JPS6227742B2 - - Google Patents

Info

Publication number
JPS6227742B2
JPS6227742B2 JP57064412A JP6441282A JPS6227742B2 JP S6227742 B2 JPS6227742 B2 JP S6227742B2 JP 57064412 A JP57064412 A JP 57064412A JP 6441282 A JP6441282 A JP 6441282A JP S6227742 B2 JPS6227742 B2 JP S6227742B2
Authority
JP
Japan
Prior art keywords
semiconductor device
thin film
ferromagnetic thin
hot spot
brightness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57064412A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58180037A (ja
Inventor
Masakazu Nakabayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP6441282A priority Critical patent/JPS58180037A/ja
Publication of JPS58180037A publication Critical patent/JPS58180037A/ja
Publication of JPS6227742B2 publication Critical patent/JPS6227742B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Magnetic Variables (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Thin Magnetic Films (AREA)
JP6441282A 1982-04-15 1982-04-15 半導体装置のホツトスポツト観察装置 Granted JPS58180037A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6441282A JPS58180037A (ja) 1982-04-15 1982-04-15 半導体装置のホツトスポツト観察装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6441282A JPS58180037A (ja) 1982-04-15 1982-04-15 半導体装置のホツトスポツト観察装置

Publications (2)

Publication Number Publication Date
JPS58180037A JPS58180037A (ja) 1983-10-21
JPS6227742B2 true JPS6227742B2 (enrdf_load_stackoverflow) 1987-06-16

Family

ID=13257550

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6441282A Granted JPS58180037A (ja) 1982-04-15 1982-04-15 半導体装置のホツトスポツト観察装置

Country Status (1)

Country Link
JP (1) JPS58180037A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2328749B1 (en) 2008-08-18 2019-09-25 Productive Research LLC. Formable light weight composites
JP5911019B2 (ja) 2009-12-28 2016-04-27 プロダクティブ リサーチ エルエルシー． 複合材料を溶接するプロセス及び該プロセス由来の物品
JP5849054B2 (ja) 2010-02-15 2016-01-27 プロダクティブ リサーチ エルエルシー． 成形可能な軽量複合材料系および方法
US9233526B2 (en) 2012-08-03 2016-01-12 Productive Research Llc Composites having improved interlayer adhesion and methods thereof

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5938530B2 (ja) * 1975-07-18 1984-09-18 東北金属工業 （株） 非接触温度検出用感温磁性体
JPS53111776A (en) * 1977-03-11 1978-09-29 Tohoku Metal Ind Ltd Surface temperature detector

Also Published As

Publication number Publication date
JPS58180037A (ja) 1983-10-21

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