JPS6235253Y2 - - Google Patents
Info
- Publication number
- JPS6235253Y2 JPS6235253Y2 JP7536482U JP7536482U JPS6235253Y2 JP S6235253 Y2 JPS6235253 Y2 JP S6235253Y2 JP 7536482 U JP7536482 U JP 7536482U JP 7536482 U JP7536482 U JP 7536482U JP S6235253 Y2 JPS6235253 Y2 JP S6235253Y2
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- grid
- energy
- floating
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 claims description 32
- 238000001514 detection method Methods 0.000 claims description 9
- 150000002500 ions Chemical group 0.000 description 12
- 230000035945 sensitivity Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7536482U JPS58178267U (ja) | 1982-05-21 | 1982-05-21 | 荷電粒子検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7536482U JPS58178267U (ja) | 1982-05-21 | 1982-05-21 | 荷電粒子検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58178267U JPS58178267U (ja) | 1983-11-29 |
| JPS6235253Y2 true JPS6235253Y2 (fr) | 1987-09-08 |
Family
ID=30084726
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7536482U Granted JPS58178267U (ja) | 1982-05-21 | 1982-05-21 | 荷電粒子検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58178267U (fr) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7432459B2 (ja) * | 2020-07-15 | 2024-02-16 | 浜松ホトニクス株式会社 | チャネル型電子増倍体およびイオン検出器 |
-
1982
- 1982-05-21 JP JP7536482U patent/JPS58178267U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58178267U (ja) | 1983-11-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5202561A (en) | Device and method for analyzing ions of high mass | |
| Cottrell et al. | Characteristics of a multichannel electrooptical detection system and its application to the analysis of large molecules by fast atom bombardment mass spectrometry | |
| JPS62264546A (ja) | 質量分析器 | |
| EP0559202B1 (fr) | Spectromètre de masse à ions secondaires destiné à l'analyse des ions positifs et négatifs | |
| US3240931A (en) | Spatial discriminator for particle beams | |
| US10276359B2 (en) | Ion mobility spectrometer | |
| Gspann | Negatively charged helium-4 clusters | |
| JPS6235253Y2 (fr) | ||
| US6717131B2 (en) | Clean daughter-ion spectra using time-of-flight mass spectrometers | |
| US3475604A (en) | Mass spectrometer having means for simultaneously detecting single focussing and double focussing mass spectra | |
| US5118936A (en) | Accuracy of AMS isotopic ratio measurements | |
| DE2950330C2 (de) | Vorrichtung zur chemischen Analyse von Proben | |
| Poschenrieder et al. | New Directional and Energy Focusing Time of Flight Mass Spectrometers for Special Tasks in Vacuum and Surface Physics | |
| Eland | Improved resolution in fixed‐wavelength photoelectron–photoion coincidence spectroscopy | |
| Braams et al. | Composition of Noble Gas Ion Beams Produced with a Duoplasmatron | |
| JPS6371680A (ja) | イオン検出器 | |
| US2691107A (en) | Mass spectrometry | |
| US20240128070A1 (en) | Multimode ion detector with wide dynamic range and automatic mode switching | |
| US6815689B1 (en) | Mass spectrometry with enhanced particle flux range | |
| US2845539A (en) | Mass spectrometry | |
| JPS6245423Y2 (fr) | ||
| Wolf et al. | A new method for electrostatic ion deflection | |
| Nakao | Photon‐blind, high collection efficiency ion detector for a quadrupole mass spectrometer | |
| Wiebert et al. | The charge state distributions of carbon beams measured at the Lund Pelletron accelerator | |
| SU439775A1 (ru) | Устройство дл регистрации энергетических спектров электронной эмиссии |