JPS62222632A - Vertical type vapor growth equipment - Google Patents
Vertical type vapor growth equipmentInfo
- Publication number
- JPS62222632A JPS62222632A JP6650286A JP6650286A JPS62222632A JP S62222632 A JPS62222632 A JP S62222632A JP 6650286 A JP6650286 A JP 6650286A JP 6650286 A JP6650286 A JP 6650286A JP S62222632 A JPS62222632 A JP S62222632A
- Authority
- JP
- Japan
- Prior art keywords
- quartz
- reaction tube
- boat
- quartz boat
- upper hatch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010453 quartz Substances 0.000 claims abstract description 48
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 48
- 238000006243 chemical reaction Methods 0.000 claims abstract description 31
- 239000004065 semiconductor Substances 0.000 claims abstract description 18
- 238000001947 vapour-phase growth Methods 0.000 claims description 9
- 239000000376 reactant Substances 0.000 claims description 3
- 238000006467 substitution reaction Methods 0.000 claims description 3
- 235000012431 wafers Nutrition 0.000 abstract description 11
- 239000000428 dust Substances 0.000 abstract description 5
- 239000007789 gas Substances 0.000 description 5
- 239000011261 inert gas Substances 0.000 description 5
- 239000012495 reaction gas Substances 0.000 description 5
- 241000257465 Echinoidea Species 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000011010 flushing procedure Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体ウェハの気相成長装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a vapor phase growth apparatus for semiconductor wafers.
第2図は、従来の気相成長装置の一例ケ示し環状の縦型
ヒータ1とその内部に着脱自在に取り付けられた石英反
応管2内に8いて上下昇降機械の付いた上部ハツチ4に
支持されながら回転可能な石英ボート6に載置されて抵
抗ヒータ1より加熱された半導体ウニ/S7へ反応ガス
供給管8より供給された反応ガスを気相成長せしめ反応
後のガスン排気管9より排気さぜるようにした構造とな
っていた。FIG. 2 shows an example of a conventional vapor phase growth apparatus, which includes an annular vertical heater 1, a quartz reaction tube 2 removably attached to the inside of the heater 1, and an upper hatch 4 equipped with a vertical lifting machine. The reaction gas supplied from the reaction gas supply pipe 8 is placed on a rotatable quartz boat 6 and heated by the resistance heater 1 for vapor phase growth on the semiconductor sea urchin/S7, which is heated by the resistance heater 1. After the reaction, the gas is exhausted from the gas exhaust pipe 9. The structure was designed to stir.
上述した従来の気相成長装置は、半導体ウェハ11”k
載置した石英ボートを石英反応管内の定位置にローディ
ング・アンローディングする際、空気が石英反応管内に
巻き込むの?防止するため。The conventional vapor phase growth apparatus described above is capable of handling a semiconductor wafer 11"k.
When loading and unloading the mounted quartz boat into a fixed position inside the quartz reaction tube, does air get drawn into the quartz reaction tube? To prevent.
石英反応管の上部ないし下部から多量の不活性ガスを流
す等の各種の対策がとられてきたが、上部ハツチ開によ
り多少の空気を石英反応管内に巻き込んでしまうのが現
状である。その績呆抵抗ヒータより加熱された石英反応
管内の高温の雰囲気中で半導体ウェハと空気中の1!1
2素が共存することになり、所望の薄膜を堆積する前に
半導体ウニへ表直が酸化されてしまい、また多量の不活
性ガス?流すことにより石英反応管内のゴミV舞いとげ
てしまい半導体ウニへ表面に付着してしまうので。Various measures have been taken, such as flowing a large amount of inert gas from the top or bottom of the quartz reaction tube, but the current situation is that some air is drawn into the quartz reaction tube by opening the top hatch. A semiconductor wafer and 1!1 in the air are heated in a high temperature atmosphere inside a quartz reaction tube heated by a resistance heater.
As two elements coexist, the surface of the semiconductor surface is oxidized before the desired thin film is deposited, and a large amount of inert gas is required. By flushing, the dust inside the quartz reaction tube will fly up and stick to the surface of the semiconductor urchin.
その後の半導体デバイス特性に悪影##を及ぼしてしま
う。This will have an adverse effect on the subsequent semiconductor device characteristics.
本発明の縦型気相成長装置は、環状の11製抵抗ヒータ
とその内部に着脱自在に取り付けられた石英反応管、N
2(不活性ガス)置換、前開き可能な立替室とその内部
に取り付り°られた上下昇降機構の付いた上部ハツチ、
上部ハツチに支持されながら回転可能な石英ボート、石
英反応管内に反応ガスを供給する反応ガス供給管1反石
抜のガス?排気する排気管?有している。The vertical vapor phase growth apparatus of the present invention includes an annular resistance heater made of 11, a quartz reaction tube detachably attached to the inside thereof, and a N11 resistance heater.
2 (inert gas) substitution, a front-openable transfer room and an upper hatch with a vertical elevating mechanism installed inside it;
A quartz boat that can be rotated while being supported by the upper hatch, a reaction gas supply pipe that supplies reaction gas into the quartz reaction tube, and 1. Gas from the quartz boat that is removed from the stone? Exhaust pipe to exhaust? have.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の一実施例の縦断面図である。FIG. 1 is a longitudinal sectional view of an embodiment of the present invention.
環状の縦型抵抗ヒータ1とその内部に着脱、自在に取り
付けられた石英反応管2内に8いて上下昇降機構3の付
いた上部ハツチ4に支持されなからモータ5により回転
可能な石英ボート6に載置されて抵抗ヒータ19加熱さ
れた半導体ウェハ7へ反応ガス供給管8工9供給された
反応ガスを気相成長せしめ反応後のガスを排気管9エリ
排気させるようにした構造で、上部ハツチ4の昇降機構
3により半導体ウェハ7を載置した石英ボート6!石英
ボート6を石英反応管2内定位置にローディング−アン
ロープインクする際には、N2置換・前開き可能な立替
室10にニジ、石英ボート6が石英反応管2外に位置す
る時、空気と石英ボート6の接触ないし上部ハツチ4開
による石英反応管2内への空気の巻き込みt防止する。A quartz boat 6 is installed in an annular vertical resistance heater 1 and a quartz reaction tube 2 detachably attached therein, supported by an upper hatch 4 with a vertical lifting mechanism 3 and rotatable by a motor 5. The structure is such that the reactant gas supplied to the semiconductor wafer 7 placed on the substrate and heated by the resistance heater 19 is subjected to vapor phase growth, and the gas after the reaction is exhausted through the exhaust pipe 9. A quartz boat 6 on which a semiconductor wafer 7 is placed by the elevating mechanism 3 of the hatch 4! When loading and unropping the quartz boat 6 to the predetermined position of the quartz reaction tube 2, the quartz boat 6 is placed in the stand-up chamber 10 that can be replaced with N2 and opened forward, and when the quartz boat 6 is located outside the quartz reaction tube 2, it is filled with air. This prevents air from being drawn into the quartz reaction tube 2 due to contact with the quartz boat 6 or opening of the upper hatch 4.
以上説明したように本発明はN2 (不活性ガス)置換
、前開き可能な石英呈を設けて半導体ウニへ乞載置した
石英ボートY石英反応管内定位置にローディング・アン
ローディングする際には、あらかじめ立替室内の空気を
追い出してNz置換してから行い1石英ボートが石英反
応管外に位置する時の空気と石英ボートの接触ないし上
部ハツチ開にLる石英反応管内への空気を防止すること
により、抵抗ヒータより加熱された石英反応管内の高温
の雰囲気中で半導体ウェハと空気中の酸素が共存しない
ので半導体クエへ表面が酸化されずまた多量の不活性ガ
スを流す必要がなくなるので石英反応管内のゴミの舞い
上がりが少なくなり半導体ウェハへのゴミの付着が低減
できる。その結果所望する良質の薄膜を堆積することが
できまた良好なデバイス%性を得る効果がある。As explained above, the present invention provides N2 (inert gas) substitution, a quartz tube that can be opened from the front, and a quartz boat placed on a semiconductor urchin when loading and unloading into a fixed position in a Y quartz reaction tube. To prevent air from coming into contact with the quartz boat when the quartz boat is located outside the quartz reaction tube, or air from entering the quartz reaction tube when the top hatch is opened, by expelling the air in the storage room and replacing it with Nz in advance. Because the semiconductor wafer and oxygen in the air do not coexist in the high-temperature atmosphere inside the quartz reaction tube heated by a resistance heater, the surface of the semiconductor wafer is not oxidized, and there is no need to flow a large amount of inert gas, so the quartz reaction can proceed. This reduces the amount of dust flying up inside the pipe and reduces the amount of dust adhering to semiconductor wafers. As a result, a thin film of desired quality can be deposited, and good device performance can be obtained.
第1図は本発明の縦型気相成長装置の縦断面図、第2図
は従来の縦型気相成長装置の断面図である。
1・・・・・・抵抗ヒータ、2・・・・・・石英反応管
、3・・・・・・上下昇降機構、4・・・・・・上部ハ
ツチ、5・・・・・・モータ、6・・・・・・石英ボー
ト、7・・・・・・半導体ウェハ、8・・・・・・反応
ガス供給管、9・・・・・・排気管、10・・・・・・
立替皇。
第 21!IFIG. 1 is a longitudinal sectional view of a vertical vapor phase growth apparatus of the present invention, and FIG. 2 is a sectional view of a conventional vertical vapor growth apparatus. 1... Resistance heater, 2... Quartz reaction tube, 3... Vertical lifting mechanism, 4... Upper hatch, 5... Motor , 6... Quartz boat, 7... Semiconductor wafer, 8... Reaction gas supply pipe, 9... Exhaust pipe, 10...
Replacement emperor. 21st! I
Claims (1)
られた石英反応管と、その内部において、上下昇降機構
の付いた上部ハッチに支持されながら回転可能な石英ボ
ートに載置されて抵抗ヒータより加熱された半導体ウェ
ハへ反応ガス供給管より供給された反応ガスを気相成長
せしめ反応後のガスを排気管より排気させるようにした
ものにおいて、上部ハッチの昇降機構により半導体ウェ
ハを載置した石英ボートを石英反応管内定位置にローデ
ィング・アンローディングする際、石英ボートが石英反
応管外に位置する時、空気と石英ボートの接触ないし上
部ハッチ開閉による石英反応管内への空気の巻き込みを
防止するN_2置換、前開き可能な立替室を有すること
を特徴とする縦型気相成長装置。A circular vertical resistance heater, a quartz reaction tube removably attached inside it, and a resistance heater mounted on a rotatable quartz boat supported by an upper hatch with an up-and-down mechanism inside. In this device, a reactant gas supplied from a reactant gas supply pipe is applied to a heated semiconductor wafer for vapor phase growth, and the gas after the reaction is exhausted from an exhaust pipe, and the semiconductor wafer is placed by the lifting mechanism of the upper hatch. When loading and unloading the quartz boat into the quartz reaction tube, when the quartz boat is located outside the quartz reaction tube, prevent air from coming into contact with the quartz boat or from being drawn into the quartz reaction tube by opening and closing the upper hatch. A vertical vapor phase growth apparatus characterized by N_2 substitution and having a stand-up chamber that can be opened from the front.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6650286A JPS62222632A (en) | 1986-03-24 | 1986-03-24 | Vertical type vapor growth equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6650286A JPS62222632A (en) | 1986-03-24 | 1986-03-24 | Vertical type vapor growth equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62222632A true JPS62222632A (en) | 1987-09-30 |
Family
ID=13317666
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6650286A Pending JPS62222632A (en) | 1986-03-24 | 1986-03-24 | Vertical type vapor growth equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62222632A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0372649A (en) * | 1989-08-11 | 1991-03-27 | Tokyo Electron Sagami Ltd | Processing equipment |
-
1986
- 1986-03-24 JP JP6650286A patent/JPS62222632A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0372649A (en) * | 1989-08-11 | 1991-03-27 | Tokyo Electron Sagami Ltd | Processing equipment |
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