JPS6221533U - - Google Patents
Info
- Publication number
- JPS6221533U JPS6221533U JP11333285U JP11333285U JPS6221533U JP S6221533 U JPS6221533 U JP S6221533U JP 11333285 U JP11333285 U JP 11333285U JP 11333285 U JP11333285 U JP 11333285U JP S6221533 U JPS6221533 U JP S6221533U
- Authority
- JP
- Japan
- Prior art keywords
- section
- magazine
- ics
- detection
- unloader
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 8
- 238000005259 measurement Methods 0.000 claims 1
- 230000003028 elevating effect Effects 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11333285U JPS6221533U (de) | 1985-07-23 | 1985-07-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11333285U JPS6221533U (de) | 1985-07-23 | 1985-07-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6221533U true JPS6221533U (de) | 1987-02-09 |
Family
ID=30995038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11333285U Pending JPS6221533U (de) | 1985-07-23 | 1985-07-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6221533U (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997005496A1 (fr) * | 1995-07-28 | 1997-02-13 | Advantest Corporation | Testeur de dispositif a semiconducteur et systeme de test de dispositif a semiconducteur comportant plusieurs testeurs |
-
1985
- 1985-07-23 JP JP11333285U patent/JPS6221533U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997005496A1 (fr) * | 1995-07-28 | 1997-02-13 | Advantest Corporation | Testeur de dispositif a semiconducteur et systeme de test de dispositif a semiconducteur comportant plusieurs testeurs |
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