JPS62502702A - 干渉選択振幅変調分光計 - Google Patents
干渉選択振幅変調分光計Info
- Publication number
- JPS62502702A JPS62502702A JP50443185A JP50443185A JPS62502702A JP S62502702 A JPS62502702 A JP S62502702A JP 50443185 A JP50443185 A JP 50443185A JP 50443185 A JP50443185 A JP 50443185A JP S62502702 A JPS62502702 A JP S62502702A
- Authority
- JP
- Japan
- Prior art keywords
- spectrometer
- mirror
- diffraction grating
- recording device
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000004075 alteration Effects 0.000 claims description 25
- 230000001360 synchronised effect Effects 0.000 claims description 23
- 238000004611 spectroscopical analysis Methods 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 description 12
- 230000003595 spectral effect Effects 0.000 description 9
- 238000001514 detection method Methods 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000003321 amplification Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 241000772415 Neovison vison Species 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000013076 target substance Substances 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0237—Adjustable, e.g. focussing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
- G01J2003/267—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters of the SISAM type
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Holo Graphy (AREA)
- Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/SU1985/000036 WO1986006476A1 (fr) | 1985-04-30 | 1985-04-30 | Spectrometre avec modulation d'amplitude interferentielle selective |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62502702A true JPS62502702A (ja) | 1987-10-15 |
Family
ID=21616908
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50443185A Pending JPS62502702A (ja) | 1985-04-30 | 1985-04-30 | 干渉選択振幅変調分光計 |
Country Status (8)
Country | Link |
---|---|
JP (1) | JPS62502702A (fr) |
AU (1) | AU579200B2 (fr) |
CH (1) | CH673060A5 (fr) |
DE (1) | DE3590782T1 (fr) |
FR (1) | FR2583516B1 (fr) |
GB (1) | GB2185104B (fr) |
SE (1) | SE455232B (fr) |
WO (1) | WO1986006476A1 (fr) |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU495945A1 (ru) * | 1974-06-13 | 1978-09-30 | Ленинградский Ордена Ленина И Ордена Трудового Красного Знамени Государственный Университет Им. А.А.Жданова | Спектрометр с интерференционной селективной амплитудной модул цией |
DD140791B1 (de) * | 1979-01-05 | 1986-03-26 | Zeiss Jena Veb Carl | Verfahren zur kontinuierlichen messung der wellenlaenge frequenzstabilisierter laser-wegmesssysteme |
GB2043880A (en) * | 1979-03-05 | 1980-10-08 | Pye Electronic Prod Ltd | Noise reduction in dual beam ratio recording spectrophotometers |
JPS567006A (en) * | 1979-06-22 | 1981-01-24 | Ibm | Method of extending measurement range of interference |
-
1985
- 1985-04-30 DE DE19853590782 patent/DE3590782T1/de not_active Withdrawn
- 1985-04-30 WO PCT/SU1985/000036 patent/WO1986006476A1/fr active Application Filing
- 1985-04-30 CH CH523986A patent/CH673060A5/de not_active IP Right Cessation
- 1985-04-30 JP JP50443185A patent/JPS62502702A/ja active Pending
- 1985-04-30 GB GB8630483A patent/GB2185104B/en not_active Expired
- 1985-04-30 AU AU49505/85A patent/AU579200B2/en not_active Ceased
- 1985-06-12 FR FR8508914A patent/FR2583516B1/fr not_active Expired
-
1986
- 1986-12-11 SE SE8605328A patent/SE455232B/sv not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
GB8630483D0 (en) | 1987-01-28 |
GB2185104A (en) | 1987-07-08 |
SE8605328D0 (sv) | 1986-12-11 |
SE455232B (sv) | 1988-06-27 |
FR2583516A1 (fr) | 1986-12-19 |
FR2583516B1 (fr) | 1987-09-18 |
AU579200B2 (en) | 1988-11-17 |
GB2185104B (en) | 1989-05-24 |
DE3590782T1 (fr) | 1987-04-23 |
SE8605328L (sv) | 1986-12-11 |
WO1986006476A1 (fr) | 1986-11-06 |
CH673060A5 (fr) | 1990-01-31 |
AU4950585A (en) | 1986-11-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5157458A (en) | Polarization interferometer spectrometer | |
Harlander et al. | Spatial heterodyne spectroscopy: a novel interferometric technique for ground-based and space astronomy | |
JPS6049847B2 (ja) | 光の強度を測定する方法及び分光計 | |
US4498773A (en) | Pencil beam interferometer | |
Jones | ‘Aether drag’in a transversely moving medium | |
US4043670A (en) | Spectrometer and method of examining spectral composition of light | |
CN109489837A (zh) | 一种基于光学干涉仪的多波长计 | |
US5757488A (en) | Optical frequency stability controller | |
JPH02206745A (ja) | 屈折率測定用高安定性干渉計 | |
Kuhn | New techniques in optical interferometry | |
Morris et al. | Portable high-resolution laser monochromator–interferometer with multichannel electronic readout | |
JPH08271337A (ja) | 分光器 | |
US20180120086A1 (en) | Sagnac Fourier Spectrometer (SAFOS) | |
JPS62502702A (ja) | 干渉選択振幅変調分光計 | |
US3122601A (en) | Interferometer | |
Steel | III Two-beam interferometry | |
CN114719983B (zh) | 空间外差拉曼光谱仪 | |
US3348446A (en) | Interferometer with pivot means located between a mirror and a transparent plate having totally reflective and semi-reflective light dividing means located thereon | |
JPS58727A (ja) | フ−リエ変換分光装置 | |
Herriott | V Some Applications of Lasers to Interferometry | |
JPH0634439A (ja) | 高分解能分光装置 | |
SU847018A1 (ru) | Измеритель перемещений | |
EP1203207A1 (fr) | Spectrometre a transformee de fourier utilisant un bloc optique | |
EP0144338A1 (fr) | Commande d'alignement dynamique de miroir | |
SU1067449A1 (ru) | Когерентный оптический анализатор пространственных спектров двумерных сигналов |