JPS6242376Y2 - - Google Patents

Description

[Detailed description of the invention] (a) Technical field of the invention This invention relates to the improvement of a probe used for core wire comparison of idle lines, PCM lines, working lines, etc.

(b) Prior art and problems When connecting communication cables, etc., a fiber calibrator is used to check whether the cables are connected correctly and according to the core numbers, and to check for disconnections due to deterioration of the cable.

Next, FIG. 1 shows a configuration diagram of a conventional fiber locator.

1 and 2 in Figure 1 are core wires, 3 and 4 are probes,
5 and 6 are interlocking changeover switches, 7 is an amplifier,
8 is a level measuring device, and 9 is an oscillator.

The probes 3 and 4 are configured to sandwich the core wires 1 and 2 between them.

In FIG. 1, there are cases in which signals superimposed on the core wires 1 and 2 are detected, and cases in which signals are superimposed on the core wires 1 and 2.

When switches 5 and 6 are connected to contacts 5A and 6A, respectively, the signals superimposed on core wires 1 and 2 are guided from probes 3 and 4 to amplifier 7, amplified by amplifier 7, and then level measuring device 8. The level is measured.

When the switches 5 and 6 are connected to the contacts 5B and 6B, respectively, the signal from the oscillator 9 is supplied from the probes 3 and 4 to the core wires 1 and 2.
The level is detected by a level measuring device (not shown) connected to the end of the.

The probes used in the core wire comparator are coupled to the core wires 1 and 2 using electrostatic coupling, electromagnetic coupling, etc., and the probes 3 and 4 shown in FIG. 1 utilize electrostatic coupling.

Next, FIG. 2 shows a cross-sectional view of a conventional probe using electrostatic coupling.

1A in Figure 2 is the center conductor, 1B is the insulator, 2
A is the center conductor, 2B is the insulator, 3A is the conductor plate,
3B is an insulator, and 3C is a support frame.

The core wire 1 consists of a center conductor 1A and an insulator 1B surrounding the center conductor 1A, and the core wire 2 consists of a center conductor 1A and an insulator 1B surrounding the center conductor 1A.
It is composed of A and an insulator 2B.

Further, the conductor plate 3A and the insulator 3B can be formed of a printed circuit board or the like, and the conductor plate 3A and the insulator 3B are held by the support frame 3C.

The probe shown in Figure 2 sandwiches the core wires 1 and 2 between two conductor plates 3A, and supplies or extracts signals through electrostatic coupling between the conductor plate 3A and the core wires 1 and 2. be.

Using the probe in Figure 2, conductor wires 1 and 2 and conductor plate 3A.
In order to increase the degree of coupling, the contact area between the core wires 1 and 2 and the conductor plate 3A must be increased.

Further, since the conductor plate 3A has no elasticity, it is difficult for the conductor plate 3A to come into even contact with the core wires 1 and 2, and an unreasonable force may be applied to either the core wires 1 or 2.

(c) Purpose of the invention This invention uses a flexible conductor plate and a cushion to increase the coupling efficiency between the conductor plate and the core wire, and to apply an average force to the core wires in the set. The purpose is to provide a probe with

(d) Example of the invention First, FIG. 3 shows a sectional view of a probe according to an embodiment of the invention.

In FIG. 3, 3D is a flexible conductor plate, 3E is a cushion, and 3F is a support frame.

For the conductor plate 3D, a flexible conductor, such as a flexible printed board, which can be bent flexibly so as to wrap around the core wires 1 and 2 is used.

The cushion 3E is made of a stretchable insulating material such as sponge rubber, which bends and stretches as the conductor plate 3D bends and stretches.

Conductor plate 3D, cushion 3E and support frame 3F
The relationship is as follows.

That is, the conductor plate 3D and cushion 3E are bonded to the support frame 3F with an adhesive or the like so that the conductor plate 3D is on the outside.

The two support frames 3F are placed to face each other so that the conductive plates 3D face each other. In this case, the supporting frames 3 facing each other
Form so that the tips of F are in contact with each other. In FIG. 3, the tips of the support frames 3F are each formed into an L-shape.

The core wires 1 and 2 are electrostatically coupled to the two conductor plates 3D so that their outer peripheries are wrapped by the two conductor plates 3D.

As is clear from FIG. 3, the contact area between the core wires 1 and 2 and the conductor plate 3D is considerably increased in FIG. 3 compared to FIG. 2, and the amount of electrostatic coupling is increased.

Therefore, if the same amount of binding as in FIG. 2 is sufficient, the probe in FIG. 3 can be made smaller.

Next, conductor plate 3D and cushion 3E in Fig. 3.
The developed view is shown in Fig. 4.

The two conductive plates 3D are joined to the cushion 3E in an electrically non-conductive state.

The core wires 1 and 2 are sandwiched between two conductor plates 3D as shown in FIG. 4, which face each other so that the same shapes overlap.

Now, the conductor plate 3D on the left side of FIG. 4 is a first conductor plate, the conductor plate 3D on the right side of FIG. 4 is a second conductor plate, and the support frame 3F that connects the conductor plate 3D of FIG. Let be the first support frame.

Further, the support frame 3F facing the first support frame is connected to the second support frame, and the support frame 3F facing the first support frame is joined to the second support frame, and
The conductor plate 3D facing the conductor plate 3D is the third conductor plate, and the conductor plate 3D facing the second conductor plate is the fourth conductor plate.
Assuming that the conductor plate is , from FIGS. 3 and 4, this invention will be constructed as follows.

A first conductive plate and a second conductive plate that are flexible and non-conductive to each other are joined to a cushion 3E,
Attach the cushion 3E to the first support frame so that the first conductor plate and the second conductor plate are on the outside,
A third conductive plate and a fourth conductive plate which are flexible and non-conductive to each other are joined to the cushion 3E, and the third conductive plate is connected to the cushion 3E.
Attach the cushion 3E to the second support frame so that the conductor plate and the fourth conductor plate are on the outside, and
The first support frame and the second support frame face each other so that the conductor plate and the third conductor plate face each other, and the second conductor plate and the fourth conductor plate face each other. The tip is formed so that the tip of the second support frame contacts, the core wire 1 is sandwiched between the first conductor plate and the third conductor plate, and the core wire 2 is sandwiched between the second conductor plate and the fourth conductor plate. sandwich.

That is, the probes shown in FIGS. 3 and 4 are a combination of the probes 3 and 4 shown in FIG. 1, and are guided from the leads 3M and 3N to the changeover switches 5 and 6 shown in FIG.

Next, FIG. 5 shows an explanatory diagram of the state in which the probe according to this invention is used.

FIG. 5 shows a state in which a pair of core wires 1 and 2 are sandwiched between upper and lower support frames 3F, and signals are being transmitted and received between the core wires 1 and 2 and the probe.

(e) Effect of invention This idea has the following effects.

(a) The joint area between the cushion and the support frame increases.

(b) Since the ends of the support frame are in contact, no unreasonable force is applied to the core wire even if more force is applied.

(C) Both the conductor plate and the cushion are flexible, so even if the core wire and conductor plate come into contact, the core wire will not be damaged.

(d) Since approximately the same amount of pressure is applied to the core wires of the pair, the amount of capacitive coupling is also approximately the same.

(E) To supply a signal to the core wire with a conventional probe like the one shown in Figure 2, the output of the oscillator must be approximately
Previously, 900V was required, but using the probe of this invention, it only requires about 700V.

[Brief explanation of the drawing]

Fig. 1 is a diagram of the principle of the core wire locator, Fig. 2 is a sectional view of a conventional probe, Fig. 3 is a sectional view of an embodiment of the probe according to this invention, and Fig. 4 is a diagram showing the conductor plate 3D of Fig. 3. A developed view of the cushion 3E and FIG. 5 are explanatory views of the state in which the probe according to this invention is used. 1... Core wire, 1A... Center conductor, 1B... Insulator, 2... Core wire, 3... Probe, 3A... Conductor plate, 3B... Insulator, 3C... Support frame, 3D...
Conductor plate, 3E...Cushion, 3F...Support frame,
3M...lead, 3N...lead, 4...probe, 5...changeover switch, 6...switch, 7...
...Amplifier, 8... Level measuring device, 9... Oscillator.

Claims (1)

[Claims for Utility Model Registration] A first conductive plate and a second conductive plate that are flexible and non-conductive to each other are joined to a first cushion, and the first conductive plate and the second conductive plate are connected to a first cushion. A first cushion is attached to the first support frame so as to face outward, a third conductive plate and a fourth conductive plate, which are flexible and are non-conductive to each other, are joined to the second cushion. The second cushion is attached to the second support frame so that the conductor plate and the fourth conductor plate face outward, the first conductor plate and the third conductor plate face each other, and the second conductor plate and the fourth conductor plate face outward. The first support frame and the second support frame are arranged to face each other so that the conductor plates of No. 4 face each other, and the tips of the first support frame and the second support frame are formed so as to be in contact with each other. The first core wire is sandwiched between the conductor plate and the third conductor plate, and the second core wire is sandwiched between the second conductor plate and the fourth conductor plate.
A core wire comparison probe characterized by sandwiching a core wire.