JPS6249422A - Constant-voltage generating circuit - Google Patents
Constant-voltage generating circuitInfo
- Publication number
- JPS6249422A JPS6249422A JP19068785A JP19068785A JPS6249422A JP S6249422 A JPS6249422 A JP S6249422A JP 19068785 A JP19068785 A JP 19068785A JP 19068785 A JP19068785 A JP 19068785A JP S6249422 A JPS6249422 A JP S6249422A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- circuit
- potential
- constant
- diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Control Of Electrical Variables (AREA)
- Filters That Use Time-Delay Elements (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は定電圧発生回路に関し、特にスイッチトキャバ
7タ回路を有する定電圧発生回路に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a constant voltage generation circuit, and particularly to a constant voltage generation circuit having a switched capacitor circuit.
従来、この種の定電圧発生回路は、第4図に第1の従来
例の回路図を示すように、ダイオードの順方向電圧をM
OS)ランジスタで構成する負荷回路で分配し、所要の
定電圧を発生させる。この場合、順方向電圧の温度依存
性が著しく、また、電源電圧変動に対して安定な定電圧
を得るためには、十分な電流を流す必要があり6M08
回路の第5図に示す定電圧発生回路は定電圧ダイオード
のツェナー電圧をMOS)ランジスタで構成する負荷回
路で分配し、所要の定電圧を発生させる。Conventionally, this type of constant voltage generating circuit has been used to increase the forward voltage of the diode by M, as shown in the circuit diagram of the first conventional example in FIG.
OS) Generates the required constant voltage by distributing it using a load circuit made up of transistors. In this case, the temperature dependence of the forward voltage is significant, and in order to obtain a stable constant voltage against fluctuations in the power supply voltage, it is necessary to flow a sufficient current.6M08
The constant voltage generating circuit shown in FIG. 5 distributes the Zener voltage of a constant voltage diode through a load circuit constituted by a MOS transistor to generate a required constant voltage.
この場合、ICチップでは一般に5v以下の低いツェナ
ー電圧を得ることが困難で、電源電圧が5V以下の回路
では使用できない。In this case, it is generally difficult to obtain a low Zener voltage of 5V or less with the IC chip, and it cannot be used in a circuit with a power supply voltage of 5V or less.
上述した従来の定電圧発生回路は、温度変化に弱く消費
電力が大きくなるか、または、供給電源電圧が低い回路
で使用できないという欠点がある。The above-described conventional constant voltage generation circuit has the disadvantage that it is sensitive to temperature changes and consumes a large amount of power, or cannot be used in circuits with a low supply voltage.
本発明の目的は、温度変化に強く消費電力が少くかつ供
給電源電圧が低い回路で使用できる定電圧発生回路を提
供することにある。An object of the present invention is to provide a constant voltage generation circuit that is resistant to temperature changes, consumes little power, and can be used in circuits with a low power supply voltage.
本発明の定電圧発生回路は、外部から供給されるクロッ
クでオン・オフ制御され外部からの供給電源電圧より高
い出力電圧を出力するスイッチトキャバシタ回路と、前
記供給電源電圧より高いツェナー電圧を有し前記スイッ
チトキャバシタ回路の出力端子にアノード電極が接続さ
れ・る定電圧ダイオードと、一方の端子が該定電圧ダイ
オードのカソード電極に他方の端子が接地点に接続され
る定電流回路と、一方の端子が前記定電圧ダイオードの
アノード電極に他方の端子が接地点く接続され前記出力
電圧を分配する負荷回路とを含んで構成される。The constant voltage generation circuit of the present invention includes a switched capacitor circuit that is on/off controlled by an externally supplied clock and outputs an output voltage higher than the externally supplied power supply voltage, and a zener voltage that is higher than the supplied power supply voltage. a constant voltage diode having an anode electrode connected to an output terminal of the switched capacitor circuit; and a constant current circuit having one terminal connected to a cathode electrode of the constant voltage diode and the other terminal connected to a ground point. and a load circuit whose one terminal is connected to the anode electrode of the voltage regulator diode and the other terminal is connected to a ground point and which distributes the output voltage.
次に、本発明の実施例について図面を参照して説明する
。Next, embodiments of the present invention will be described with reference to the drawings.
第1図は本発明の第1の実施例の回路図である。FIG. 1 is a circuit diagram of a first embodiment of the present invention.
第1図において、1はスイッチトキャパシタ回路、2は
供給電源電圧VDDより高いツェナー電圧を有する定電
圧ダイオード、3は定電流回路としてのMOSFET、
4はMOSFET41〜44で形成される負荷回路であ
る。In FIG. 1, 1 is a switched capacitor circuit, 2 is a constant voltage diode having a Zener voltage higher than the supply voltage VDD, 3 is a MOSFET as a constant current circuit,
4 is a load circuit formed by MOSFETs 41-44.
第1図において、スイッチトキャパシタ回路1はクロ、
りCLKによってNチャネル型のMOSFET14がオ
ン状態のとき、コンチン′y−12゜13の接続点6の
電位はVS8になる。ダイオード11の順方向電位をV
Fとすると、ダイオード11を通してコンデンサ12は
、(VDD −Vss −VF )の電位差によって帯
電する。ここで、コンデンサ12と13との容蓋を等し
く設定する。ktO8FBT14がクロックCLKによ
ってオフすると、接続点6が浮遊状態となり、コンデン
サ13にコンデンサ12と同じ電荷が誘起され、ダイオ
ード11とコンデンサ12との接続点7の電位は(VD
D −Vss−VF)の2倍になる。なお、ダイオード
11の逆方向耐圧は電源端子側に放電を起さないよう、
Pウェル拡散層とN型高濃度拡散層によって十分高い耐
圧を有するように設定する。In FIG. 1, the switched capacitor circuit 1 is
When the N-channel MOSFET 14 is turned on by CLK, the potential at the connection point 6 of the continuum y-12°13 becomes VS8. The forward potential of the diode 11 is V
F, the capacitor 12 is charged through the diode 11 by a potential difference of (VDD - Vss - VF). Here, the caps of capacitors 12 and 13 are set to be equal. When the ktO8FBT14 is turned off by the clock CLK, the connection point 6 becomes a floating state, the same charge as the capacitor 12 is induced in the capacitor 13, and the potential of the connection point 7 between the diode 11 and the capacitor 12 becomes (VD
D - Vss - VF). Note that the reverse withstand voltage of the diode 11 is set to prevent discharge from occurring on the power supply terminal side.
The P-well diffusion layer and the N-type high concentration diffusion layer are set to have a sufficiently high breakdown voltage.
MOS F’ET l 5は、スイッチトキャパシタ回
路lの出力端子8の電位より接続点7の電位が1M08
FET 15のしきい電圧より高くなるとオン状態とな
るが、クロックCLKによって接続点7のt位カ(VD
D−Vss −VF )(D時ハオフトナり、出力端子
8の電位には影響を
およほさなくなる。In MOS F'ET l 5, the potential at the connection point 7 is 1M08 from the potential at the output terminal 8 of the switched capacitor circuit l.
When the voltage becomes higher than the threshold voltage of FET 15, it turns on, but the voltage at the connection point 7 at position t (VD
D-Vss-VF) (at D time, the voltage turns off and the potential of the output terminal 8 is no longer affected.
一方、定電圧ダイオード2のツェナー電圧vzとMOS
FET3のしきい電圧Vtnとの和と出力端子8の電位
とが一致すると、MOSFET3がオン状態となり、出
力端子8の電位が(Vz +vtn )よりごく僅か下
るまで電流が流れる。したがって、クロックCLKによ
って昇圧された電圧のみが定電圧ダイオード2に印加さ
れ、定電圧ダイオード2の寄生コンデンサ21によって
、出力端子8の電位は(vz+Vtn)に維持され基準
電圧となる。On the other hand, the Zener voltage vz of the constant voltage diode 2 and the MOS
When the sum of the threshold voltage Vtn of the FET 3 and the potential of the output terminal 8 match, the MOSFET 3 is turned on, and a current flows until the potential of the output terminal 8 drops slightly below (Vz + vtn). Therefore, only the voltage boosted by the clock CLK is applied to the constant voltage diode 2, and the potential of the output terminal 8 is maintained at (vz+Vtn) by the parasitic capacitor 21 of the constant voltage diode 2, which becomes the reference voltage.
(Vz+Vtn)の基準電圧は、負荷回路4のMOSF
ET 41.42.43によって目的の電圧に分圧され
る。MOSFET44は定電圧ダイオード2に電流が流
れていない時にはオフ状態となり、スイッチトキャパシ
タ回路1がスイッチ動作をしていない時は、不要な電流
が流れることを防止する。ここで、MOSFET44で
制限される電流より、負荷のMOSFET41〜43に
よる制限電流が十分小さくなるように、MOSFET4
4とMOSFET41〜43とのチャネル幅を設定する
。The reference voltage of (Vz+Vtn) is the MOSF of the load circuit 4.
ET 41.42.43 to the desired voltage. The MOSFET 44 is in an off state when no current flows through the constant voltage diode 2, and prevents unnecessary current from flowing when the switched capacitor circuit 1 is not performing a switching operation. Here, the MOSFET 4 is set so that the current limited by the load MOSFETs 41 to 43 is sufficiently smaller than the current limited by the MOSFET 44.
4 and the channel widths of MOSFETs 41 to 43 are set.
第2図は第1図に示すスイッチトキャパシタ回路1を0
MO8で構成した場合のICチップの断面図である。FIG. 2 shows the switched capacitor circuit 1 shown in FIG.
FIG. 3 is a cross-sectional view of an IC chip constructed of MO8.
第2図に示すように、逆方向耐圧が供給電源電圧vDD
より十分に高いダイオード11.放電防止用のMOSF
ET15、N型窩゛瓢度拡散層17とアルミニー−二電
極とを両電極とするコンデンサ12と13、クロックC
LKによってオン・オフ動作するMOSFET14がそ
れぞれN型シリコン基板18上に配置されている。As shown in Figure 2, the reverse breakdown voltage is equal to the supply power supply voltage vDD
A sufficiently taller diode 11. MOSF for preventing discharge
ET15, capacitors 12 and 13 whose electrodes are an N-type cavity intensity diffusion layer 17 and two aluminum electrodes, and a clock C.
MOSFETs 14 that are turned on and off by LK are arranged on an N-type silicon substrate 18, respectively.
第3図は本発明の第2の実施例の回路図である。FIG. 3 is a circuit diagram of a second embodiment of the present invention.
第3図に示すように、スイッチトキャパシタ回路1.定
電圧ダイオード2及び定電流回路のMOSFET3によ
って発生した基準電圧は、直列に接続された負荷回路5
のコンデンサ51と52によって目的の電圧に分圧され
、5個のMOSFETで形成されるコンパレータ53に
よって定電圧出力Vref を得ている。As shown in FIG. 3, a switched capacitor circuit 1. The reference voltage generated by the constant voltage diode 2 and the MOSFET 3 of the constant current circuit is connected to the load circuit 5 connected in series.
The target voltage is divided by capacitors 51 and 52, and a constant voltage output Vref is obtained by a comparator 53 formed by five MOSFETs.
以上説明したように本発明の定電圧発生回路は。 As explained above, the constant voltage generating circuit of the present invention is as follows.
供給電源電圧をスイッチトキャパシタ回路によって昇圧
し供給電源電圧より高い基準電圧を発生させ、供給電源
電圧より高いツェナー電圧を有する定電圧ダイオードを
用いることによって、ツェナー電圧以下の供給電源電圧
においても温度依存、電源電圧依存の少い任意の定電圧
出力が低消費電力で得られるという効果がある。By boosting the supply voltage using a switched capacitor circuit to generate a reference voltage higher than the supply voltage, and by using a constant voltage diode with a Zener voltage higher than the supply voltage, temperature dependence can be reduced even at the supply voltage below the Zener voltage. This has the effect that any constant voltage output that is less dependent on the power supply voltage can be obtained with low power consumption.
第1図は本発明の第1の実施例の回路図、第2図は第1
図に示すスイッチトキャパシタ回路を0MO8で構成し
た場合のICチップの断面図、第3図は本発明の第2の
実施例の回路図、第4図は従来の定電圧発生回路の第1
の従来例の回路図、第5図は従来の定電圧発生回路の第
2の従来例の回路図である。
1°゛・・・°スイッチトキャバシタ回路、2・・°゛
・・定電圧ダイオード、4,5・・・・・・負荷回路、
16・・・・・・Pウェル拡散層、17・・・・・・N
型高濃度拡散層、18・・・・・・Nfiシリコン基板
。
3−ムFIG. 1 is a circuit diagram of a first embodiment of the present invention, and FIG. 2 is a circuit diagram of a first embodiment of the present invention.
A cross-sectional view of an IC chip when the switched capacitor circuit shown in the figure is configured with 0MO8, FIG. 3 is a circuit diagram of a second embodiment of the present invention, and FIG. 4 is a circuit diagram of a conventional constant voltage generation circuit.
FIG. 5 is a circuit diagram of a second conventional example of a conventional constant voltage generating circuit. 1°゛...°switched capacitor circuit, 2...°゛...constant voltage diode, 4,5...load circuit,
16...P well diffusion layer, 17...N
Type high concentration diffusion layer, 18...Nfi silicon substrate. 3-mu
Claims (1)
からの供給電源電圧より高い出力電圧を出力するスイッ
チトキャパシタ回路と、前記供給電源電圧より高いツェ
ナー電圧を有し前記スイッチトキャパシタ回路の出力端
子にアノード電極が接続される定電圧ダイオードと、一
方の端子が該定電圧ダイオードのカソード電極に他方の
端子が接地点に接続される定電流回路と、一方の端子が
前記定電圧ダイオードのアノード電極に他方の端子が接
地点に接続され前記出力電圧を分配する負荷回路とを含
むことを特徴とする定電圧発生回路。A switched capacitor circuit that is controlled on and off by an externally supplied clock and outputs an output voltage higher than the externally supplied power supply voltage, and an anode connected to the output terminal of the switched capacitor circuit that has a Zener voltage higher than the supplied power supply voltage. a constant current circuit having one terminal connected to the cathode electrode of the constant voltage diode and the other terminal connected to a ground point; and a constant current circuit having one terminal connected to the anode electrode of the constant voltage diode, and a load circuit having a terminal connected to a ground point and distributing the output voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19068785A JPS6249422A (en) | 1985-08-28 | 1985-08-28 | Constant-voltage generating circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19068785A JPS6249422A (en) | 1985-08-28 | 1985-08-28 | Constant-voltage generating circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6249422A true JPS6249422A (en) | 1987-03-04 |
Family
ID=16262199
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19068785A Pending JPS6249422A (en) | 1985-08-28 | 1985-08-28 | Constant-voltage generating circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6249422A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003015754A (en) * | 2001-07-03 | 2003-01-17 | Denso Corp | Reference voltage generating circuit |
EP2079164A1 (en) | 2008-01-08 | 2009-07-15 | Mitsumi Electric Co., Ltd. | Semiconductor device |
US10395983B2 (en) | 2015-12-21 | 2019-08-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming trenches |
-
1985
- 1985-08-28 JP JP19068785A patent/JPS6249422A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003015754A (en) * | 2001-07-03 | 2003-01-17 | Denso Corp | Reference voltage generating circuit |
EP2079164A1 (en) | 2008-01-08 | 2009-07-15 | Mitsumi Electric Co., Ltd. | Semiconductor device |
US10395983B2 (en) | 2015-12-21 | 2019-08-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming trenches |
US10854507B2 (en) | 2015-12-21 | 2020-12-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming trenches |
US12033891B2 (en) | 2015-12-21 | 2024-07-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming trenches |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100347680B1 (en) | Band-gap reference circuit | |
US9401660B2 (en) | Monolithic AC/DC converter for generating DC supply voltage | |
US7365578B2 (en) | Semiconductor device with pump circuit | |
US7030682B2 (en) | Voltage detection circuit and internal voltage generating circuit comprising it | |
JPH06282339A (en) | Substrate-bias generating circuit | |
US6912159B2 (en) | Boosting circuit and non-volatile semiconductor storage device containing the same | |
US4208595A (en) | Substrate generator | |
US10903840B2 (en) | Pad tracking circuit for high-voltage input-tolerant output buffer | |
US6977523B2 (en) | Voltage level shifting circuit | |
JP2005191821A (en) | Comparator circuit and power supply circuit | |
JP3148070B2 (en) | Voltage conversion circuit | |
JPS6249422A (en) | Constant-voltage generating circuit | |
US7808303B2 (en) | Booster circuit | |
US4275437A (en) | Semiconductor circuit for voltage conversion | |
EP0065840A1 (en) | Temperature stabilized voltage reference circuit | |
JPH0430207B2 (en) | ||
JP2005044203A (en) | Power supply circuit | |
US12040705B2 (en) | Self clocked low power doubling charge pump | |
JP2005032260A (en) | Bootstrap capacitor charge circuit with limited charge current | |
JP3145753B2 (en) | Intermediate potential generation circuit | |
JPS59201522A (en) | Integrated circuit | |
CN116338274A (en) | Semiconductor device with a semiconductor device having a plurality of semiconductor chips | |
JP3394881B2 (en) | Semiconductor integrated circuit device | |
KR900002472B1 (en) | Output circuit of semiconductor device | |
JPS6050000B2 (en) | MIS field effect semiconductor circuit device |