JPS62292693A - Liquid epitaxy device - Google Patents

Liquid epitaxy device

Info

Publication number
JPS62292693A
JPS62292693A JP13492686A JP13492686A JPS62292693A JP S62292693 A JPS62292693 A JP S62292693A JP 13492686 A JP13492686 A JP 13492686A JP 13492686 A JP13492686 A JP 13492686A JP S62292693 A JPS62292693 A JP S62292693A
Authority
JP
Japan
Prior art keywords
growth
substrate
soln
solution
substrate holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13492686A
Other languages
Japanese (ja)
Other versions
JPH0419196B2 (en
Inventor
Tsunehiro Unno
恒弘 海野
Mineo Wajima
峰生 和島
Hisafumi Tate
尚史 楯
Taiichiro Konno
泰一郎 今野
Hiroshi Sugimoto
洋 杉本
Shoji Kuma
隈 彰二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP13492686A priority Critical patent/JPS62292693A/en
Publication of JPS62292693A publication Critical patent/JPS62292693A/en
Publication of JPH0419196B2 publication Critical patent/JPH0419196B2/ja
Granted legal-status Critical Current

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  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To grow an epitaxial layer in uniform thickness of the surface of a substrate by forcing up a soln. for growth to bring the soln. into contact with plural substrates longitudinally held by a holding part, and then separating the soln. in the holding part and the soln. on the outside of the holding part. CONSTITUTION:A substrate 7 is longitudinally held by a substrate holder 4 in a growth jig 1. A polycrystal for growth is charged into a soln. reservoir 2, and dissolved to obtain a saturated soln. 8. A piston 3 is thrust in to force up the growth soln. 8, hence the soln. is brought into contact with the substrate 7, and then a lower shutter 6 is closed to separate the soln. 8 supplied in the substrate holder 4 from the soln. 8 on the lower piston 3 side. An upper shutter 5 is further closed to separate the soln. 8 in the substrate holder 4 from the soln. 8 at the upper part. At this time, the interval (a) between the upper or lower end of the substrate 7 and the respective shutters 5 and 6 and the distance (b) between the opposed substrates 7 are limited to conform to a<2b. Cooling is continued under said conditions, an equitaxial layer is grown on the substrate 7, and the layer having uniform thickness is obtained.

Description

【発明の詳細な説明】 3、発明の詳細な説明 [産業上の利用分野] 本発明は液相エピタキシャル成長装置に係り、特に基板
を縦に配置した状態でエピタキシャル成長させる装置に
関するものである。
Detailed Description of the Invention 3. Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a liquid phase epitaxial growth apparatus, and particularly to an apparatus for epitaxially growing a substrate in a vertically disposed state.

[従来の技術] GaAs等の化合物半導体のエピタキシt・ル成長法に
は液相成長法、気相成長法(VPE法)。
[Prior Art] Epitaxial growth methods for compound semiconductors such as GaAs include liquid phase growth and vapor phase growth (VPE).

有機金属熱分解気相成長法(MOCVD法)。Metalorganic pyrolysis vapor deposition method (MOCVD method).

分子線エピタキシャル法(MBE法)等があるが、良質
の結晶相を得るためには液相成長法が最も適し、発光ダ
イオードや半導体レーザの生産レベルで広く用いられて
いる。この液相成長法は成分元素を含んだ溶液に直接基
板を接触させて結晶成長させる方法であり、ざらに膜厚
が均一な多層成長を行なわせる場合にはスライドボート
法が一般に用いられている。
Although there are methods such as molecular beam epitaxial method (MBE method), liquid phase growth method is most suitable for obtaining a high-quality crystal phase and is widely used at the production level of light emitting diodes and semiconductor lasers. This liquid phase growth method is a method in which crystals are grown by bringing the substrate into direct contact with a solution containing component elements, and the slide boat method is generally used to grow multilayers with a roughly uniform film thickness. .

ところが、このスライドボート法では一度に数枚のウェ
ハしか製造することができないので、量産性を上げたい
場合には複数の基板を成長用治具内にそれぞれ縦に保持
させ、これらに成長用溶液を接触させて成長を行なう方
法が採られている。
However, this slide boat method can only manufacture a few wafers at a time, so if you want to increase mass production, you can hold multiple substrates vertically in a growth jig and apply the growth solution to them. A method has been adopted in which growth is achieved by bringing the materials into contact with each other.

この方法を第9図により説明する。This method will be explained with reference to FIG.

まず、成長用治具91の底部に位置する溶液溜92内に
成長用溶液93を収容すると共にその上部に位置する基
板保持用治具94に複数の基板95をそれぞれ縦に保持
させる。次に、ピストン96を押し込んで成長用溶液9
3を上方に押し上げ、これにより基板95と成長用溶液
93を接触さけて成長を行なう。その後、ピストン96
を引いて成長用溶液93を再び溶液溜92内に戻す。
First, a growth solution 93 is contained in a solution reservoir 92 located at the bottom of a growth jig 91, and a plurality of substrates 95 are each held vertically by a substrate holding jig 94 located above it. Next, push the piston 96 into the growth solution 9.
3 is pushed upward, thereby avoiding contact between the substrate 95 and the growth solution 93 to perform growth. After that, piston 96
The growth solution 93 is returned to the solution reservoir 92 by pulling .

このような方法を用いれば、一度に多数の基板上に成長
を行なわせることができる。さらに、成長少に成長用溶
液が再び溶液溜内に戻るので、成長用溶液の再利用が容
易となり経済的である。
If such a method is used, growth can be performed on multiple substrates at once. Furthermore, since the growth solution returns to the solution reservoir when growth is low, the growth solution can be reused easily and economically.

し発明が解決しようとする問題点] しかしながら、上述した方法では成長時に基板の表面上
のみならず基板の周縁部、特に第9図において基板95
の上部及び下部にまで成長用溶液が接触するので、成長
したエピタキシ11ル層は基板の中央部に比べてその周
縁部の方が厚くなってしまう。例えば、第9図に示す成
長用治具91を用いて基板95の表面上にエピタキシp
)’Jmを厚さ30−程度成長させると、基板95の周
縁部では中央部の倍以上の厚さにもなる。
[Problems to be Solved by the Invention] However, in the above-described method, during growth, not only the surface of the substrate but also the periphery of the substrate, especially the substrate 95 in FIG.
Since the growth solution contacts the top and bottom of the substrate, the grown epitaxial layer is thicker at the periphery than at the center of the substrate. For example, using a growth jig 91 shown in FIG.
)'Jm is grown to a thickness of about 30 mm, the thickness at the periphery of the substrate 95 becomes more than twice that at the center.

このように、基板を縦に配置して成長さしるこの方法で
はスライドボート法に比べて膜厚の均一・性に劣り、精
度の高いエピタキシャル層を成長させることが困難であ
った。
As described above, this method, in which the substrate is vertically arranged and grown, is inferior to the slide boat method in terms of uniformity and quality of the film thickness, and it is difficult to grow an epitaxial layer with high precision.

かくして、本発明の目的は上記従来技術の問題点を解消
し、量産性に優れると共に膜厚の均一なエピタキシャル
層を成長させることができる液相エピタキシャル成長装
置を提供することにある。
SUMMARY OF THE INVENTION It is thus an object of the present invention to provide a liquid phase epitaxial growth apparatus which solves the problems of the above-mentioned prior art, has excellent mass productivity, and is capable of growing an epitaxial layer with a uniform thickness.

[問題点を解決するための手段] 本発明の液相エピタキシャル成長装置は上記目的を達成
するために、成長用治具の底部に成長用溶液を収容する
と共にその上方に位置する基板保持部に複数の基板をそ
れぞれ縦に配列し、上記成長用溶液を押し上げることに
より基板保持部内に成長用溶液を供給して基板表面上に
成長用溶液を接触させエピタキシャル成長させる装置に
おいて、上記基板と上記成長用溶液との接触後に上記基
板保持部内に供給されている成長用溶液と基板保持部外
の成長用溶液とを分離する分離手段を設けたものである
[Means for Solving the Problems] In order to achieve the above object, the liquid phase epitaxial growth apparatus of the present invention accommodates a growth solution at the bottom of a growth jig, and a plurality of substrate holders located above the growth jig. In an apparatus for epitaxial growth, the substrates are arranged vertically and the growth solution is supplied into the substrate holder by pushing up the growth solution to bring the growth solution into contact with the substrate surface for epitaxial growth. Separation means is provided for separating the growth solution supplied into the substrate holder from the growth solution outside the substrate holder after contact with the substrate holder.

[作 用] 以上のような分離手段を設けて成長時における基板保持
部内外の成長用溶液を分子!iiすることにより、基板
保持部外の成長用溶液が基板の周縁部での成長に寄与す
ることを防ぐことができる。その結果、基板表面上に成
長したエピタキシャル層はその周縁部が中央部に比べて
厚くなることもなく、均一な厚さを有することになる。
[Function] By providing the above-mentioned separation means, the growth solution inside and outside the substrate holder during growth can be separated into molecules! By doing this, it is possible to prevent the growth solution outside the substrate holder from contributing to growth at the peripheral edge of the substrate. As a result, the epitaxial layer grown on the substrate surface has a uniform thickness without being thicker at the periphery than at the center.

[実施例] 以下、本発明の実施例を添付図面に従って説明する。[Example] Embodiments of the present invention will be described below with reference to the accompanying drawings.

第1図は本発明の一実施例に係る液相エピタキシャル成
長装置に用いられる成長用冶具の構成図である。この成
長用冶具1の底部には成長用溶液を収容する溶液溜2が
設けられ、この溶′a溜2の一側部に成長用溶液を押し
上げるあるいは落下させるためのピストン3が設けられ
ている。また、溶液溜2は上部が開放されており、その
上方に複数の基板をそれぞれ縦に保持し得る基板ホルダ
4が設けられている。さらに、基板ホルダ4の上端面及
び下端面に沿ってそれぞれ水平方向に開閉自在に平板状
の上部シャッタ5及び下部シャッタ6が設けられ、これ
らを閉じることにより基板ホルダ4が成長用治具1内の
他の部分から密閉されるように構成されている。
FIG. 1 is a configuration diagram of a growth jig used in a liquid phase epitaxial growth apparatus according to an embodiment of the present invention. A solution reservoir 2 for containing a growth solution is provided at the bottom of the growth jig 1, and a piston 3 for pushing up or dropping the growth solution is provided on one side of this solution reservoir 2. . Further, the solution reservoir 2 has an open top, and a substrate holder 4 that can vertically hold a plurality of substrates is provided above the solution reservoir 2 . Further, an upper shutter 5 and a lower shutter 6 are provided along the upper end surface and the lower end surface of the substrate holder 4, respectively, in the form of a flat plate, which can be opened and closed in the horizontal direction, and by closing these, the substrate holder 4 is moved into the growth jig 1. It is constructed so that it is sealed from other parts of the

以上のような構成の成長用治具1を用いてGaAS基根
上基原上30%のGaAsエピタキシャル層を成長させ
た。
Using the growth jig 1 having the above configuration, a 30% GaAs epitaxial layer was grown on the GaAS root.

まず、基板ホルダ4に50a* X 50mのGaAs
1板7を計12枚縦に保持させた。このとき、互いに向
い合う基板7間の距離は3IImであった。さらに、溶
液溜2内にGa 500g及びGaAs多結晶40gを
収容した。なお、上部シャッタ5及び下部シャッタ6は
共に開いておく。
First, GaAs of 50a* x 50m is placed on the substrate holder 4.
A total of 12 plates 7 were held vertically. At this time, the distance between the substrates 7 facing each other was 3IIm. Furthermore, 500 g of Ga and 40 g of GaAs polycrystal were placed in the solution reservoir 2. Note that both the upper shutter 5 and the lower shutter 6 are left open.

次に、この成長用治具1を反応管(図示せず)内に配置
し、反応管内を水素ガス置換した後、外部の電気炉(図
示せず)により炉内を800℃まで昇温し溶液溜2内の
Ga中にGaAs多結晶を飽和状態まで溶かして成長用
溶液8を形成する。
Next, this growth jig 1 was placed in a reaction tube (not shown), and after replacing the inside of the reaction tube with hydrogen gas, the temperature inside the furnace was raised to 800°C using an external electric furnace (not shown). A growth solution 8 is formed by dissolving GaAs polycrystals in Ga in the solution reservoir 2 to a saturated state.

その後、冷却速度1℃/minで炉内を降温し、成長用
溶液8に過飽和度4℃を付けたところでピストン3を押
し込み、成長用溶液8を上方へ押し上げる(第2図参照
)。
Thereafter, the temperature inside the furnace is lowered at a cooling rate of 1° C./min, and when the growth solution 8 reaches a supersaturation degree of 4° C., the piston 3 is pushed in to push the growth solution 8 upward (see FIG. 2).

このようにして基板7と成長用溶液8との接触を行なっ
た模、下部シャッタ6を閉じて基板ホルダ4内に供給さ
れた成長用溶液8を下方のピストン3側に位置する成長
用溶液から分離する(第3図参照)。
After contacting the substrate 7 and the growth solution 8 in this way, the lower shutter 6 is closed and the growth solution 8 supplied into the substrate holder 4 is transferred from the growth solution located on the lower piston 3 side. Separate (see Figure 3).

次いで、上部シャッタ5を閉じ、基板ホルダ4内の成長
用溶液8を上方の成長用溶液からも分離する(第4図参
照)。この状態で冷却を続け、基板7上にエピタキシャ
ル層を成長させる。
Next, the upper shutter 5 is closed to separate the growth solution 8 in the substrate holder 4 from the growth solution above (see FIG. 4). Cooling is continued in this state to grow an epitaxial layer on the substrate 7.

成長が終了し仁ら、上部シャッタ5及び下部シャッタ6
を順次開き、その後ピストン3を引いて成長用溶液8を
溶液溜2内に落下させ、第1図のような状態に戻す。そ
して、成長用冶具1を反応管内から引き出し、基板ホル
ダ4から製造されたエピタキシャルウェハを取り出した
。続けてウェハを製造する場合には、溶液溜2内の成長
用溶液8をそのまま用い、新しい基板を配置するだけで
再び成長を開始させることができる。
After the growth is completed, the upper shutter 5 and the lower shutter 6 are opened.
are successively opened, and then the piston 3 is pulled to drop the growth solution 8 into the solution reservoir 2, returning the state as shown in FIG. Then, the growth jig 1 was pulled out of the reaction tube, and the manufactured epitaxial wafer was taken out from the substrate holder 4. When manufacturing wafers subsequently, growth can be started again by simply using the growth solution 8 in the solution reservoir 2 and placing a new substrate.

このようにして製造された12枚のエピタキシャルウェ
ハの膜厚を測定したところ、それぞれ304±10%の
範囲内で且つ面内ばらつきもそれぞれ±10%以内であ
り、優れた均一性が得られた。
When the film thickness of 12 epitaxial wafers manufactured in this way was measured, each was within a range of 304 ± 10%, and the in-plane variation was within ± 10%, indicating excellent uniformity. .

なお、第5図に示すように上部シャッタ5及び下部シャ
ッタ6を開じたときの基板7の上端あるいは下端と各シ
ャッタとの間隔aは小さい程膜厚の均一なエピタキシャ
ル層が基板7上に形成されることが確認されたが、特に
相対向する基板7間の距Mbに対して a<2b の関係を満たす場合に上記実施例と同様の均一性が得ら
れることがわかった。
As shown in FIG. 5, the smaller the distance a between the upper or lower end of the substrate 7 and each shutter when the upper shutter 5 and the lower shutter 6 are opened, the more uniform the epitaxial layer will be on the substrate 7. In particular, it was found that uniformity similar to that of the above embodiment can be obtained when the relationship a<2b is satisfied with respect to the distance Mb between the opposing substrates 7.

また、上記実施例では上部シャッタ5及び下部シ1?ツ
タ6が平板形状をなしていたがこれに限るものではなく
、第6図に示すように基板ボルダ4の間隙部61の位置
に対応して複数の開口部62を有する格子状のシャッタ
63及び64を用いることもできる。この場合、第6図
のように基板ホルダ4の間隙部61に各シャッタ63及
び64の開口部62を合わせた状態でピストン3を押し
込み、成長用溶液8を基板7に接触させた後、第7図の
如く各シャッタ64及び63を順次わずかに左方へ移動
させて基板ホルダ4の各間隙部61内の成長用溶液8を
他から分離する。このようにすれば、各シャッタをわず
かに移動させるだけで成長用溶液の分離を行なうことが
できる。
Further, in the above embodiment, the upper shutter 5 and the lower shutter 1? Although the ivy 6 has a flat plate shape, the shape is not limited to this, and as shown in FIG. 64 can also be used. In this case, as shown in FIG. 6, the piston 3 is pushed in with the openings 62 of the shutters 63 and 64 aligned with the gap 61 of the substrate holder 4, and the growth solution 8 is brought into contact with the substrate 7. As shown in FIG. 7, the shutters 64 and 63 are sequentially moved slightly to the left to separate the growth solution 8 in each gap 61 of the substrate holder 4 from the others. In this way, the growth solution can be separated by only slightly moving each shutter.

また、基板ホルダ内外の成長用溶液を分離するために、
第8図のように基板ホルダ81の上部及び下部にそれぞ
れ接する固定板82及び83を設け、これら固定板82
及び83の間を基板ホルダ81が移動する↓うに構成し
てもよい。この場合、第8図の如く溶液溜84の直上に
基板ホルダ81内のり板85を位置させた状態でピスト
ン86を押し込み、これにより成長用溶液87を基板ホ
ル°ダ81内に供給した後、M板ホルダ81を矢印の方
向に移動して成長用溶液87を分離する。
In addition, in order to separate the growth solution inside and outside the substrate holder,
As shown in FIG. 8, fixing plates 82 and 83 are provided which touch the upper and lower parts of the substrate holder 81, respectively.
It may be configured such that the substrate holder 81 moves between and 83. In this case, as shown in FIG. 8, with the mounting plate 85 in the substrate holder 81 positioned directly above the solution reservoir 84, the piston 86 is pushed in, thereby supplying the growth solution 87 into the substrate holder 81. The growth solution 87 is separated by moving the plate holder 81 in the direction of the arrow.

本発明の装置はGaAsを含む■−V族化合物半導体及
びGaAu As等の混晶化合物半導体、 II−rV
族化合物半導体とその混晶等の液相エピタキシャル成長
に適用することができる。
The device of the present invention is a ■-V group compound semiconductor containing GaAs, a mixed crystal compound semiconductor such as GaAuAs, and a II-rV compound semiconductor.
It can be applied to liquid phase epitaxial growth of group compound semiconductors and their mixed crystals.

[弁明の効果1 以上説明したように本発明によれば、次のrAIき優れ
た効果を発揮する。
[Advantageous Effect 1] As explained above, according to the present invention, the following excellent effects of rAI are exhibited.

〈1)  基板を縦に配置して成長ざぜる方法を用いな
がらもスライドボート法並の膜厚の均一性を有するエピ
タキシセル層の成長が可能となる。
(1) It is possible to grow an epitaxy cell layer with the same uniformity of film thickness as the slide boat method even though the method uses a method in which the substrates are arranged vertically and the growth is mixed.

(2)  すなわち、膜厚の均一な高品質のエピタキシ
ャルウェハを量産性よく製造することができる。
(2) That is, high-quality epitaxial wafers with uniform film thickness can be manufactured with good mass productivity.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例に係る液相エピタキシャル成
長装置に用いられる成長用冶具の構成図、第2図ないし
第4図は実施例の作用を示す工程図、第5図は基板ホル
ダに保持された基板と上部及び下部シャッタとの位置関
係を示す部分拡大図、第6図ないし第8図はそれぞれ他
の実施例で用いられる成長用治具の構成図、第9図は従
来の成長用冶具の構成図である。 図中、1は成長用治具、3はピストン、4は基板ホルダ
、5は上部シャッタ、6は下部シャッタ、7は基板、8
は成長用溶液である。 第3図 第4図 マ   \ な 寸 笥        1
FIG. 1 is a configuration diagram of a growth jig used in a liquid phase epitaxial growth apparatus according to an embodiment of the present invention, FIGS. 2 to 4 are process diagrams showing the operation of the embodiment, and FIG. A partially enlarged view showing the positional relationship between the held substrate and the upper and lower shutters, FIGS. 6 to 8 are configuration diagrams of growth jigs used in other embodiments, and FIG. 9 is a conventional growth jig. It is a block diagram of a jig. In the figure, 1 is a growth jig, 3 is a piston, 4 is a substrate holder, 5 is an upper shutter, 6 is a lower shutter, 7 is a substrate, and 8
is the growth solution. Figure 3 Figure 4

Claims (4)

【特許請求の範囲】[Claims] (1)成長用治具の底部に成長用溶液を収容すると共に
その上方に位置する基板保持部に複数の基板をそれぞれ
縦に配列し、上記成長用溶液を押し上げることにより基
板保持部内に成長用溶液を供給して基板表面上に成長用
溶液を接触させエピタキシャル成長させる装置において
、上記基板と上記成長用溶液との接触後に上記基板保持
部内に供給されている成長用溶液と基板保持部外の成長
用溶液とを分離する分離手段を設けたことを特徴とする
液相エピタキシャル成長装置。
(1) A growth solution is stored in the bottom of the growth jig, and a plurality of substrates are arranged vertically in a substrate holder located above the growth jig, and the growth solution is pushed up into the substrate holder. In an apparatus for epitaxial growth by supplying a solution and bringing the growth solution into contact with the substrate surface, after the substrate and the growth solution come into contact, the growth solution being supplied into the substrate holding part and the growth outside the substrate holding part are removed. 1. A liquid phase epitaxial growth apparatus, characterized in that it is provided with a separation means for separating the liquid from the solution.
(2)上記分離手段が上記基板保持部の上部及び下部に
それぞれ開閉自在に設けられたシャッタからなることを
特徴とする特許請求の範囲第1項記載の装置。
(2) The apparatus according to claim 1, wherein the separating means comprises shutters that are provided at the upper and lower parts of the substrate holding section so as to be openable and closable, respectively.
(3)上記分離手段がそれぞれ上記基板保持部の上部及
び下部に接する固定板からなり、上記基板保持部が上記
固定板の間を移動自在に設けられていることを特徴とす
る特許請求の範囲第1項記載の装置。
(3) The first aspect of the present invention is characterized in that the separating means comprises fixing plates that are in contact with the upper and lower parts of the substrate holder, respectively, and the substrate holder is provided so as to be movable between the fixing plates. Apparatus described in section.
(4)上記基板の上端あるいは下端と上記分離手段との
間隔aと上記基板保持部内で相対向する基板間の距離b
とが a<2b の関係を満たすことを特徴とする特許請求の範囲第1項
ないし第3項のうちいずれか1項記載の装置。
(4) Distance a between the upper end or lower end of the substrate and the separation means, and distance b between the substrates facing each other within the substrate holder.
The device according to any one of claims 1 to 3, characterized in that and satisfies the relationship a<2b.
JP13492686A 1986-06-12 1986-06-12 Liquid epitaxy device Granted JPS62292693A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13492686A JPS62292693A (en) 1986-06-12 1986-06-12 Liquid epitaxy device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13492686A JPS62292693A (en) 1986-06-12 1986-06-12 Liquid epitaxy device

Publications (2)

Publication Number Publication Date
JPS62292693A true JPS62292693A (en) 1987-12-19
JPH0419196B2 JPH0419196B2 (en) 1992-03-30

Family

ID=15139772

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13492686A Granted JPS62292693A (en) 1986-06-12 1986-06-12 Liquid epitaxy device

Country Status (1)

Country Link
JP (1) JPS62292693A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010180085A (en) * 2009-02-04 2010-08-19 Ihi Corp Substrate holder

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4843425A (en) * 1971-10-05 1973-06-23
JPS57180760U (en) * 1981-05-13 1982-11-16

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4843425A (en) * 1971-10-05 1973-06-23
JPS57180760U (en) * 1981-05-13 1982-11-16

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010180085A (en) * 2009-02-04 2010-08-19 Ihi Corp Substrate holder

Also Published As

Publication number Publication date
JPH0419196B2 (en) 1992-03-30

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