JPS62206583A - Production of hologram and phase shift diffraction grating - Google Patents

Production of hologram and phase shift diffraction grating

Info

Publication number
JPS62206583A
JPS62206583A JP4962186A JP4962186A JPS62206583A JP S62206583 A JPS62206583 A JP S62206583A JP 4962186 A JP4962186 A JP 4962186A JP 4962186 A JP4962186 A JP 4962186A JP S62206583 A JPS62206583 A JP S62206583A
Authority
JP
Japan
Prior art keywords
phase shift
light
phase
diffraction grating
hologram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4962186A
Other languages
Japanese (ja)
Other versions
JPH059028B2 (en
Inventor
Yuzo Ono
小野 雄三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP4962186A priority Critical patent/JPS62206583A/en
Publication of JPS62206583A publication Critical patent/JPS62206583A/en
Publication of JPH059028B2 publication Critical patent/JPH059028B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE:To reduce a transition area of a phase shift part with an easy process by irradiating the interference light between a diffraction wave front, which is obtained by projecting obliquely incident parallel rays of light to a phase plate which generates a desired phase shift, and a reference luminous flux to a photosensitive body layer to form a ruggedness due to the interference light on the photosensitive body layer. CONSTITUTION:Obliquely incident parallel rays 2 of light are projected to a phase plate 1 which generates a desired phase shift, and this transmitted light 3 is allowed to interfere with a coherent parallel reference rays 4 of light, and the the interference light is recorded on a photosensitive body layer 5 on a substrate 6. The phase plate 1 is provided with plural phase shift parts by etching a quartz through which light is transmitted. Thus, a phase shift diffraction grating which has small transition areas in phase shift parts and has an optional period is produced with the easy process.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明はホログラムお工び位相シフト回折格子の製造
方法に関し、特にDFB(ディストリビニ−チット・フ
ィード・バック、分布帰還)型半導体レーザの単一軸モ
ード化に用いられる位相シフト回折格子の製造方法に関
するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for manufacturing a holographic phase shift diffraction grating, and particularly to a method for manufacturing a holographic phase shift diffraction grating, and in particular a method for manufacturing a DFB (distributed chit feedback) type semiconductor laser. The present invention relates to a method of manufacturing a phase shift diffraction grating used for uniaxial mode conversion.

〔従来技術〕[Prior art]

半導体レーザの縦モードを単一化することは、光フアイ
バ通信における波長分散による波形歪の防止、安定な高
速変調による超高速伝送、雑音の低減や光応用計測等に
おいて極めて重要な課題である。しかし、ファブリペロ
型共振器を有する半導体レーザでは、縦モード選択性が
十分ではないので共振器に回折格子を内蔵したDFBレ
ーザが開発され友。全体に一様な構造のDFBレーザで
は2つの縦モードが発振するため、回折格子の中央付近
に1/4波長相当の位相シフ)1−付加した回折格子を
用いる方法が採られている。
Unifying the longitudinal mode of a semiconductor laser is an extremely important issue in preventing waveform distortion due to wavelength dispersion in optical fiber communications, ultra-high-speed transmission through stable high-speed modulation, noise reduction, and optical applied measurement. However, semiconductor lasers with Fabry-Perot resonators do not have sufficient longitudinal mode selectivity, so a DFB laser with a built-in diffraction grating in the resonator was developed. Since a DFB laser having a uniform structure as a whole oscillates in two longitudinal modes, a method of using a diffraction grating with a phase shift equivalent to 1/4 wavelength added to the center of the diffraction grating is adopted.

このような位相シフト回折格子の製造方法としては、ポ
ジ、ネガ2種類のレジストを使い分けて、これらの各領
域の位相を反転させることにより、1/4波長相当分の
位相シフトを生じさせる方法がある。
One way to manufacture such a phase shift diffraction grating is to use two types of resist, positive and negative, and invert the phase of each of these regions to generate a phase shift equivalent to a quarter wavelength. be.

また、他の方法として、位相シフトに相当する段差を有
する石英のコンタクトマスクを用いる方法である。前者
についての文献としては、宇高勝之他著の「電子通信学
会技術報告」、OQB 85−11巻、W、69〜算7
6頁に記載の論文「λ/4シフトInGaAsP/1n
P DFBレーザ」があシ、また後者についての文献と
しては、白崎正孝他著の「電子通信学会技術報告J、0
QE85−60巻、1E57〜算64頁に記載の論文「
DFBレーザ用】/4波長シフト回折格子の形成方法の
提案 −位相マスクの考案とその効果−」がある。
Another method is to use a quartz contact mask having a step corresponding to a phase shift. Literature regarding the former includes "Technical Report of the Institute of Electronics and Communication Engineers" by Katsuyuki Udaka et al., OQB Vol. 85-11, W, 69-7.
The article “λ/4 shift InGaAsP/1n” on page 6
``PDFB laser'', and the literature on the latter is ``IEICE Technical Report J, 0'' written by Masataka Shirasaki et al.
The paper written in volume QE85-60, pages 1E57-64 “
[For DFB laser]/Proposal of a method for forming a four-wavelength shift diffraction grating - Invention of a phase mask and its effects -''.

し発明が解決しようとする問題点」 上述の従来技術には、次のような問題点がある。The problem that the invention seeks to solve The above-mentioned conventional technology has the following problems.

:JL1のポジ、ネガ28i類のレジストを便いわける
方法には、レジスト塗布、現像、エツチングともに各3
回という非常に多数のプロセス工程を会費とし、その結
果歩留りが低いという問題点があった。又、第2のコン
タクトマスクを用いる方法には、コンタクトマスクでの
光の回折のために光の位相が変化し、位相シフト部分に
所望の格子が形成されず、いわゆる遷移領域ができてし
まうという問題点かあ夛、ま九回折格子の周期毎に異な
るコンタクトマスクを用意しなければならないという問
題点もあった。
:The method for distinguishing JL1 positive and negative 28i type resists involves three steps each for resist coating, development, and etching.
There was a problem in that a very large number of process steps, ie, 100 times, were required as a membership fee, resulting in low yields. Furthermore, in the method using the second contact mask, the phase of the light changes due to the diffraction of the light in the contact mask, and the desired grating is not formed in the phase shift portion, resulting in the formation of a so-called transition region. Another problem was that a different contact mask had to be prepared for each period of the diffraction grating.

不発−〇目的は、この工うな従来技術の問題点t−解決
し、簡便なプロセス工程で、しかも位相シフト部の遷移
領域が小さくでき、また回折格子の周期た工らず適用で
きるホログラムおよび位相シフト回折格子の製造方法を
提供することにある。
The purpose of this technique is to solve the problems of the conventional technology, to make the transition region of the phase shift part smaller with a simple process, and to create a hologram and phase that can be applied without changing the period of the diffraction grating. An object of the present invention is to provide a method for manufacturing a shifted diffraction grating.

[問題点を解決するための手段〕 $1の発明のホログラムの輿造方法の構成は、所望の位
相シフトを生じさせる位相板を斜入射の平行光で照射し
て得られる回折波面と参照光束との干渉光を感光体層に
照射し、この感光体層上に前記干渉光による凹凸を形成
したことを特徴とする。
[Means for solving the problem] The structure of the hologram construction method of the invention of $1 is that a diffraction wavefront and a reference light beam obtained by irradiating a phase plate that causes a desired phase shift with obliquely incident parallel light are used. The method is characterized in that the photoreceptor layer is irradiated with interference light with the interference light, and irregularities are formed on the photoreceptor layer by the interference light.

藁2の発明の位相シフト回折格子の製造方法の構成は、
所望の位相シフトを生じはせる位相板を斜入射の平行光
で照射して得られる回折波面を、参照光束と干渉させて
ホログラムを製造するwLlの工程と、前記ホログラム
を前記参照光と共役な波面で照射して得られる波面を、
前記位相板の配置されていた面で平行光束と干渉させて
ウェハー上に設けた感光体に照射し、この感光体上に位
相シフト回折格子を形成する算2の工程とを含むことを
特徴とする。
The structure of the method for manufacturing a phase shift diffraction grating according to the second invention is as follows:
A wLl step of manufacturing a hologram by interfering with a reference light beam a diffraction wavefront obtained by irradiating a phase plate that produces a desired phase shift with obliquely incident parallel light, and making the hologram conjugate with the reference light. The wavefront obtained by irradiating with a wavefront,
It is characterized by including the step of 2 in which a photoconductor provided on a wafer is irradiated with a parallel beam of light that interferes with the surface on which the phase plate is disposed, and a phase shift diffraction grating is formed on the photoconductor. do.

〔作用〕[Effect]

本発明の作用・原理は次の通りである。 The operation and principle of the present invention are as follows.

本発明では、回折格子を製作するために2元束干渉無光
法を用い、この2元束のうちの一万の光束が干渉面で位
相シフトした波面になるようなホログラフィの原理を用
いて、このような波面を発生きせることを基本原理とし
ている。ホログラムには波面を凍結し、再生できる特徴
がある。
In the present invention, in order to fabricate a diffraction grating, we use a binary beam interference achromatic method, and use the principle of holography in which 10,000 beams of this binary beam become phase-shifted wavefronts on the interference surface. The basic principle is to generate such a wavefront. Holograms have the ability to freeze wavefronts and reproduce them.

本発明では、まず所望の位相シフトl生じさせる位相板
を平行光で照射して得られる波面を参照波面と干渉させ
てホログラムを形成する。このホログラムに、位相板で
の回折波面を記録しているので、ホログラムを製作した
時の参照波面と共役な照明光でホログラムを裏面から照
射すると、位相板からの波面の逆進波面が再生されるの
で、ホログラム製作時に位相板が置かれていた面上では
位相板透過直後の、すなわち所望の位相シフトした波面
の逆進波面が得られることになる。そこでこの波面と平
行光束とを適当な角度で干渉させれば、位相シフト干渉
縞が得られ、この干渉縞を感光体に記録することに工9
、位相シフト回折格子を形成できる。
In the present invention, a hologram is first formed by irradiating a phase plate that produces a desired phase shift l with parallel light and causing the obtained wavefront to interfere with a reference wavefront. This hologram records the diffracted wavefront from the phase plate, so when the hologram is illuminated from the back side with illumination light that is conjugate to the reference wavefront when the hologram was manufactured, the backward wavefront of the wavefront from the phase plate is reproduced. Therefore, on the surface where the phase plate was placed during the hologram production, a reversed wavefront of a wavefront immediately after passing through the phase plate, that is, a wavefront with a desired phase shift, is obtained. Therefore, by interfering this wavefront with a parallel beam at an appropriate angle, phase-shifted interference fringes can be obtained, and it takes a lot of effort to record these interference fringes on a photoreceptor.
, a phase-shifted diffraction grating can be formed.

〔実施例〕〔Example〕

以下本発明の実施例について図面を参照して説明する。 Embodiments of the present invention will be described below with reference to the drawings.

なお以下の説、明では説明を容易にするために、位相板
の段差や回折格子の溝を実際エリも拡大して模式的に示
している。
In the following description, the steps of the phase plate and the grooves of the diffraction grating are schematically illustrated with their actual edges enlarged for ease of explanation.

を与える位相板1を斜入射の平行光2で照射し、透過波
3を可干渉な平行参照光4と干渉させて、基板6上の感
光体N5に記録する。
The phase plate 1 that provides the following is irradiated with obliquely incident parallel light 2, and the transmitted wave 3 is caused to interfere with the coherent parallel reference light 4 and recorded on the photoreceptor N5 on the substrate 6.

本実施例では、光源として波長325諷のHe−Cd 
レーザを用いたため、位相板lは325m の光を透過
する石英にエツチングにより、形成され、1/4波長の
位相シフト格子ヲ複数同−ウエバー上に形成するため、
位相板1には複数の位相シフト部を設けている。また、
感光体層5には、フォトレジストAZ−1350を用い
て、この感光体層5を現像後そのままホログラムとして
用いることもできるが、長期にわたって使用するために
は、記録されたフォトレジストパターンをマスクトシて
、石英基板6にエツチングで転写しておくことが好まし
い。フォトレジストのままで用いる場合のフォトレジス
トの溝深き、及び石英基板6に転写して用いる場合の溝
深さは、両者ともに約0.5μ雷程度で、約30%の回
折効率が得られた。
In this example, He-Cd with a wavelength of 325 is used as a light source.
Since a laser was used, the phase plate l was formed by etching quartz that transmits light at a wavelength of 325 m2, and multiple 1/4 wavelength phase shift gratings were formed on the same web.
The phase plate 1 is provided with a plurality of phase shift parts. Also,
Photoresist AZ-1350 can be used for the photoresist layer 5, and the photoresist layer 5 can be used as a hologram as it is after development, but in order to use it for a long time, the recorded photoresist pattern must be masked. , it is preferable to transfer it to the quartz substrate 6 by etching. The groove depth of the photoresist when used as is and the groove depth when transferred to the quartz substrate 6 were both about 0.5μ, and a diffraction efficiency of about 30% was obtained. .

である。この図で石英基板6上にホログラム7が形成さ
れている。このホログラム7を製作時の波面(纂2図の
平行光4)と共役な波面8を、このホログラム7の裏面
から照射すると、回折波9を生じる。この回折波9はホ
ログラム製作時の位相板透過波面(早2図の波面3)の
逆進波面である。
It is. In this figure, a hologram 7 is formed on a quartz substrate 6. When this hologram 7 is irradiated with a wavefront 8 that is conjugate to the wavefront at the time of manufacture (parallel light 4 in Figure 2) from the back side of the hologram 7, a diffracted wave 9 is generated. This diffracted wave 9 is a reversed wavefront of the phase plate transmitted wavefront (wavefront 3 in Figure 2) when the hologram was manufactured.

そこでホログラム製作時に位相板】のあった位置には、
位相板透過直後の、すなわち位相シフトした波面が出来
ている。この位置に感光体であるフォトレジスト】1を
塗布したウェハー10を置いて、もう−万の干渉光束1
2と干渉させることにより、位相シフト格子を形成でき
る。
Therefore, in the position where the phase plate was located when the hologram was made,
Immediately after passing through the phase plate, a wavefront with a phase shift is created. A wafer 10 coated with a photoresist (photoresist) 1 is placed at this position, and an interference light beam 1 of -10,000
By interfering with 2, a phase shift grating can be formed.

なお、本実施例では、波長1.5μmの半導体レーザ用
に0.2μ毒周期の回折格子を形成するために、ウェハ
ー10に対する2光束9.12の入射角は各々50.7
°とし友。また、光束90入射角は固定で、光束12の
入射角を変えることで格子周期を変えることができる。
In this example, in order to form a diffraction grating with a period of 0.2 μm for a semiconductor laser with a wavelength of 1.5 μm, the incident angles of the two light beams 9.12 with respect to the wafer 10 are each 50.7 μm.
° Toshitomo. Further, the incident angle of the light beam 90 is fixed, and the grating period can be changed by changing the incident angle of the light beam 12.

また、本実施例においjて、第1図に示したように表面
に対して垂直に溝が形成された位相板1を用いると、段
差部分での透過光の位相シフトが急峻でなくなり、結果
的に遷移領域が拡大してしまう。
Furthermore, in this embodiment, if the phase plate 1 in which grooves are formed perpendicular to the surface as shown in FIG. 1 is used, the phase shift of the transmitted light at the stepped portion will not be steep, resulting Therefore, the transition region expands.

第3図はWLlの本発明の他の実施例の好ましい位相板
13を示した側面図である。本実施例は、図に示すよう
に斜入射の平行光束2に平行な溝の側面を持つ位相板1
3を用いることで遷移領域の小さい位相シフト格子を形
成できる。
FIG. 3 is a side view of a preferred phase plate 13 of another embodiment of the present invention for WLl. In this embodiment, as shown in the figure, a phase plate 1 having grooved side surfaces parallel to an obliquely incident parallel light beam 2 is used.
3, it is possible to form a phase shift grating with a small transition region.

[発明の効果〕 以上に説明したように、本発明に工れば、通常の干渉無
光法と同じように簡便な工程で、位相シフト部の遷移領
域の小さい、任意の周期を有する位相シフト回折格子が
製造できる。
[Effects of the Invention] As explained above, if the present invention is implemented, a phase shift having a small transition region of a phase shift portion and an arbitrary period can be achieved with a simple process similar to the normal interferenceless light method. Diffraction gratings can be manufactured.

【図面の簡単な説明】[Brief explanation of drawings]

軍1図はIEIの発明の一実施fllt−説明する光学
系の断面図、算2図fl$2の発明の位相シフト回折格
子の製作時の光学系を示す断面図、wL3図はIEIの
発明に用いる好ましい位相板を説明するためのホログラ
ムの装作光学系の断面図である。 1.13・・・・・・位相板% 2.4.8.12・・
・・・・平行光束、3.9・・・・・・回折波面、5.
11・・・・・・感光体層、6・・・・・・石英基板、
7・・・・・・ホログラム、10・・・・・・ウェハー
。 、ご−゛、
Fig. 1 is a cross-sectional view of an optical system to be explained in the implementation of IEI's invention, Fig. 2 is a cross-sectional view showing the optical system during the manufacture of the phase shift diffraction grating of $2's invention, and wL3 is an IEI invention. FIG. 2 is a cross-sectional view of a hologram mounting optical system for explaining a preferable phase plate used for the hologram. 1.13... Phase plate% 2.4.8.12...
...Parallel light flux, 3.9...Diffraction wavefront, 5.
11... Photoreceptor layer, 6... Quartz substrate,
7...Hologram, 10...Wafer. , Go-゛,

Claims (3)

【特許請求の範囲】[Claims] (1)所望の位相シフトを生じさせる位相板を斜入射の
平行光で照射して得られる回折波面と参照光束との干渉
光を感光体層に照射し、この感光体層上に前記干渉光に
よる凹凸を形成することを特徴とするホログラムの製造
方法。
(1) A photoreceptor layer is irradiated with interference light between a diffraction wavefront obtained by irradiating obliquely incident parallel light onto a phase plate that produces a desired phase shift and a reference light beam, and the interference light is applied onto the photoreceptor layer. A method for manufacturing a hologram, characterized by forming unevenness by
(2)所望の位相シフトを生じさせる位相板を斜入射の
平行光で照射して得られる回折波面を、参照光束と干渉
させてホログラムを製作する第1の工程と、前記ホログ
ラムを前記参照光と共役な波面で照射して得られる波面
を、前記位相板の配置されていた面で平行光束と干渉さ
せてウェハー上に設けた感光体に照射し、この感光体に
位相シフト回折格子を形成する第2の工程とを含むこと
を特徴とする位相シフト回折格子の製造方法。
(2) A first step of fabricating a hologram by interfering with a reference beam a diffraction wavefront obtained by irradiating a phase plate that produces a desired phase shift with obliquely incident parallel light; The wavefront obtained by irradiation with a wavefront conjugate to is caused to interfere with a parallel beam on the surface where the phase plate was placed, and is irradiated onto a photoreceptor provided on a wafer, forming a phase shift diffraction grating on this photoreceptor. A method of manufacturing a phase shift diffraction grating, the method comprising: a second step of:
(3)位相板が溝の有無によって位相シフトを生じる位
相板からなり、かつ前記溝の側面が斜入射平行光の光束
とほぼ平行になっていることを特徴とする特許請求の範
囲第2項記載の位相シフト回折格子の製造方法。
(3) Claim 2, characterized in that the phase plate is a phase plate that generates a phase shift depending on the presence or absence of grooves, and the side surfaces of the grooves are substantially parallel to the beam of obliquely incident parallel light. A method of manufacturing the phase-shifted diffraction grating as described.
JP4962186A 1986-03-07 1986-03-07 Production of hologram and phase shift diffraction grating Granted JPS62206583A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4962186A JPS62206583A (en) 1986-03-07 1986-03-07 Production of hologram and phase shift diffraction grating

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4962186A JPS62206583A (en) 1986-03-07 1986-03-07 Production of hologram and phase shift diffraction grating

Publications (2)

Publication Number Publication Date
JPS62206583A true JPS62206583A (en) 1987-09-11
JPH059028B2 JPH059028B2 (en) 1993-02-03

Family

ID=12836301

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4962186A Granted JPS62206583A (en) 1986-03-07 1986-03-07 Production of hologram and phase shift diffraction grating

Country Status (1)

Country Link
JP (1) JPS62206583A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01144832U (en) * 1988-03-29 1989-10-04
KR20130106728A (en) * 2012-03-20 2013-09-30 엘지디스플레이 주식회사 Manufacturing equipment of light path conversion film

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01144832U (en) * 1988-03-29 1989-10-04
KR20130106728A (en) * 2012-03-20 2013-09-30 엘지디스플레이 주식회사 Manufacturing equipment of light path conversion film

Also Published As

Publication number Publication date
JPH059028B2 (en) 1993-02-03

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