Google Patents
Info
- Publication number
- JPS6251279U JPS6251279U JP14489985U JP14489985U JPS6251279U JP S6251279 U JPS6251279 U JP S6251279U JP 14489985 U JP14489985 U JP 14489985U JP 14489985 U JP14489985 U JP 14489985U JP S6251279 U JPS6251279 U JP S6251279U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor integrated
- board
- contactor
- burn
- lead frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14489985U JPS6251279U (pl) | 1985-09-19 | 1985-09-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14489985U JPS6251279U (pl) | 1985-09-19 | 1985-09-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6251279U true JPS6251279U (pl) | 1987-03-30 |
Family
ID=31055934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14489985U Pending JPS6251279U (pl) | 1985-09-19 | 1985-09-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6251279U (pl) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5934172A (ja) * | 1982-08-20 | 1984-02-24 | Mitsubishi Electric Corp | 半導体集積回路のバ−ンイン試験方法 |
| JPS5952656B2 (ja) * | 1977-04-11 | 1984-12-20 | 日石三菱株式会社 | エポキシ樹脂組成物 |
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1985
- 1985-09-19 JP JP14489985U patent/JPS6251279U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5952656B2 (ja) * | 1977-04-11 | 1984-12-20 | 日石三菱株式会社 | エポキシ樹脂組成物 |
| JPS5934172A (ja) * | 1982-08-20 | 1984-02-24 | Mitsubishi Electric Corp | 半導体集積回路のバ−ンイン試験方法 |