JPS6224937B2 - - Google Patents

Info

Publication number
JPS6224937B2
JPS6224937B2 JP56175204A JP17520481A JPS6224937B2 JP S6224937 B2 JPS6224937 B2 JP S6224937B2 JP 56175204 A JP56175204 A JP 56175204A JP 17520481 A JP17520481 A JP 17520481A JP S6224937 B2 JPS6224937 B2 JP S6224937B2
Authority
JP
Japan
Prior art keywords
heat treatment
baskets
basket
furnace
insertion stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56175204A
Other languages
Japanese (ja)
Other versions
JPS5875840A (en
Inventor
Haruo Shimoda
Yasuo Uoochi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17520481A priority Critical patent/JPS5875840A/en
Publication of JPS5875840A publication Critical patent/JPS5875840A/en
Publication of JPS6224937B2 publication Critical patent/JPS6224937B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)

Description

【発明の詳細な説明】 (1) 発明の技術分野 本発明は半導体製造時に、半導体ウエハーの表
面酸化、アニール、不純物拡散などに用いられる
加熱処理炉に関する。
DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a heat treatment furnace used for surface oxidation, annealing, impurity diffusion, etc. of semiconductor wafers during semiconductor manufacturing.

(2) 従来技術と問題点 従来より使用されている加熱処理炉は、その殆
んどは横型炉に定型化されており、被処理用の半
導体ウエハーを多数石英製ボートに収納しそのボ
ートを手動操作により加熱された石英管内に装入
して処理されている。第1図にその一例として、
高温酸化処理炉の概略断面構造を示しており、1
は半導体ウエハー、2は石英ボート、3は石英
管、4は石英キヤツプ、5は挿入棒、6は加熱体
で、加湿酸素ガスを石英管の流入口7より流入
し、石英ボート2に垂直に立てて保持された半導
体ウエハー1のシリコン(Si)面に二酸化シリコ
ン(SiO2)を生成する。この場合、石英ボートの
装入あるいは引き出しは手動で行なわれており、
この操作を自動化することは著しく困難な構造で
ある。たとえば石英ボートが引出棒付きのパドル
(台車)に搭載する構造とし、炉内での処理時間
を定め、自動装入あるいは引出し機構を設けても
(この機構は公知である。)石英ボートをパドル上
にのせるのは手動に頼らざるをえない。それは石
英は壊れやすく、半導体ウエハーも脆いため取扱
いは充分に注意深く行なわなければならず、立体
空間をロボツトなどで運行すると、破壊する確率
が高いからである。
(2) Conventional technology and problems Most of the heat treatment furnaces that have been used in the past have been standardized as horizontal furnaces, in which a large number of semiconductor wafers to be processed are stored in a quartz boat and the boat is It is processed by charging it into a heated quartz tube by manual operation. As an example, Figure 1 shows
A schematic cross-sectional structure of a high-temperature oxidation treatment furnace is shown.
is a semiconductor wafer, 2 is a quartz boat, 3 is a quartz tube, 4 is a quartz cap, 5 is an insertion rod, and 6 is a heating element, humidified oxygen gas is introduced from the inlet 7 of the quartz tube, and is perpendicular to the quartz boat 2. Silicon dioxide (SiO 2 ) is generated on the silicon (Si) surface of the semiconductor wafer 1 held upright. In this case, loading or unloading of the quartz boat is done manually.
It is a construction that is extremely difficult to automate this operation. For example, if the quartz boat is mounted on a paddle (truck) with a pull-out rod, the processing time in the furnace is determined, and an automatic charging or pull-out mechanism is provided (this mechanism is publicly known), the quartz boat can be mounted on a paddle (carriage) with a pull-out rod. I have to rely on manual work to put it on top. This is because quartz is fragile and semiconductor wafers are also fragile, so they must be handled with great care, and if a robot moves in three-dimensional space, there is a high probability of breakage.

しかしながら、半導体製造は組立工程を始めと
して、化学処理工程においても、殆んど無人化さ
れて自動的に製造される工程が多くなつてきた。
かような無人化は半導体材料にゴミや塵の付着を
減少せるために極めて効果があり、品質向上にも
大きく貢献する利点があるものでもある。
However, in semiconductor manufacturing, not only the assembly process but also the chemical processing process, many of the processes are now automated and automated.
Such unmanned operation is extremely effective in reducing the adhesion of dirt and dust to semiconductor materials, and also has the advantage of greatly contributing to quality improvement.

(3) 発明の目的 したがつて本発明は最も自動化の至難な加熱処
理工程を無人化して、自動的に行なうことを目的
としており、その加熱処理炉を提案するものであ
る。
(3) Purpose of the invention Therefore, the purpose of the present invention is to automate the heat treatment process, which is the most difficult to automate, and to propose a heat treatment furnace.

(4) 発明の構成 本発明の特徴は複数の半導体ウエハーを水平に
積み重ねたバスケツトを、収納し加熱するための
縦型加熱炉と加熱処理前および加熱処理後の複数
のバスケツトを保管しておくための複数の回転型
保管室と、前記バスケツトを設置し、加熱炉内に
出し入れする挿入ステージとよりなり、前記複数
のバスケツトを前記挿入ステージと複数の回転型
保管室の間で回転させながら自動的に搬送する運
搬機構を併設した加熱処理炉である。
(4) Structure of the Invention The features of the present invention include a vertical heating furnace for storing and heating baskets in which a plurality of semiconductor wafers are stacked horizontally, and a plurality of baskets for storing the baskets before and after the heat treatment. and an insertion stage for placing the baskets in and out of the heating furnace. This is a heat treatment furnace that is equipped with a transport mechanism for transporting materials.

(5) 発明の実施例 第2図は本発明にかゝる一実施例の断面構造図
で、第3図は第2図のAA′断面を示している。1
0が縦型加熱炉で、石英管11は直径2000mmφ、
炉の長さは1m程度と短かく、しかも充分に均熱
長がえられる。加熱体12は3ブロツクに分け
て、それぞれが温度制御されており、流入ガスは
石英管11上部の流入口13から供給される。
(5) Embodiment of the Invention FIG. 2 is a cross-sectional structural diagram of an embodiment of the present invention, and FIG. 3 shows a cross section AA' in FIG. 2. 1
0 is a vertical heating furnace, and the quartz tube 11 has a diameter of 2000 mmφ.
The length of the furnace is short, about 1 m, and it provides sufficient soaking length. The heating body 12 is divided into three blocks, each of which is temperature controlled, and the inflow gas is supplied from the inlet 13 at the top of the quartz tube 11.

このような縦型加熱炉では半導体ウエハーを保
持する容器をボート形式ではなくて、バスケツト
形式とする。第4図にその構造を示しており、図
は半導体ウエハー1を積層した側面図である。バ
スケツト20全体は石英製で脚付き円形台21上
に3つのスタツド22を立てた形状で、リング2
3を多数用いて、半導体ウエハー1とリング23
とを交互に積み重ねる。このようなバスケツトは
従来のボートと比べて半導体ウエハーに誘発され
る結晶欠陥を少くできる効果があり、それはボー
トでは半導体ウエハーを立てた状態で、ウエハー
下部数点に重力がかゝるからその支点で結晶欠陥
ができやすいが、バスケツトはリング状に面又は
線で重力をうけウエハー周囲で支えるために応力
が少なくなるためと考えられる。
In such a vertical heating furnace, the container for holding semiconductor wafers is not a boat type but a basket type. The structure is shown in FIG. 4, which is a side view of the stacked semiconductor wafers 1. The entire basket 20 is made of quartz and has a shape with three studs 22 erected on a circular base 21 with legs.
3 to form a semiconductor wafer 1 and a ring 23.
Stack them alternately. Compared to conventional boats, this type of basket has the effect of reducing crystal defects induced in semiconductor wafers, and this is because in a boat, when the semiconductor wafer is upright, gravity is applied to several points at the bottom of the wafer, so the fulcrum is However, this is thought to be because the stress is reduced because the basket is supported around the wafer by gravity on a ring-shaped surface or line.

このバスケツト20を第2図に示すように加熱
炉下部より自動的に挿入し、引き出す方法を用い
る。それには挿入ステージ14が加熱炉10の直
下にあり、挿入ステージ14にバスケツトを載せ
て、防塵ボツクス15の外部よりモータ駆動で上
下動させる。又、挿入ステージの下部には、石英
蓋を具備しており、挿入ステージと同時に上下に
動作する。
As shown in FIG. 2, this basket 20 is automatically inserted from the lower part of the heating furnace and pulled out. In order to do this, an insertion stage 14 is located directly below the heating furnace 10, and a basket is placed on the insertion stage 14 and moved up and down by a motor from outside the dustproof box 15. Furthermore, a quartz lid is provided at the bottom of the insertion stage, and it moves up and down simultaneously with the insertion stage.

挿入ステージ14上への載置あるいは取り除き
は、側方に設けられた運搬機構16を作動させ
る。運搬機構16はフオークを差し出して、バス
ケツト20の円形台21下部に差し込み、持ち上
げて180゜回転する。そうすると、バスケツト2
0が回転形保管室17に至り、次にフオークを下
げてその位置にバスケツト20を置いてフオーク
を引き込める。このような動作によつて自動的に
保管室17と挿入ステージ14との間を連絡する
運搬機構16を用いるものである。
Placing on or removal from the insertion stage 14 is performed by operating a transport mechanism 16 provided on the side. The transport mechanism 16 puts out a fork, inserts it into the lower part of the circular stand 21 of the basket 20, lifts it up, and rotates it 180 degrees. Then, basket 2
0 reaches the rotary storage chamber 17, the fork can then be lowered, the basket 20 placed in that position and the fork retracted. The transport mechanism 16 is used to automatically communicate between the storage chamber 17 and the insertion stage 14 through such an operation.

これに連動して、回転形保管室17が回転し、
順次に加熱処理が自動的に行われ、全体の運行を
コンピユータ制御する。即ち、1つのバスケツト
の処理が完了した後、(1)保管室17が回転する、
(2)運搬機構が動作する、(3)挿入ステージが上に動
く、(4)加熱処理する、(5)挿入ステージが下に動
く、(6)運搬機構が動作する、各動作がコンピユー
タによつて指示されて自動的に制御され、しかも
バスケツトは絶えず防塵ボツクス中にあり、汚染
されることがない。
In conjunction with this, the rotary storage chamber 17 rotates,
Heat treatment is performed automatically in sequence, and the entire operation is controlled by a computer. That is, after the processing of one basket is completed, (1) the storage chamber 17 rotates;
(2) The transport mechanism operates, (3) the insertion stage moves up, (4) heat treatment, (5) the insertion stage moves down, (6) the transport mechanism operates, and each operation is controlled by a computer. Therefore, the control is automatic and directed, and the basket is always in a dust-proof box and does not become contaminated.

上記、実施例図は、保管室17が4区画しかな
いが、これを増加すれば、10時間位は自動的に運
営される。例えば、簡単な表面酸化工程で説明す
ると、流入ガスは加湿した酸素ガスで、加熱温度
は1000〜1100℃炉内に保持する時間は50分前後と
なる。加熱炉の温度は同様にコンピユータ制御さ
れて昇降し、バスケツトの挿入および送出と同期
して500℃から1100℃まで昇温し又500℃に降温
し、次いで挿入ステージが下動する。しかしすぐ
に運搬機構を作動させることなく、100〜200℃ま
で自然冷却させるため数分程度放置される。した
がつて1つのバスケツトを処理するためには約1
時間を要し、10個のバスケツトでは1日の操作に
少しも人手がいらないことになる。
In the above example diagram, there are only four storage rooms 17, but if this number is increased, the storage room 17 can be automatically operated for about 10 hours. For example, to describe a simple surface oxidation process, the inflow gas is humidified oxygen gas, the heating temperature is 1000-1100°C, and the time it is kept in the furnace is about 50 minutes. The temperature of the heating furnace is similarly controlled by a computer and is raised and lowered from 500°C to 1100°C and then lowered to 500°C in synchronization with the insertion and delivery of the baskets, and then the insertion stage is moved down. However, without immediately activating the transport mechanism, the material is left to cool naturally to 100 to 200 degrees Celsius for several minutes. Therefore, to process one basket, approximately 1
It takes time, and with 10 baskets, you don't need any manpower to operate it in a day.

(6) 発明の効果 以上は一実施例であるが、このようなコンピユ
ータ管理による自動処理は、縦型加熱炉を使用す
ることによつて極めて容易となり、表面酸化処理
の他、化学気相成長工程、不純物原子注入後の熱
処理(アニール)工程などに簡単に利用すること
ができる。したがつて、本発明は加熱処理工程が
自動的に行なわれて、処理工数が削減される効果
がある上に、半導体装置の品質向上にも役立つも
のである。
(6) Effects of the invention Although the above is just one example, automatic processing under computer control becomes extremely easy by using a vertical heating furnace, and in addition to surface oxidation treatment, chemical vapor deposition It can be easily used in the heat treatment (annealing) process after implanting impurity atoms. Therefore, the present invention not only has the effect of reducing the number of processing steps by automatically performing the heat treatment process, but also helps improve the quality of semiconductor devices.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の加熱処理炉の断面図、第2図お
よび第3図は本発明にかゝる加熱処理炉の断面図
第4図はバスケツトの断面図である。 図中、1は半導体ウエハー、2はボート、3,
11は石英管、10は縦型加熱炉、6,12は加
熱体、7,13はガス流入口、14は挿入ステー
ジ、15は防塵ボツクス、16は運搬機構、17
は回転形保管室、20はバスケツトを示す。
FIG. 1 is a sectional view of a conventional heat treatment furnace, FIGS. 2 and 3 are sectional views of a heat treatment furnace according to the present invention, and FIG. 4 is a sectional view of a basket. In the figure, 1 is a semiconductor wafer, 2 is a boat, 3,
11 is a quartz tube, 10 is a vertical heating furnace, 6 and 12 are heating elements, 7 and 13 are gas inlets, 14 is an insertion stage, 15 is a dustproof box, 16 is a transport mechanism, 17
2 indicates a rotating storage room, and 20 indicates a basket.

Claims (1)

【特許請求の範囲】[Claims] 1 複数の半導体ウエハーを水平に積み重ねたバ
スケツトを、収納し加熱するための縦型加熱炉と
加熱処理前および加熱処理後の複数のバスケツト
を保管しておくための複数の回転型保管室と、前
記バスケツトを設置し、加熱炉内に出し入れする
挿入ステージとよりなり、前記複数のバスケツト
を前記挿入ステージと複数の回転型保管室の間で
回転させながら自動的に搬送する運搬機構を併設
したことを特徴とする半導体用加熱処理炉。
1. A vertical heating furnace for storing and heating baskets in which a plurality of semiconductor wafers are stacked horizontally, and a plurality of rotating storage chambers for storing a plurality of baskets before and after heat treatment; A transport mechanism is provided, which comprises an insertion stage for installing the baskets and taking them in and out of the heating furnace, and automatically transports the plurality of baskets while rotating between the insertion stage and the plurality of rotating storage chambers. A heat treatment furnace for semiconductors characterized by:
JP17520481A 1981-10-30 1981-10-30 Heating furnace for semiconductor Granted JPS5875840A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17520481A JPS5875840A (en) 1981-10-30 1981-10-30 Heating furnace for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17520481A JPS5875840A (en) 1981-10-30 1981-10-30 Heating furnace for semiconductor

Publications (2)

Publication Number Publication Date
JPS5875840A JPS5875840A (en) 1983-05-07
JPS6224937B2 true JPS6224937B2 (en) 1987-05-30

Family

ID=15992109

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17520481A Granted JPS5875840A (en) 1981-10-30 1981-10-30 Heating furnace for semiconductor

Country Status (1)

Country Link
JP (1) JPS5875840A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61111524A (en) * 1984-11-06 1986-05-29 Denkoo:Kk Vertical heat-treatment furnace for semiconductor
JPS61191015A (en) * 1985-02-20 1986-08-25 Hitachi Ltd Semiconductor vapor growth and equipment thereof
JPH0447956Y2 (en) * 1985-04-16 1992-11-12
JPS62122123A (en) * 1985-11-21 1987-06-03 Toshiba Corp Vertical type thermal treatment equipment
JPH0294627A (en) * 1988-09-30 1990-04-05 Tel Sagami Ltd Heat treatment
JP2905857B2 (en) * 1989-08-11 1999-06-14 東京エレクトロン株式会社 Vertical processing equipment
JP2004103990A (en) 2002-09-12 2004-04-02 Hitachi Kokusai Electric Inc Semiconductor manufacturing system and method for manufacturing semiconductor device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5265662A (en) * 1975-11-26 1977-05-31 Nippon Denso Co Ltd Method and device for diffusion to semiconductor substrate by high fre quency induction heating
JPS55118631A (en) * 1979-03-07 1980-09-11 Fujitsu Ltd Diffusion furnace for treatment of semiconductor wafer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5265662A (en) * 1975-11-26 1977-05-31 Nippon Denso Co Ltd Method and device for diffusion to semiconductor substrate by high fre quency induction heating
JPS55118631A (en) * 1979-03-07 1980-09-11 Fujitsu Ltd Diffusion furnace for treatment of semiconductor wafer

Also Published As

Publication number Publication date
JPS5875840A (en) 1983-05-07

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