JPS6249239U - - Google Patents
Info
- Publication number
- JPS6249239U JPS6249239U JP14098185U JP14098185U JPS6249239U JP S6249239 U JPS6249239 U JP S6249239U JP 14098185 U JP14098185 U JP 14098185U JP 14098185 U JP14098185 U JP 14098185U JP S6249239 U JPS6249239 U JP S6249239U
- Authority
- JP
- Japan
- Prior art keywords
- probe card
- needle
- semiconductor chip
- partially
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000012780 transparent material Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14098185U JPS6249239U (de) | 1985-09-13 | 1985-09-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14098185U JPS6249239U (de) | 1985-09-13 | 1985-09-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6249239U true JPS6249239U (de) | 1987-03-26 |
Family
ID=31048342
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14098185U Pending JPS6249239U (de) | 1985-09-13 | 1985-09-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6249239U (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010156569A (ja) * | 2008-12-26 | 2010-07-15 | National Institute Of Advanced Industrial Science & Technology | 積層ｌｓｉチップのシステム検査のための方法および装置 |
-
1985
- 1985-09-13 JP JP14098185U patent/JPS6249239U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010156569A (ja) * | 2008-12-26 | 2010-07-15 | National Institute Of Advanced Industrial Science & Technology | 積層ｌｓｉチップのシステム検査のための方法および装置 |