JPS62204877A - Apparatus for applying high viscosity resin solution - Google Patents

Apparatus for applying high viscosity resin solution

Info

Publication number
JPS62204877A
JPS62204877A JP4529986A JP4529986A JPS62204877A JP S62204877 A JPS62204877 A JP S62204877A JP 4529986 A JP4529986 A JP 4529986A JP 4529986 A JP4529986 A JP 4529986A JP S62204877 A JPS62204877 A JP S62204877A
Authority
JP
Japan
Prior art keywords
resin solution
tank
supply pipe
cooling tank
cooling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4529986A
Other languages
Japanese (ja)
Inventor
Takahiro Yamauchi
孝裕 山内
Ken Ogura
謙 小椋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP4529986A priority Critical patent/JPS62204877A/en
Publication of JPS62204877A publication Critical patent/JPS62204877A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor

Abstract

PURPOSE:To contrive to reduce cost by suppressing the change in the viscosity of a resin solution, by receiving the principal part of a resin solution supply line in a cooling tank and passing the line from the cooling tank through a thermostatic tank. CONSTITUTION:In such a state that the temp. in a cooling tank 23 is held at 0-10 deg.C by the flon gas compressed by a cooling medium compressor 28, a cooled resin solution 18 passes through a first supply pipe 14 from a resin solution bottle 13 by the driving of a first pump means 21 to be once stored in a sub-tank 19 through a filter 20. At the time of the emission of the resin solution, the clean resin solution 18 is supplied to a second supply pipe 14a from the sub-tank 19 by the driving of a second pump means 21a. Thereafter, the resin solution 18 passes through the coil-shaped pipe 14b arranged in the thermostatic tank 24 outside the cooling tank 23 to be returned to room temp. and is subjected to painting.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は高粘度樹脂溶液の塗布装置に係シ、特にIC、
LS I等の半導体装置の製造工程において、レジスト
、ポリイミド、シリコン樹脂等の樹脂の高粘度溶液をS
iウェハ上に塗布する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a coating device for high viscosity resin solution, particularly for IC,
In the manufacturing process of semiconductor devices such as LSI, high viscosity solutions of resins such as resist, polyimide, silicone resin, etc.
The present invention relates to an apparatus for coating onto i-wafers.

〔従来の技術〕[Conventional technology]

半導体装置製造の多層配線工程において、ブロッキング
@あるいはパッシベーション膜等の絶縁膜を積層、パタ
ーニングして形成する為に、ポリイミド、シリコン樹脂
あるいはレジスト等の高粘度樹脂溶液(以後、樹脂溶液
と略称する)をSiウェハ上に塗布する必要がある。こ
こにおいて量産性及び高密度化の追求から、樹脂溶液を
無駄なく、しかも均一に塗布することが要求される。
In the multilayer wiring process of semiconductor device manufacturing, high viscosity resin solutions such as polyimide, silicone resin, or resist (hereinafter abbreviated as resin solutions) are used to stack and pattern insulating films such as blocking@ or passivation films. It is necessary to apply this on a Si wafer. In pursuit of mass productivity and high density, it is required to uniformly apply the resin solution without waste.

以下、第2図に基き従来の高粘度樹脂溶液の塗布装置に
ついて説明する。同図(a)は第1の従来例を示すもの
であり、ラインに樹脂溶液を送り出す為に加圧窒素を用
いた例である。同図において、矢印Aの方向から加圧ガ
ス供給パイプ4を通して2〜3気圧程度の加圧窒素が加
圧容器z内に送給される為、この加圧容器2内に置かれ
た樹脂溶液Iトル3から樹脂溶液8が押し出され、樹脂
溶液供給パイプ4aを通って高粘度用のノズル7からウ
ェハ(図示せず)上に滴下される。なお、1は加圧窒素
の圧力調整用のバルブ、また5、6は上記樹脂溶液供給
、eイブ4aに挿設されているストップバルブ及びサッ
クバックダイヤプラムで1)、夫々樹脂溶液塗布のON
 、OFF制御、及びOFF時のゼタ落ち防止の為の樹
脂溶液8の引き戻しに用いる。
Hereinafter, a conventional coating apparatus for a high viscosity resin solution will be explained based on FIG. FIG. 5A shows a first conventional example, in which pressurized nitrogen is used to send the resin solution to the line. In the figure, pressurized nitrogen of about 2 to 3 atmospheres is fed into the pressurized container z from the direction of arrow A through the pressurized gas supply pipe 4, so that the resin solution placed in the pressurized container 2 A resin solution 8 is extruded from the I-torque 3, passes through a resin solution supply pipe 4a, and is dripped onto a wafer (not shown) from a nozzle 7 for high viscosity. Note that 1 is a valve for adjusting the pressure of pressurized nitrogen, and 5 and 6 are a stop valve and a suck back diaphragm inserted in the resin solution supply, e-build 4a, respectively.
, for OFF control, and for pulling back the resin solution 8 to prevent zeta from falling when OFF.

同図(b)は第2の従来例を示すものであり、樹脂溶液
8の送給にポンプ手段を用いた例である。図中、同図(
a)との相当個所には同一符号を付しである。同図にお
いて、第1の供給パイプ4bに挿設された第1のポンプ
手段11の駆動の基に、ケミカルゼッグス12中に配置
された樹脂溶液セトル3から吸い上げられた樹脂溶液8
は、フィルタ10を通って一旦サブタンク9内に導かれ
る。そして樹脂溶液吐出時には、第2の供給パイプ4C
に挿設された第2のポンプ手[11aの駆動によシ、樹
脂溶液8はストップバルブ5及びサックバックダイヤフ
ラム6を通してノズル7から吐出される。
FIG. 2B shows a second conventional example, in which a pump means is used to feed the resin solution 8. In the figure, the same figure (
Parts corresponding to those in a) are given the same reference numerals. In the figure, a resin solution 8 is drawn up from a resin solution settler 3 placed in a chemical zeggs 12 under the drive of a first pump means 11 inserted into a first supply pipe 4b.
is once introduced into the sub-tank 9 through the filter 10. When discharging the resin solution, the second supply pipe 4C
The resin solution 8 is discharged from the nozzle 7 through the stop valve 5 and the suck-back diaphragm 6 by driving the second pump hand [11a inserted therein.

この第2の従来例によればサブタンク9を備えている為
、フィルタ10を通して得られるクリーンな樹脂溶液8
を塗布前に予めこのサブタンク9に貯めておき、希望量
(通常は2〜7 cc )を希望時間内(通常は1〜3
秒)にウエノ・(図示せず)上に供給することができる
According to this second conventional example, since the sub-tank 9 is provided, a clean resin solution 8 obtained through the filter 10 can be obtained.
is stored in this sub-tank 9 in advance before application, and the desired amount (usually 2 to 7 cc) is dispensed within the desired time (usually 1 to 3 cc).
(seconds) can be fed onto Ueno (not shown).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、上述した第1の従来例においては、 (1)高粘度の樹脂溶液(500〜1000 cp以上
)8をラインに押し出す為には、2〜3気圧のかなシの
圧力を要し、またフィルタを入れると吐出速度が遅くな
シ希望量を希望時間内にてウエノ・上に供給することが
困難となる。
However, in the first conventional example described above, (1) a pressure of 2 to 3 atmospheres is required to push the high viscosity resin solution (500 to 1000 cp or more) 8 into the line; If a filter is included, the ejection speed will be slow and it will be difficult to supply the desired amount onto the wafer within the desired time.

(2)加圧窒素を用いているので1.加圧容器2中で窒
素が樹脂溶液に溶は込み、この為ノズル7付近で圧力が
下がった時に気泡となって出てきてしまう。
(2) Pressurized nitrogen is used, so 1. Nitrogen dissolves into the resin solution in the pressurized container 2, and therefore comes out as bubbles when the pressure decreases near the nozzle 7.

(3)半導体装置の製造に用いられる樹脂溶液は、室温
では粘度が変化し硬化や劣化が生ずるので長時間放置す
ることは出来ない。この為、一旦ラインに入れられたも
のは次回(例えば、3〜4日から1週間程匪)に塗布す
る時には使用できず、塗布の度にラインの容量分の樹脂
溶液(通常は500mj!程度)が無駄となり極めて不
経済である。
(3) Resin solutions used in the manufacture of semiconductor devices cannot be left standing for long periods of time because their viscosity changes at room temperature, resulting in hardening and deterioration. For this reason, once it is placed in the line, it cannot be used the next time (for example, from 3 to 4 days to a week), and each time the resin solution is applied, the volume of the line is filled with resin solution (usually about 500mJ!) ) is wasted and is extremely uneconomical.

等の問題がある、 第2の従来例は、上記(1)及び(2)の問題を解消す
るものであるが、(3)の問題を解消することは構成上
困難である。
The second conventional example solves the problems (1) and (2) above, but it is difficult to solve the problem (3) due to the structure.

従って、本発明は上記(3)の問題をも解消し塗布工程
でのコスト低減化を実現した高粘度樹脂溶液の塗布装置
を提供することを目的とする。
Therefore, it is an object of the present invention to provide a high viscosity resin solution coating apparatus which solves the problem (3) above and realizes cost reduction in the coating process.

〔問題点を解決するための手段〕[Means for solving problems]

本発明に係る高粘度樹脂溶液の塗布装置は、樹脂溶液y
N)ル、供給パイプ、ポンプ手段、フィルタ及び樹脂溶
液を一旦貯える為のサブタンク等の樹脂溶液供給ライン
の主要部を冷却槽中に納めると共に、この冷却槽外のラ
インを、冷却されて送給される樹脂溶液を所定温度に戻
す為の恒温槽に通すよう構成するものである。
The high viscosity resin solution coating device according to the present invention includes a resin solution y
N) The main parts of the resin solution supply line, such as the tube, supply pipe, pump means, filter, and sub-tank for temporarily storing the resin solution, are housed in the cooling tank, and the lines outside the cooling tank are cooled and fed. The resin solution is passed through a constant temperature bath to return it to a predetermined temperature.

〔作 用〕[For production]

以上のように、本発明によれば、樹脂溶液供給ラインの
主要部を冷却槽内に納めるようにしたので、槽内におい
て樹脂溶液の粘度変化が抑制され、この為長時間に渡る
保管が可能となる。
As described above, according to the present invention, the main part of the resin solution supply line is housed in the cooling tank, so changes in the viscosity of the resin solution in the tank are suppressed, and therefore, it can be stored for a long time. becomes.

また、冷却槽外のラインを恒温槽に通すようにしている
ので、樹脂溶液吐出時ラインに送給されてくる樹脂溶液
は所定温度に戻され且つ温匿制御される為、吐出される
樹脂溶液の粘度は略一定に保たれる。
In addition, since the line outside the cooling tank is passed through the constant temperature bath, the resin solution that is fed into the line when discharging the resin solution is returned to a predetermined temperature and temperature controlled, so the resin solution that is discharged is The viscosity of is kept approximately constant.

〔実施例〕〔Example〕

以下第1図に基き、本発明の一実施例を詳細に説明する
。同図において、13は樹脂溶液18の入っている樹脂
溶液ボトル、21は第1のポンプ手段であり、第1の供
給パイプ14t−通して樹脂溶液ゼトル13から樹脂溶
液18をサブタンク19に送給する。20は第1の供給
パイプ14に挿設されているフィルタである。まfc2
1aは第2のポンプ手段であシ、サブタンク19内に貯
えられているクリーンな樹脂溶液18を第2の供給パイ
プ14aへと送給する。
An embodiment of the present invention will be described in detail below with reference to FIG. In the figure, 13 is a resin solution bottle containing the resin solution 18, and 21 is a first pump means, which supplies the resin solution 18 from the resin solution trough 13 to the sub-tank 19 through the first supply pipe 14t. do. 20 is a filter inserted into the first supply pipe 14. Mafc2
1a is a second pump means, which feeds the clean resin solution 18 stored in the sub-tank 19 to the second supply pipe 14a.

そして、樹脂溶液供給ライン30の一部を構成する上記
樹脂溶液yN)ル13、第1の供給パイプ14、第1の
ポンプ手[21、フィルタ20、サブタンク19、第2
のポンプ手段21a及び一部の第2の供給パイプ14a
は冷却槽23中に納められている。26はこの冷却槽2
3中に配設された冷却用フィンコイルで、圧縮されたフ
ロンガス(商品名)1−供給する外部の冷媒用コンプレ
ッサ28とはガス供給/’?イブ29を介してつながれ
ている。これら冷却用フィンコイル26、冷媒用コンプ
レッサ28及びガス供給パイプ29によシ冷却手[31
が構成される。また27は攪拌用ファンから成る攪拌手
攻で、冷却槽23の側壁部に付設されている。上記構成
の基に冷却槽23内は、樹脂溶液18の粘度変化が起こ
らない0〜10℃程度の温度に維持されている。
The resin solution supply line 13, the first supply pipe 14, the first pump hand [21], the filter 20, the sub-tank 19, the second
pump means 21a and a portion of the second supply pipe 14a
is housed in a cooling tank 23. 26 is this cooling tank 2
The external refrigerant compressor 28 that supplies compressed Freon gas (product name) 1 with a cooling fin coil disposed in the cooling fin coil is a gas supply/'? They are connected via Eve 29. The cooling fin coil 26, the refrigerant compressor 28, and the gas supply pipe 29 are connected to the cooling hand [31
is configured. Further, numeral 27 is a stirring hand made of a stirring fan, and is attached to the side wall of the cooling tank 23. Based on the above configuration, the inside of the cooling tank 23 is maintained at a temperature of about 0 to 10° C. at which the viscosity of the resin solution 18 does not change.

セして14bは、冷却槽23外へと配設される第2の供
給パイプ14aの一部を成すコイル状パイプ、15.1
6は夫々第2の供給パイプ14aに挿設されるストップ
バルブ及びサックバックダイヤフラムであシ、17は樹
脂溶液吐出用のノズルである。樹脂溶液供給ライン30
は、これら各構成要素と上述した冷却槽23内の構成要
素とにより構成されている。
14b is a coiled pipe forming a part of the second supply pipe 14a disposed outside the cooling tank 23, and 15.1
6 is a stop valve and a suck-back diaphragm which are respectively inserted into the second supply pipe 14a, and 17 is a nozzle for discharging the resin solution. Resin solution supply line 30
is constituted by each of these components and the components in the cooling tank 23 described above.

また上記コイル状パイプ14bはSUS製、内径0.4
 m以下、長さ2m以上として構成され、図示する如く
恒温水槽から成る恒温槽24中に配置されている。そし
て恒温水槽24は、カールニクス(商品名)から成る熱
交換器25の作用で、22〜23℃程直の設定温度に保
たれた温水が矢印のように循環する為、槽内温直は設定
温度の±1℃以内に制御されている。
The coiled pipe 14b is made of SUS and has an inner diameter of 0.4
2 m or more in length, and is arranged in a constant temperature bath 24 consisting of a constant temperature water bath as shown in the figure. In the constant temperature water tank 24, hot water kept at a set temperature of 22 to 23 degrees Celsius is circulated as shown by the arrow by the action of a heat exchanger 25 made of Carlnix (trade name), so the temperature inside the tank is constant. The temperature is controlled within ±1℃ of the set temperature.

以上の装置構成によシ、ノズル17付近の樹脂溶液18
は設定温度の±1℃以内に制御され、略一定の粘度を以
って吐出される。また塗布作業後、廃棄を要する樹脂溶
液量は、樹脂溶液供給ライン30のうち冷却槽23外の
ラインの容量分の30−程度となシ、従来の”/10以
下に抑えられる。
Due to the above device configuration, the resin solution 18 near the nozzle 17
is controlled within ±1° C. of the set temperature, and is discharged with a substantially constant viscosity. Further, the amount of resin solution that needs to be discarded after the coating operation is about 30 - the capacity of the line outside the cooling tank 23 in the resin solution supply line 30, and can be suppressed to less than 1/10 of the conventional amount.

次に、上記構成の装置を用いた樹脂溶液の塗布方法につ
いて説明する。まず冷却ガス供給部31において冷媒用
コンプレッサ28で圧縮されたフロンガスは、ガス供給
パイゾ29t−通シ冷却用コイル26で断熱膨張して冷
却する為、冷却槽23内にて熱が奪れ、攪拌用ファン2
70作用によシ槽内の温度は0〜10℃程度に保たれる
。また樹脂溶液供給ライン30においては、冷却槽23
内にて第1のポンプ手段21の駆動(圧力2〜10V−
程度)によシ、樹脂溶液ボトル13から冷却された樹脂
溶液18が第1の供給パイプへ送給され、フィルタ20
を通してサブタンク19内に一旦貯えられる。
Next, a method of applying a resin solution using the apparatus configured as described above will be explained. First, in the cooling gas supply unit 31, the fluorocarbon gas compressed by the refrigerant compressor 28 is adiabatically expanded and cooled by the gas supply pizo 29t-through-cooling coil 26, so heat is removed in the cooling tank 23 and stirred. fan 2
The temperature inside the tank is maintained at about 0 to 10°C by the action of 70°C. In addition, in the resin solution supply line 30, the cooling tank 23
Drive of the first pump means 21 (pressure 2 to 10 V-
degree), the cooled resin solution 18 is fed from the resin solution bottle 13 to the first supply pipe, and the filter 20
The water is temporarily stored in the sub-tank 19 through the water.

そして樹脂溶液吐出時には、第2のポンプ手段の駆動(
圧力2〜10 Kg/cd程度)にニジクリーンな冷却
樹脂溶液18がサブタンク19から第2の供給パイプ1
4aへと送給される。この後、冷却槽23外の恒温水槽
24中に配置されるコイル状パイプ14bを通ることに
よシ、樹脂溶液18は22〜23℃程度の室温に戻され
る。そしてストップバルブ15のON、OFF制御によ
シ、略一定粘度の樹脂溶液18はサックバックダイヤプ
ラム16を通して1〜3秒程度の所定時間内に2〜7 
cc程度の所定量を以ってノズル17先端からウェハ(
図示せず)上へと吐出される。
When discharging the resin solution, the second pump means is driven (
The cooled resin solution 18 is supplied from the sub-tank 19 to the second supply pipe 1 at a pressure of about 2 to 10 Kg/cd).
4a. Thereafter, the resin solution 18 is returned to room temperature of about 22 to 23° C. by passing through the coiled pipe 14b arranged in the constant temperature water tank 24 outside the cooling tank 23. Then, by ON/OFF control of the stop valve 15, the resin solution 18 having a substantially constant viscosity is passed through the suckback diaphragm 16 within a predetermined time of about 1 to 3 seconds.
The wafer (
(not shown).

なお装置のメインテナンスの都合上、使用後は冷却槽2
3外の樹脂溶液供給ライン30に溶剤として、例えばア
セトンを流し込んで洗浄処理を施すようにすることが好
ましい。
For equipment maintenance reasons, the cooling tank 2 should be removed after use.
It is preferable to perform the cleaning treatment by pouring acetone, for example, as a solvent into the resin solution supply line 30 outside of the resin solution supply line 30.

〔発明の効果〕〔Effect of the invention〕

以上詳細に説明したように、本発明によれば、樹脂溶液
供給ラインの主要部を冷却槽中に納め、樹脂溶液を低温
保管するようにしたので、塗布処理後、廃棄の対象とな
る樹脂溶液は冷却槽外のラインの容量公文となシ、この
為塗布工程での経済化が図れるという効果がある。
As explained in detail above, according to the present invention, the main part of the resin solution supply line is housed in a cooling tank and the resin solution is stored at low temperature. The capacity of the line outside the cooling tank is small, which has the effect of making the coating process more economical.

また樹脂溶液の低温保管から樹脂溶液の硬化や劣化が抑
制され、少量となった蒔に補充すれば済むので取シ換え
の手間が省は省力化できるという効果がある。
In addition, hardening and deterioration of the resin solution is suppressed by storing the resin solution at a low temperature, and since only a small amount of seedlings needs to be replenished, there is an effect that labor and effort for replacement can be saved.

Claims (1)

【特許請求の範囲】[Claims] (1)ポンプ手段の駆動により樹脂溶液供給ラインを通
して樹脂溶液を吐出させる高粘度樹脂溶液の塗布装置に
おいて、上記樹脂溶液供給ラインのうち、第1のポンプ
手段の挿設された第1の供給パイプでつながれる樹脂溶
液ボトルからサブタンクまでの部分と、このサブタンク
から樹脂溶液を外部へ送給する第2のポンプ手段の挿設
された第2の供給パイプの部分とを冷却槽内に収めると
共に、この冷却槽外へと延長せる上記第2の供給パイプ
を恒温槽を通すように構成したことを特徴とする高粘度
樹脂溶液の塗布装置。
(1) In a high viscosity resin solution coating device that discharges a resin solution through a resin solution supply line by driving a pump means, a first supply pipe in which a first pump means is inserted in the resin solution supply line; The part from the resin solution bottle connected to the sub-tank and the part of the second supply pipe into which the second pump means for feeding the resin solution from the sub-tank to the outside are inserted in the cooling tank, and A high viscosity resin solution coating apparatus characterized in that the second supply pipe extending outside the cooling tank is configured to pass through a constant temperature tank.
JP4529986A 1986-03-04 1986-03-04 Apparatus for applying high viscosity resin solution Pending JPS62204877A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4529986A JPS62204877A (en) 1986-03-04 1986-03-04 Apparatus for applying high viscosity resin solution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4529986A JPS62204877A (en) 1986-03-04 1986-03-04 Apparatus for applying high viscosity resin solution

Publications (1)

Publication Number Publication Date
JPS62204877A true JPS62204877A (en) 1987-09-09

Family

ID=12715435

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4529986A Pending JPS62204877A (en) 1986-03-04 1986-03-04 Apparatus for applying high viscosity resin solution

Country Status (1)

Country Link
JP (1) JPS62204877A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63299335A (en) * 1987-05-29 1988-12-06 Tokyo Electron Ltd Resist coater
JPH0194620A (en) * 1987-10-06 1989-04-13 Mitsubishi Electric Corp Spin applicator
JPH0273356A (en) * 1988-09-09 1990-03-13 Fujitsu Ltd Method and device for applying resist
JPH03154670A (en) * 1989-11-07 1991-07-02 Technadyne Eng Corp Heat sealing system for thermosetting material
US9086190B2 (en) 2010-05-06 2015-07-21 Tokyo Electron Limited Chemical supply system, substrate treatment apparatus incorporating the same, and coating and developing system incorporating the same apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63299335A (en) * 1987-05-29 1988-12-06 Tokyo Electron Ltd Resist coater
JPH0194620A (en) * 1987-10-06 1989-04-13 Mitsubishi Electric Corp Spin applicator
JPH0273356A (en) * 1988-09-09 1990-03-13 Fujitsu Ltd Method and device for applying resist
JPH03154670A (en) * 1989-11-07 1991-07-02 Technadyne Eng Corp Heat sealing system for thermosetting material
US9086190B2 (en) 2010-05-06 2015-07-21 Tokyo Electron Limited Chemical supply system, substrate treatment apparatus incorporating the same, and coating and developing system incorporating the same apparatus
US10035173B2 (en) 2010-05-06 2018-07-31 Tokyo Electron Limited Chemical supply system, substrate treatment apparatus incorporating the same, and coating and developing system incorporating the same apparatus

Similar Documents

Publication Publication Date Title
KR102057220B1 (en) Chemical supplier, processing apparatus including the chemical supplier and method of processing a substrate using the cleaning apparatus
KR100209564B1 (en) System and method for applying a liquid
JPS62204877A (en) Apparatus for applying high viscosity resin solution
JPWO2018020863A1 (en) Coating film forming method, coating film forming apparatus, and computer readable recording medium
JP6600510B2 (en) Coating method and coating apparatus
JP2011035128A (en) Liquid processing apparatus, liquid processing method, program, and program, storage medium
JPH05505260A (en) How to cool photographic emulsion
JPH09166376A (en) Refrigeration system and cooling method
KR20060135496A (en) Substrate processing system and control method
US20050016449A1 (en) Photoresist coating system
US6007629A (en) Substrate processing apparatus
US20090088909A1 (en) Batch processing apparatus for processing work pieces
JP5313074B2 (en) Liquid processing apparatus, liquid processing method, program, and program recording medium
US6267142B1 (en) Fluid delivery stablization for wafer preparation systems
TWI223349B (en) Method of providing reaction of liquid chemical at a temperature higher than room temperature and wafer
TW201843785A (en) Method and apparatus for using supercritical fluids in semiconductor applications
US20080083427A1 (en) Post etch residue removal from substrates
JP2000331982A (en) Etching device
JP2822655B2 (en) Electronic component cooling mechanism
US7763309B2 (en) Method of controlling chemical solution applying apparatus, chemical solution applying apparatus, and method of manufacturing semiconductor device
JP6495837B2 (en) Substrate processing equipment
US20050039775A1 (en) Process and system for cleaning surfaces of semiconductor wafers
JPH02258082A (en) Coating apparatus
JPH1145872A (en) Method and device for planarization of semiconductor substrate
JPS62272542A (en) Wet etching apparatus