JPS6221533U - - Google Patents
Info
- Publication number
- JPS6221533U JPS6221533U JP11333285U JP11333285U JPS6221533U JP S6221533 U JPS6221533 U JP S6221533U JP 11333285 U JP11333285 U JP 11333285U JP 11333285 U JP11333285 U JP 11333285U JP S6221533 U JPS6221533 U JP S6221533U
- Authority
- JP
- Japan
- Prior art keywords
- section
- magazine
- ics
- detection
- unloader
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 8
- 238000005259 measurement Methods 0.000 claims 1
- 230000003028 elevating effect Effects 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11333285U JPS6221533U (enExample) | 1985-07-23 | 1985-07-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11333285U JPS6221533U (enExample) | 1985-07-23 | 1985-07-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6221533U true JPS6221533U (enExample) | 1987-02-09 |
Family
ID=30995038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11333285U Pending JPS6221533U (enExample) | 1985-07-23 | 1985-07-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6221533U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997005496A1 (en) * | 1995-07-28 | 1997-02-13 | Advantest Corporation | Semiconductor device tester and semiconductor device testing system with a plurality of semiconductor device testers |
-
1985
- 1985-07-23 JP JP11333285U patent/JPS6221533U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997005496A1 (en) * | 1995-07-28 | 1997-02-13 | Advantest Corporation | Semiconductor device tester and semiconductor device testing system with a plurality of semiconductor device testers |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6221533U (enExample) | ||
| JPH0747397Y2 (ja) | カード供給装置 | |
| JPS6373233U (enExample) | ||
| JPS63185576U (enExample) | ||
| JPS5827727U (ja) | 重量検出装置 | |
| JPH0187792U (enExample) | ||
| JPH0346431U (enExample) | ||
| JPS6253000U (enExample) | ||
| JPS6146926U (ja) | ストレ−ジ可能なコンベヤ設備 | |
| JPS6429332U (enExample) | ||
| JPS61183503U (enExample) | ||
| JPS58134361U (ja) | エレベ−タのかご位置検出装置 | |
| JPS60183744U (ja) | 給紙装置 | |
| JPH0299375U (enExample) | ||
| JPH0237357U (enExample) | ||
| JPS60184608U (ja) | 粉末加圧成型装置 | |
| JPS61162051U (enExample) | ||
| JPS6265531U (enExample) | ||
| JPH01178671U (enExample) | ||
| JPH01116197U (enExample) | ||
| JPS605543U (ja) | キ−ボ−ドデイスプレイユニツト構造 | |
| JPS5886510U (ja) | 荷役機械におけるパイル面までの距離計測装置 | |
| JPS63133526U (enExample) | ||
| JPS6325311U (enExample) | ||
| JPS603726U (ja) | 位置決め装置 |