JPS6221407B2 - - Google Patents

Info

Publication number
JPS6221407B2
JPS6221407B2 JP54066075A JP6607579A JPS6221407B2 JP S6221407 B2 JPS6221407 B2 JP S6221407B2 JP 54066075 A JP54066075 A JP 54066075A JP 6607579 A JP6607579 A JP 6607579A JP S6221407 B2 JPS6221407 B2 JP S6221407B2
Authority
JP
Japan
Prior art keywords
electrode
wave filter
comb
filter element
surface wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54066075A
Other languages
Japanese (ja)
Other versions
JPS55158724A (en
Inventor
Masao Nagarego
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP6607579A priority Critical patent/JPS55158724A/en
Publication of JPS55158724A publication Critical patent/JPS55158724A/en
Publication of JPS6221407B2 publication Critical patent/JPS6221407B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/08Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Description

【発明の詳細な説明】 本発明は表面波フイルター素子に関するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a surface wave filter element.

従来の表面波フイルター素子は第1図及び第2
図に示すような構造を有している。
Conventional surface wave filter elements are shown in Figures 1 and 2.
It has a structure as shown in the figure.

即ちLiTaO3,LiNbO3、セラミツクスなどから
なる圧電基板1の一主面上に導電部材によりそれ
ぞれ形成された互いに噛合つた櫛形の入力電極2
と、この入力電極2に連接されたシールド電極3
と、このシールド電極3を介して、前記入力電極
2に対設され、同じく互いに噛み合つた櫛形の出
力電極4と前記入力電極2の一部及び出力電極4
に沿つて設けられた吸音剤層5からなり、入力電
極2は櫛歯部2a、及びこの櫛歯部2aを連接す
る支持部2bから構成され、また出力電極4も櫛
歯部4a及びこの櫛歯部4aを連接する支持部4
bから構成され、この入力電極2の支持部2bに
印加される所定の周波数を有する信号電圧のみを
出力電極4の支持部4bに圧電基板1の表面波を
利用して有効に伝達するようになつている。
That is, interlocking comb-shaped input electrodes 2 are each formed of a conductive material on one main surface of a piezoelectric substrate 1 made of LiTaO 3 , LiNbO 3 , ceramics, or the like.
and a shield electrode 3 connected to this input electrode 2.
A comb-shaped output electrode 4 and a part of the input electrode 2 and the output electrode 4 are arranged opposite to the input electrode 2 through the shield electrode 3 and are also interlocked with each other.
The input electrode 2 is composed of a comb-teeth portion 2a and a support portion 2b connecting the comb-teeth portion 2a, and the output electrode 4 is also composed of a comb-teeth portion 4a and a support portion 2b that connects the comb-teeth portion 2a. Support part 4 connecting tooth part 4a
b, so that only a signal voltage having a predetermined frequency applied to the support portion 2b of the input electrode 2 is effectively transmitted to the support portion 4b of the output electrode 4 by using the surface waves of the piezoelectric substrate 1. It's summery.

この様な構造からなる表面波フイルター素子は
通常次の様な製造方法によつて作られる。
A surface wave filter element having such a structure is usually manufactured by the following manufacturing method.

即ち先ず圧電部材からなるウエフアにアルミニ
ウム膜などを蒸気などの手段により所望厚に形成
する。次にこのアルミニウム膜上に感光性樹脂膜
を被着し、その上に多数個の表面波フイルター素
子形成用のマスクを密接させる。次にマスクを介
して露光し、前記感光性樹脂膜の所望部を光硬化
させ、未露光部を現像除去する。次にエツチング
を行ない、アルミニウム膜の所望部をエツチング
除去し、最終的な電極寸法を形成する。次にアル
ミニウム膜面、傷などを検査し、吸音剤を塗布し
た後、1個ずつの表面波フイルター素子に分割す
る。最後にこの表面波フイルター素子をステム上
に載置し、ステムピンと電極間をボンデングし、
更にシエルをかぶせて表面波フイルター装置が得
られる。
That is, first, an aluminum film or the like is formed to a desired thickness on a wafer made of a piezoelectric material by means of steam or the like. Next, a photosensitive resin film is deposited on this aluminum film, and a mask for forming a large number of surface wave filter elements is closely placed thereon. Next, the photosensitive resin film is exposed to light through a mask to photocure desired portions of the photosensitive resin film, and the unexposed portions are developed and removed. Next, etching is performed to remove a desired portion of the aluminum film to form the final electrode dimensions. Next, the aluminum film surface is inspected for scratches, etc., a sound absorbing agent is applied, and the aluminum film is divided into individual surface wave filter elements. Finally, place this surface wave filter element on the stem, bond between the stem pin and the electrode,
Further, by covering with a shell, a surface wave filter device is obtained.

前述した諸工程に於て、最も重要な工程は表面
波フイルター素子の周波数特性などを決定する第
2図に示す電極寸法即ち櫛歯部の幅寸法6,7及
び間隔寸法8であり、これらの電極寸法はマスク
に形成された電極形状によりほぼ決定されるが、
アルミニウム膜の厚さ、感光性樹脂膜の厚さ及び
塗布条件、エツチング時間、エツチング液の新
旧、露光時の照度、露光時間などにより変化して
くる。
In the various steps described above, the most important steps are the electrode dimensions shown in FIG. The electrode dimensions are mostly determined by the electrode shape formed on the mask, but
It varies depending on the thickness of the aluminum film, the thickness of the photosensitive resin film, coating conditions, etching time, whether the etching solution is new or old, the illuminance during exposure, the exposure time, etc.

このエツチング工程は、例えばガラスなどに形
成されたマスクの形状により、エツチング時間を
制御して表面波フイルター素子の例えば入力電極
2の間隔寸法8によつて決定しているが、最終段
階に於ては、エツチング工程後の実際の間隔寸法
8を顕微鏡などで測定しているのが現状である。
In this etching process, the etching time is controlled by the shape of a mask formed, for example, on glass, and is determined by the spacing dimension 8 of the input electrodes 2 of the surface acoustic wave filter element. Currently, the actual distance dimension 8 after the etching process is measured using a microscope or the like.

然るに前述したように櫛歯部2aの間隔寸法8
を顕微鏡などで測定すると、この櫛歯部2aなど
にこの顕微鏡のレンズが当接して傷をつけやすい
し、また表面波フイルター素子の品種により間隔
寸法8などの櫛歯部の電極寸法が異なるため、間
隔寸法8などを測定した後に更に品種別のエツチ
ングされた量を算出する工程が必要となる。即ち
エツチング工程に於て、目視の感覚により櫛歯部
2aの電極寸法を決定するとき、品種別にこの電
極寸法が異なるためエツチング作業が極めて困難
である。このことは出力電極4の櫛歯部4aに於
ても同様である。
However, as mentioned above, the interval dimension 8 of the comb tooth portions 2a
When measured with a microscope, etc., the lens of the microscope comes into contact with the comb teeth 2a, etc., and is likely to cause scratches.Also, the electrode dimensions of the comb teeth, such as the interval dimension 8, vary depending on the type of surface wave filter element. , interval dimension 8, etc., it is necessary to further calculate the etched amount for each product type. That is, in the etching process, when determining the electrode size of the comb tooth portion 2a by visual sense, the etching process is extremely difficult because the electrode size differs depending on the product type. This also applies to the comb tooth portion 4a of the output electrode 4.

更にエツチング工程にばらつきがあると、櫛歯
部2a,4aそれぞれ短縮したり、または一部が
切除されたりするため、表面波フイルター素子自
身の周波数特性も変動し、電極容量や挿入損失の
ばらつきが大となり、品質が低下するという欠点
があつた。
Furthermore, if there are variations in the etching process, each of the comb teeth 2a and 4a may be shortened or a portion thereof may be removed, resulting in variations in the frequency characteristics of the surface acoustic wave filter element itself, resulting in variations in electrode capacitance and insertion loss. The problem was that it became larger and the quality deteriorated.

本発明は前述した従来の欠点に鑑みなされたも
のであり、エツチング工程に於ける電極寸法を簡
単に検査することが可能な表面波フイルター素子
を提供することを目的としている。
The present invention has been made in view of the above-mentioned conventional drawbacks, and an object of the present invention is to provide a surface wave filter element that allows easy inspection of electrode dimensions during the etching process.

次に本発明の表面波フイルター素子1の実施例
を第3図乃至第5図によつて説明する。
Next, an embodiment of the surface wave filter element 1 of the present invention will be described with reference to FIGS. 3 to 5.

即ちLiTaO3,LiNbO3、セラミツクスなどから
なる圧電基板11の一主面上に形成され互いに噛
合つた櫛形の入力電極12と、この入力電極12
に連接されたシールド電極13と、このシールド
電極13を介して前記入力電極12に対設され、
同じく互いに噛み合つた櫛形の出力電極14と、
前記入力電極12の一部及び出力電極14に沿つ
て設けられた吸音剤層15からなり、入力電極1
2は櫛歯部12a及びこの櫛歯部12aを連接す
る支持部12bから形成され、また出力電極14
は櫛歯部14a及びこの櫛歯部14aを連接する
支持部14bから形成され、この入力電極12の
支持部12bに印加される所定の周波数を有する
信号電圧のみを出力電極14の支持部14bに圧
電基板11の表面波を利用して有効に伝達するよ
うになつているものは従来のものとほぼ同様であ
るが、本実施例に於ては、支持部12bのA部及
びB部にそれぞれ第4図及び第5図に示す櫛歯部
12aの幅寸法16,17、間隔寸法18を検出
する櫛歯部の電極寸法検出用開口パターン19及
びまたは品名などの記号検出用開口パターン20
が配設されていることを特徴としている。
That is, a comb-shaped input electrode 12 formed on one main surface of a piezoelectric substrate 11 made of LiTaO 3 , LiNbO 3 , ceramics, etc. and interlocked with each other;
a shield electrode 13 connected to the input electrode 12, and a shield electrode 13 connected to the input electrode 12,
comb-shaped output electrodes 14 that also interlock with each other;
Consisting of a sound absorbing material layer 15 provided along a part of the input electrode 12 and the output electrode 14, the input electrode 1
2 is formed from a comb tooth portion 12a and a support portion 12b connecting the comb tooth portion 12a, and an output electrode 14
is formed from a comb-teeth portion 14a and a support portion 14b connecting the comb-teeth portion 14a, and transmits only a signal voltage having a predetermined frequency applied to the support portion 12b of the input electrode 12 to the support portion 14b of the output electrode 14. The parts that effectively transmit using the surface waves of the piezoelectric substrate 11 are almost the same as the conventional ones, but in this embodiment, the parts A and B of the support part 12b are provided with An aperture pattern 19 for detecting the electrode dimensions of the comb-teeth portion for detecting the width dimensions 16, 17 and interval dimensions 18 of the comb-teeth portion 12a shown in FIGS. 4 and 5 and/or an aperture pattern 20 for detecting symbols such as product names.
It is characterized by being provided with.

次に第4図によりパターン19を説明する。 Next, pattern 19 will be explained with reference to FIG.

即ちパターン19は4個の開口部19a,19
b,19c,19d間に電極寸法、例えば幅寸法
16,17及び間隔寸法18のうち、間隔寸法1
8を最適エツチングした時になくなる幅を有する
ブリツヂ19エツチング過度の時になくなる幅
を有するブリツヂ19エツチング不足の時に残
る幅を有するブリツヂ19と、それぞれ幅の異
なるブリツヂを設け、前述したような製造工程に
於けるエツチング量をこのブリツヂ19,19
,19を目視することにより簡単に判別する
ことが可能である。第5図の21Sは表面波フイ
ルター素子の品種を示す記号検出用開口パターン
20であり、このパターン20を目視することに
より、この品種に適した櫛歯部12aの幅寸法1
6,17間隔寸法18を求めることが出来る。
That is, the pattern 19 has four openings 19a, 19
Between the electrode dimensions b, 19c, and 19d, for example, the interval dimension 1 among the width dimensions 16 and 17 and the interval dimension 18.
A bridge 19 having a width that disappears when etching is performed to the optimum level 1 A bridge 19 having a width that disappears when etching is excessive 2 A bridge 19 having a width that remains when etching is insufficient The amount of etching in the process is
2 , 19 3 can be easily distinguished by visually observing. Reference numeral 21S in FIG. 5 is an aperture pattern 20 for symbol detection indicating the type of surface wave filter element, and by visually observing this pattern 20, the width dimension 1 of the comb tooth portion 12a suitable for this type
6,17 interval dimension 18 can be determined.

更にパターン19、品名などのパターン20そ
の他の開口部を多数設けることにより、周波数特
性に左右されることなく、入力電極12及びまた
は出力電極14の電極容量、インピーダンス、電
極抵抗などを制御することが可能となる。
Further, by providing a pattern 19, a pattern 20 such as the product name, and a large number of other openings, it is possible to control the electrode capacitance, impedance, electrode resistance, etc. of the input electrode 12 and/or the output electrode 14 without being affected by the frequency characteristics. It becomes possible.

前記実施例に於ては第4図に示すパターン19
と第5図に示すパターン20の両者を設けたが、
これらの一方を形成してもよい。またバターン1
9は第4図に示すもののほか円、三角、その他の
形状が考えられるし、また品名などのパターン2
0も第5図に示すものに限定されるものではな
い。
In the above embodiment, the pattern 19 shown in FIG.
Both the pattern 20 shown in FIG. 5 and the pattern 20 shown in FIG.
Either one of these may be formed. Also Bataan 1
In addition to the shape shown in Fig. 4, 9 may be a circle, triangle, or other shapes, and may also be a pattern 2 such as the product name.
0 is also not limited to what is shown in FIG.

前述のように本発明の表面波フイルター素子に
よれば圧電基板上に導電部材で入力電極や出力電
極を形成するエツチング工程でそれぞれの品種に
最適なエツチングを行なうことが出来るので、所
定の周波数特性を保持することが可能となり、そ
の工業的価値は極めて大である。
As mentioned above, according to the surface wave filter element of the present invention, it is possible to perform the optimum etching for each product type in the etching process of forming input electrodes and output electrodes using a conductive member on a piezoelectric substrate, so that predetermined frequency characteristics can be achieved. This makes it possible to retain the following properties, and its industrial value is extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の表面波フイルター素子の平面
図、第2図は第1図の1部拡大平面図、第3図は
本発明の表面波フイルター素子の平面図、第4図
は第3図のA部拡大図、第5図は第3図のB部拡
大図である。 1,11…圧電基板、2,12…入力電極、2
a,12a,4a,14a…櫛歯部、2b,12
b,4b,14b…支持部、19…電極寸法検出
用開口パターン、20…記号検出用開口パター
ン。
FIG. 1 is a plan view of a conventional surface wave filter element, FIG. 2 is a partially enlarged plan view of FIG. 1, FIG. 3 is a plan view of a surface wave filter element of the present invention, and FIG. 5 is an enlarged view of part A in FIG. 3, and FIG. 5 is an enlarged view of part B in FIG. 1, 11... Piezoelectric substrate, 2, 12... Input electrode, 2
a, 12a, 4a, 14a...comb tooth portion, 2b, 12
b, 4b, 14b...Support part, 19...Aperture pattern for electrode size detection, 20...Aperture pattern for symbol detection.

Claims (1)

【特許請求の範囲】[Claims] 1 圧電基板の一主面上に被着形成された入力電
極と出力電極とがそれぞれ噛合つた櫛歯部及びこ
の櫛歯部を連接する支持部から構成されてなる表
面波フイルター素子に於て、前記支持部に記号検
出用開口パターンと前記櫛歯部の電極寸法検出用
開口パターンとの少くとも一方が配設されてなる
ことを特徴とする表面波フイルター素子。
1. In a surface wave filter element comprising a comb tooth portion in which an input electrode and an output electrode are respectively engaged with each other and a support portion connecting the comb tooth portion, which are formed on one main surface of a piezoelectric substrate, A surface wave filter element characterized in that at least one of an aperture pattern for symbol detection and an aperture pattern for detecting electrode dimensions of the comb tooth portion is disposed on the support portion.
JP6607579A 1979-05-30 1979-05-30 Surface wave filter element Granted JPS55158724A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6607579A JPS55158724A (en) 1979-05-30 1979-05-30 Surface wave filter element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6607579A JPS55158724A (en) 1979-05-30 1979-05-30 Surface wave filter element

Publications (2)

Publication Number Publication Date
JPS55158724A JPS55158724A (en) 1980-12-10
JPS6221407B2 true JPS6221407B2 (en) 1987-05-12

Family

ID=13305357

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6607579A Granted JPS55158724A (en) 1979-05-30 1979-05-30 Surface wave filter element

Country Status (1)

Country Link
JP (1) JPS55158724A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3234955A1 (en) * 1982-09-21 1984-03-22 Siemens AG, 1000 Berlin und 8000 München SURFACE WAVE FILTER AND METHOD FOR PRODUCING THE SURFACE WAVE FILTER
JPS606340U (en) * 1983-06-24 1985-01-17 株式会社日立製作所 Miniaturized surface acoustic wave device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4834996A (en) * 1971-09-09 1973-05-23

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5740576Y2 (en) * 1978-02-17 1982-09-06

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4834996A (en) * 1971-09-09 1973-05-23

Also Published As

Publication number Publication date
JPS55158724A (en) 1980-12-10

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