JPS62238636A - Semiconductor-wafer conveying apparatus - Google Patents

Semiconductor-wafer conveying apparatus

Info

Publication number
JPS62238636A
JPS62238636A JP8020386A JP8020386A JPS62238636A JP S62238636 A JPS62238636 A JP S62238636A JP 8020386 A JP8020386 A JP 8020386A JP 8020386 A JP8020386 A JP 8020386A JP S62238636 A JPS62238636 A JP S62238636A
Authority
JP
Japan
Prior art keywords
wafer
carrier
wafer carrier
semiconductor
wax
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8020386A
Other languages
Japanese (ja)
Inventor
Akiyuki Furuya
古屋 明雪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP8020386A priority Critical patent/JPS62238636A/en
Publication of JPS62238636A publication Critical patent/JPS62238636A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent contamination and to prevent damage of a wafer, by using a wafer mouting stage for taking the wafer out of a wafer carrier for conveyance and for accommodating the wafer after treatment. CONSTITUTION:A wafer mounting stage 11 has a diameter, which is smaller than a wafer 100 by several mm and also smaller than an interval between the side walls of a wafer carrier 104. The wafer mounting stage is mounted on a belt 103. When the rotating direction of the wafer mounting stage 11 is reversed, the wafer can be freely returned to the wafer carrier. When wax is applied on the upper surface of the wafer during the rotation of the wafer, the outer edge of the wafer is held with pawls, and the wafer is put on the wafer mounting stage 11. Even if the wax is attached to the outer edge of the wafer, the wafer mounting stage is not contaminated.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) この発明は半導体ウェーへの搬送装置にかかり、特にウ
ェーハキャリヤとこの半導体ウェーハ(以下ウェーハと
略称する)に処理、加工を施す工程間の搬送に適用され
る。
[Detailed Description of the Invention] [Objective of the Invention] (Industrial Application Field) The present invention relates to a device for transferring semiconductor wafers, and in particular, to a wafer carrier and a device for processing and processing semiconductor wafers (hereinafter referred to as wafers). Applicable to transportation between processes.

(従来の技術) 従来、ウェーハを搬送するのに第4図に示すようなベル
トを用いる手段や、シリンダでウェーハキャリヤに水平
に収納されている複数ウェーハの端面を1枚ずつ押し出
し、これを傾斜させた板状通路を滑らせて移動させる手
段(図示省略)などが用いられている。上記第4図に示
す手段は回転軸101に設けられたプーリ102.10
2にウェハの直径よりも小なる間隔に架張された例えば
2本のベルト103.103を有し、このベルト上にウ
ェーハ100を載せ、回転軸101で走行するベルトに
よって搬送されるものである。また、このベルトの例え
ば一端がウェーハキャリヤ104に接続されている場合
には、ウェーハキャリヤの入口までは上記ベルトにより
搬送され、ウェーハキャリヤ内への搬入はウェーハキャ
リヤの下方に設けられた複数の口−ラ105.105・
・・によって順送りされ搬送が達成されるようになって
いる。107は叙上の如く説明されたウェーハ搬送機構
である。なお、106はウェーハキャリヤ104からウ
ェーハを搬出、収納する際にウェーハキャリヤを上下動
させるためのウェーハキャリヤ昇降機構である。これに
より、例えばウェーハを押し出す際のロンドのピストン
運動は一定の位置で施すことができる。
(Prior art) Conventionally, wafers have been conveyed using a belt as shown in Fig. 4, or by using a cylinder to push out the end faces of multiple wafers stored horizontally in a wafer carrier one by one and then tilting the wafers. A means (not shown) is used for sliding the plate-like passageway. The means shown in FIG. 4 is a pulley 102.10 provided on the rotating shaft 101.
For example, the wafer 100 has two belts 103 and 103 stretched across the wafer 2 at an interval smaller than the diameter of the wafer, and the wafer 100 is placed on these belts and transported by the belt running on the rotating shaft 101. . Further, when one end of this belt is connected to the wafer carrier 104, the wafer is transported by the belt to the entrance of the wafer carrier, and the wafer is carried into the wafer carrier through a plurality of ports provided below the wafer carrier. -La 105.105・
Conveyance is accomplished by sequential feeding. 107 is the wafer transport mechanism described above. Note that 106 is a wafer carrier lifting mechanism for moving the wafer carrier up and down when carrying out and storing wafers from the wafer carrier 104. Thereby, for example, when pushing out a wafer, the piston movement of the Rondo can be performed at a fixed position.

(発明が解決しようとする問題点) 上記従来の手段による搬送装置には次にあげる問題点が
ある。
(Problems to be Solved by the Invention) The conveyance device using the above conventional means has the following problems.

まず、第4図に示す走行ベルトによる場合、例えば半導
体の製造工程でウェーハの一方の主面(上面)にワック
スを塗付しておいて、これを次の工程に搬送しワックス
の塗付されてない側の主面(下面)にエツチングを施す
際、ワックスが下面に回り付いたウェーハが1枚でも発
生すると、ベルトがワックスで汚染され、つぎつぎに載
せられるウェーハの裏面にワックスが耐着し、エツチン
グむらを生ずるという重大な問題がある。このワックス
による汚染はさらにローラ105にも波及する上に、ベ
ルトの汚染と同様に検出が困難であり、清浄化も手間が
かかる。また、上記ベルトとローラ間にウェーハが受は
継がれるとき滑り、ワックス汚染が拡がるなどの問題も
ある。
First, in the case of using the running belt shown in Fig. 4, wax is applied to one main surface (top surface) of a wafer in the semiconductor manufacturing process, for example, and then the wax is transferred to the next process where wax is applied. When etching the main surface (bottom surface) on the side that is not exposed, if even one wafer has wax wrapped around the bottom surface, the belt will be contaminated with wax and the wax will not adhere to the back surface of the next wafer. , there is a serious problem of uneven etching. This wax contamination further spreads to the roller 105, and like the belt contamination, it is difficult to detect and cleaning is time consuming. Further, when the wafer is transferred between the belt and the roller, there is a problem that the wafer slips and wax contamination spreads.

次に、複数のウェーハを長い板に載せ、搬送機構によっ
て送る連続搬送手段も考えられる手段であるが、ウェー
ハキャリヤの下部には両側板を結合するための棒状部品
があるため、ウェーハキャリヤのウェーハが充たされた
場合、ウェーハキャリヤを引き上げて下のウェーハキャ
リヤを充填する際の大きな障害になる。
Next, a continuous transport method in which multiple wafers are placed on a long plate and sent by a transport mechanism is also considered, but since there is a rod-shaped part at the bottom of the wafer carrier to connect both side plates, the wafers on the wafer carrier If the wafer carrier becomes full, it becomes a major obstacle to lifting the wafer carrier and filling the wafer carrier below.

この発明は叙上の問題点に鑑み、半導体ウェーハ搬送装
置の改良構造を提供する。
In view of the above-mentioned problems, the present invention provides an improved structure of a semiconductor wafer transfer device.

〔発明の構成〕[Structure of the invention]

(問題点を解決するための手段) この発明にかかる半導体ウェーハ搬送装置は、対の側壁
の対向面に半導体ウェーハの対向端を摺動させて収納す
る水平で複数対の溝を有するウェーハキャリヤを支持し
かつこのウェーハキャリヤを上下の隣接溝間距離ずつ上
昇または下降させるウェーハキャリヤ昇降機構(106
)と、前記ウェーハキャリヤの開放側面からこのウェー
ハキャリヤ内に一端が位置するように配置され往復動道
程を有するウェーハ搬送機構(遅μ)と、前記ウェーハ
搬送機構に載置されウェーハキャリヤの側壁間間隔より
も小なる直径のウェーハ載置台(11)と、前記ウェー
ハ載置台の道程をウェーハ搬送機構上に限定するウェー
ハ載置台ガイド(12)を具備してなるものである。こ
の発明によれば、ウェーハの主面に汚染、損傷等を与え
ることなく処理や加工を達成できる。
(Means for Solving the Problems) A semiconductor wafer transfer device according to the present invention includes a wafer carrier having a plurality of pairs of horizontal grooves for sliding and storing opposing ends of semiconductor wafers on opposing surfaces of paired side walls. A wafer carrier lifting mechanism (106) that supports the wafer carrier and raises or lowers the wafer carrier by the distance between the upper and lower adjacent grooves.
), a wafer transport mechanism (slow μ) disposed such that one end is located within the wafer carrier from the open side of the wafer carrier and having a reciprocating path; It comprises a wafer mounting table (11) having a diameter smaller than the interval, and a wafer mounting table guide (12) that limits the path of the wafer mounting table on the wafer transport mechanism. According to this invention, processing and processing can be accomplished without contaminating or damaging the main surface of the wafer.

(作 用) この発明はウェーハに対しその一方の主面に処理、加工
等を施す際、ウェーハをウェーハキャリヤから搬出し搬
送する道程につき、また搬送したのちウェーハキャリヤ
に収納する道程等に適用でき、ベルト、ローラ等に直接
接触させず、ウェーハ載置台を用いて行なうものである
。このウェーハ載置台はベルト、ローラ等に固着せず、
またウェーハの周縁部(特に下面の周縁部)には非接触
であるため、特に回転塗付のように周縁に液が集まって
生ずる汚染が防止でき、また搬送中の滑りもウェーハ載
置台とベルト、ローラ等の間ですむのでウェーハの損傷
も防止できる。。
(Function) This invention can be applied to the process of carrying the wafer out of the wafer carrier when processing or processing one main surface of the wafer, or to the process of storing the wafer in the wafer carrier after being carried. This is done using a wafer mounting table without direct contact with belts, rollers, etc. This wafer mounting table does not stick to belts, rollers, etc.
In addition, since there is no contact with the peripheral edge of the wafer (particularly the peripheral edge of the bottom surface), it is possible to prevent contamination caused by liquid gathering around the peripheral edge, especially in rotary coating, and to prevent slippage during transportation between the wafer mounting table and the belt. , rollers, etc., so damage to the wafer can also be prevented. .

(実施例) 以下、この発明の一実施例の搬送装置について第1図な
いし第3図を参照して説明する。なお、説明において従
来と変わらない部分については図面に従来と同じ符号を
付けて示し説明を省略する。
(Embodiment) Hereinafter, a conveyance device according to an embodiment of the present invention will be described with reference to FIGS. 1 to 3. In addition, in the description, parts that are the same as in the prior art are indicated by the same reference numerals as in the prior art in the drawings, and the description thereof will be omitted.

第1図aは一実施例の装置を一部切欠し、プーリを省略
した斜視図を示し、その要部を拡大して第1図すに示す
。また、第2図にウェーハ搬送機構の要部を側面図で、
第3図にウェーハ搬送機構を一部断面図で示す。
FIG. 1a shows a partially cutaway perspective view of an embodiment of the apparatus, with the pulley omitted, and the main parts are shown in FIG. 1 on an enlarged scale. In addition, Fig. 2 shows a side view of the main parts of the wafer transport mechanism.
FIG. 3 shows a partially sectional view of the wafer transport mechanism.

各回において、11はウェーハ載置台で、ウェーハより
も数I小さい径でウェーハキャリヤの側壁間間隔よりも
小なる直径に形成されてなり、これがベルト103上に
載置される。このウェーハ載置台は、例えば円板状のア
ルミニウム板にテフロン樹脂のコーティングを施したも
のが好適である。
In each cycle, a wafer mounting table 11 is formed to have a diameter several I smaller than the wafer and smaller than the spacing between the side walls of the wafer carrier, and is placed on the belt 103. This wafer mounting table is preferably made of, for example, a disc-shaped aluminum plate coated with Teflon resin.

次に、12はウェーハ載置台ガイドで上記ウェーハ載置
台11の道程をウェーハ搬送機構107上の所定部に限
定するように、その道程を包囲して設けられたものであ
る。これの構成材質は金属でも合成樹脂でもよい。
Next, reference numeral 12 denotes a wafer mounting table guide, which is provided so as to surround the path of the wafer mounting table 11 so as to limit the path to a predetermined portion on the wafer transport mechanism 107 . The constituent material of this may be metal or synthetic resin.

次に、上記ウェーハ載置台11は回転軸101の回転方
向を逆にすればベルト103の移動方向が逆となり、例
えばウェーハキャリヤへ向かっての搬送をウェーハキャ
リヤから離れる方向の搬送へと切換えが達成される。こ
れにより、ウェーハキャリヤからウェーハを搬出し、ウ
ェーハへの処理、加工が完了すればウェーハをウェーハ
キャリヤへ戻すことが自在である。上記ウェーハに対す
る処理。
Next, in the wafer mounting table 11, if the rotating direction of the rotating shaft 101 is reversed, the moving direction of the belt 103 is reversed, and for example, switching from transporting toward the wafer carrier to transporting away from the wafer carrier is achieved. be done. This makes it possible to unload the wafer from the wafer carrier and return the wafer to the wafer carrier upon completion of processing and processing on the wafer. Processing for the above wafer.

加工の一例として、ウェーハの上面にワックスを回転塗
付する場合、塗付の完了したウェーハの外縁を爪で掴み
、ウェーハ載置台11上に置く。このときウェーハの外
縁にワックスが付着していてもウェーハ載置台11は汚
染されず、また、ウェーハキャリヤへの収納に際し、ベ
ルトからローラへの移転時にスリップを生じても、ウェ
ーハ載置台とベルトないしローラとのスリップのみで、
ウェーハには汚染も損傷も生じない。
As an example of processing, when wax is coated on the upper surface of a wafer by rotation, the outer edge of the coated wafer is grasped with a nail and placed on the wafer mounting table 11. At this time, even if wax adheres to the outer edge of the wafer, the wafer mounting table 11 will not be contaminated, and even if a slip occurs during transfer from the belt to the roller when storing the wafer in the wafer carrier, the wafer mounting table and the belt will not be contaminated. Just a slip with the roller,
No contamination or damage occurs to the wafer.

〔発明の効果〕〔Effect of the invention〕

この発明によれば、ウェーハの搬送においてウェーハの
汚染、損傷等を生じないので、これらの防止対策が不要
であり製造歩留が向上する。また、この発明は実施にあ
たり、装置の特に大規模な改修を必要としない利点もあ
る。
According to the present invention, since wafers are not contaminated or damaged during wafer transport, there is no need to take measures to prevent these, and the manufacturing yield is improved. Furthermore, the present invention has the advantage that it does not require any particularly large-scale modification of the device when put into practice.

【図面の簡単な説明】[Brief explanation of drawings]

第1図aはこの発明の一実施例の半導体ウェーハ搬送装
置の一部を切欠して示す斜視図、第1図すは第1図aの
一部を拡大して示す側面図、第2図はウェーハ搬送機構
の要部を示す側面図、第3図はウェーハ搬送機構の一部
を示す断面図、第4図は従来の半導体ウェーハ搬送装置
を説明するための側面図である。 11      ウェーハ載置台 12      ウェーハ載置台ガイド10θ    
 ウェーハ 106     ウェーへキャリヤ昇降機構里    
ウェーハ搬送機構
FIG. 1a is a partially cutaway perspective view of a semiconductor wafer transfer device according to an embodiment of the present invention, FIG. 1 is an enlarged side view of a portion of FIG. 1a, and FIG. 3 is a sectional view showing a part of the wafer transport mechanism, and FIG. 4 is a side view illustrating a conventional semiconductor wafer transport apparatus. 11 Wafer mounting table 12 Wafer mounting table guide 10θ
Wafer 106 Wafer carrier lifting mechanism
Wafer transport mechanism

Claims (1)

【特許請求の範囲】[Claims] 対の側壁の対向面に半導体ウェーハの対向端を摺動させ
て収納する水平で複数対の溝を有するウェーハキャリヤ
を支持しかつこのウェーハキャリヤを上下の隣接溝間距
離ずつ上昇または下降させるウェーハキャリヤ昇降機構
と、前記ウェーハキャリヤの開放側面からこのウェーハ
キャリヤ内に一端が位置するように配置され往復動道程
を有するウェーハ搬送機構と、前記ウェーハ搬送機構に
載置されウェーハキャリヤの側壁間間隔よりも小なる直
径のウェーハ載置台と、前記ウェーハ載置台の道程をウ
ェーハ搬送機構上に限定するウェーハ載置台ガイドを具
備した半導体ウェーハ搬送装置。
A wafer carrier that supports a wafer carrier having a plurality of horizontal grooves in which opposing ends of semiconductor wafers are slid and accommodated on opposing surfaces of paired side walls, and that raises or lowers the wafer carrier by the distance between the upper and lower adjacent grooves. a lifting mechanism; a wafer transport mechanism disposed such that one end thereof is located within the wafer carrier from the open side of the wafer carrier and having a reciprocating path; A semiconductor wafer transfer device comprising a wafer placement table with a small diameter and a wafer placement table guide that limits the path of the wafer placement table onto a wafer transfer mechanism.
JP8020386A 1986-04-09 1986-04-09 Semiconductor-wafer conveying apparatus Pending JPS62238636A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8020386A JPS62238636A (en) 1986-04-09 1986-04-09 Semiconductor-wafer conveying apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8020386A JPS62238636A (en) 1986-04-09 1986-04-09 Semiconductor-wafer conveying apparatus

Publications (1)

Publication Number Publication Date
JPS62238636A true JPS62238636A (en) 1987-10-19

Family

ID=13711824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8020386A Pending JPS62238636A (en) 1986-04-09 1986-04-09 Semiconductor-wafer conveying apparatus

Country Status (1)

Country Link
JP (1) JPS62238636A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013016795A (en) * 2011-07-04 2013-01-24 Siltronic Ag Device and method for temporarily storing wafer-type workpiece

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013016795A (en) * 2011-07-04 2013-01-24 Siltronic Ag Device and method for temporarily storing wafer-type workpiece
US9199791B2 (en) 2011-07-04 2015-12-01 Siltronic Ag Device and method for buffer-storing a multiplicity of wafer-type workpieces

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