JPS62190886A - semiconductor laser equipment - Google Patents
semiconductor laser equipmentInfo
- Publication number
- JPS62190886A JPS62190886A JP3408786A JP3408786A JPS62190886A JP S62190886 A JPS62190886 A JP S62190886A JP 3408786 A JP3408786 A JP 3408786A JP 3408786 A JP3408786 A JP 3408786A JP S62190886 A JPS62190886 A JP S62190886A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- conductivity type
- semiconductor laser
- active layer
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34313—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34306—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000nm, e.g. InP based 1300 and 1500nm lasers
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
C産業上の利用分野J
この発明は、半導体レーザ装置に係り、特に混晶半導体
の光導波層を超格子構造または量子井戸構造で構成した
長波長帯S CH(5eparate Confine
ment Heterostructure )半導体
し一デKpl@するものである。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application J This invention relates to a semiconductor laser device, and in particular to a long wavelength band SCH (5 separate Confine
ment Heterostructure) It is a semiconductor and has one de-Kpl@.
〔従来の技術」
従来、SCH半専体レーザは、基本構成要素である3つ
の半導体、即ち、所定発振波長を得るために必要な禁制
帯幅を有する活性層半導体、上記活性層半導体と格子整
合条件を満足し、それよりも禁制帯幅4;大にく、屈折
率の小さい光導波層半導体およびクラッド層半導体から
なっている(Casey& Pan1sh、 Hete
rostructure La5ers 、1978
。[Prior Art] Conventionally, an SCH semi-dedicated laser consists of three semiconductors as basic components: an active layer semiconductor having a forbidden band width necessary to obtain a predetermined oscillation wavelength, and a lattice matching with the active layer semiconductor. It satisfies the condition and has a forbidden band width of 4; it consists of an optical waveguide layer semiconductor and a cladding layer semiconductor with a much smaller refractive index (Casey & Pansh, Hete
rostructure La5ers, 1978
.
Academic Press ) o所定の発振反
長帯を有する半導体レーザを製造する場合、基板財料が
与えられると、それと格子定数を一致させる必要上、l
昆晶半導体の次元が3以]と低ければ、禁制帯幅の選択
の全知は少なく、一方、混晶半導体の次元が4以上と縞
くなると、禁制帯幅の選択の全知が生じるが、多元混晶
半導体の組成制御が容易でなくなると云う一般的な困難
さが存在する。Academic Press) o When manufacturing a semiconductor laser having a predetermined oscillation antilong band, given the substrate material, it is necessary to match the lattice constant with the substrate material.
If the dimension of the mixed crystal semiconductor is as low as 3 or more, there is little omniscience in the selection of the forbidden band width.On the other hand, if the dimension of the mixed crystal semiconductor is 4 or more, there is omniscience in the selection of the forbidden band width, but there is little omniscience in the selection of the forbidden band width. There is a general difficulty that compositional control of mixed crystal semiconductors is not easy.
光通信に用いられている石英系光フアイバー伝送損失の
小さい1.3〜7.6μmの波長@域を有する従来の長
波長帯SCH半導体レーザは、InPを基板として、第
2図に示す構成をもっている。第2図にかいて、(1)
は金属電極、(2)は第1の導電型のInP基板、(3
)は第1の導電型のクラッド層、(4)はアンドープ又
は第1の導電型の第1の光4波層、(5)は活性層、(
6)はアンドープ又は第2の導電型の@2の光等波層、
(7)は第2の導電型のクラッド層、(8)は第2の導
電型のコンタクト層、(9)は企九電礒である。ここで
、上記SCH半導体レーザの基本構成要素である活性層
(5)、光導波層(4) (6)およびクラツド層(3
] (7Jに対応する3種類の半導体の1−XA5yP
t−ylどの4元以上の混晶半導体により構゛成される
。A conventional long wavelength band SCH semiconductor laser having a wavelength range of 1.3 to 7.6 μm with small transmission loss through silica-based optical fiber used in optical communications uses InP as a substrate and has the configuration shown in Fig. 2. There is. In Figure 2, (1)
is a metal electrode, (2) is an InP substrate of the first conductivity type, and (3
) is the cladding layer of the first conductivity type, (4) is the undoped or first optical four-wave layer of the first conductivity type, (5) is the active layer, (
6) is an undoped or second conductivity type @2 optical equal wave layer,
(7) is a cladding layer of a second conductivity type, (8) is a contact layer of a second conductivity type, and (9) is a conductive layer. Here, the basic components of the SCH semiconductor laser are the active layer (5), the optical waveguide layer (4) (6), and the cladding layer (3).
] (1-XA5yP of three types of semiconductors corresponding to 7J
It is composed of a quaternary or more mixed crystal semiconductor such as t-yl.
[発明が解決しようとする問題点]
従来の半導体レーザ装置は以上のように構成されている
ので格子整合条件を満足させる必要上4元混晶半導体に
より構成される活性層(5)、光導波層(4) (6)
およびクラツド層(3) (7)のうちのいづれか1つ
は混晶組成を微妙に変化させなければならず、従来用い
られている液相エピタキシャル成fe&では、メルトの
まざりによる組成の乱れやヘテロ界面の劣化が生じるな
どの問題点があった。また、気相エピタキシャル成長法
を用いた場合でも多元混晶半導体ではより多くの構成元
素の精密な組成制御が必要であるので、再現性1歩留り
に問題点があった。[Problems to be Solved by the Invention] Since the conventional semiconductor laser device is constructed as described above, in order to satisfy the lattice matching condition, an active layer (5) composed of a quaternary mixed crystal semiconductor and an optical waveguide are used. Layer (4) (6)
The mixed crystal composition of any one of the cladding layers (3) and (7) must be slightly changed, and in conventional liquid phase epitaxial formation, the composition may be disordered due to melt mixing, and the hetero-interface There were problems such as deterioration of the Furthermore, even when vapor phase epitaxial growth is used, multi-component mixed crystal semiconductors require more precise compositional control of more constituent elements, so there is a problem in reproducibility and yield.
この発明は、上記のような問題点を解消するためになさ
れたもので、4元以上の混晶半導体を用いることなく、
2種類の3元混晶半導体のみを用いかつ、超格子または
量子井戸構造を用いることによって、1.3゛〜1.6
μm帯のSCH半導体レーザ装置を容易に得ることを目
的とする。This invention was made in order to solve the above-mentioned problems, and without using a quaternary or higher mixed crystal semiconductor,
By using only two types of ternary mixed crystal semiconductors and using a superlattice or quantum well structure,
The object of the present invention is to easily obtain a μm band SCH semiconductor laser device.
〔問題点を解決するための手段J
この発明に係る半導体レーザ装置は、4元混晶半導体工
nxGayA11−z−yAs 、■nxGa 1−X
A a 7P l−yを用いる代わりに、InPに格子
整合している3元混晶半導体1n0.53Ga0.47
As 、 In0.52Al0.48Asのみを用い、
In0.530aL)、47Asと工nU、52Al0
.48Asからなる積層構造を光導波層に用いたもので
ある。[Means for Solving the Problems J] The semiconductor laser device according to the present invention includes quaternary mixed crystal semiconductor devices nxGayA11-z-yAs, ■nxGa1-X
Instead of using A a 7P ly, a ternary mixed crystal semiconductor 1n0.53Ga0.47 lattice-matched to InP
Using only As, In0.52Al0.48As,
In0.530aL), 47As and EngnU, 52Al0
.. A laminated structure made of 48As is used for the optical waveguide layer.
[作用]
この発明においては、半導体レーザ装置の3種類の半導
体基本構成要素をInPに格子整合したIn0.53G
a0.47As、■no、52Alo、48Asおよび
それらを交互に積層した超格子又は量子井戸構造により
構成し、3元混晶半導体のみを用いたので製造方法およ
び5CI(構造の構成組み合わせが容易になり、素子の
歩留り、再現性、性能が向上する〔発明の未施例J
以F、この発明の一実施例を図について説明する。図に
おいて(lO)は金属電極、(20)は工n P カら
なる第1導電型の半導体基板、(30)はこの半導体基
板(20)上に設けられたIn0.52Al0.48A
sからなる第1導電型の第1クラッド層、(40)はこ
の第1クラッド層(2υ)上に設けられ上記第1クラッ
ド層(30)よりも禁制帯幅が大きくかつ屈折率が小さ
くされた第1得電型またはノンドープの第1の光等波層
で、この第1の光導波層(4(+)は量子井戸“層とし
ての工n 0.53Ga0.47As層(10U)と障
壁層としてのrr+0.51A上0.48As層(11
0)とを同一膜厚で交互に積層した超格子またはは子井
戸構造により構成されている。(50)は上記第1の光
4反層(40)上に設けられ上記光導波層(40)より
も禁制帯幅が大きくかつ屈折率が小さくされたIn01
52Ga0.47Asからなるノンドーブまたは第2導
電型の活性層、(60)はこの活性層(50)i K投
けられ上記光導波層(40)とほぼ同じ禁制帯幅及び屈
折率を有した第2導電型またはノンドープの第2の光導
波層で、この第2の光導波層(60)は上記第lの光導
波層(40)と同様の構成となっている。(70)はこ
の第2の光導波層(60)上に設けられ上記第1クラッ
ド層(20)とほぼ同じ禁制帯幅及び屈折率を有したI
n0.52A40.48Asからなる第2等電型の第2
クラッド層、(80)は、この第2クラツド層(70)
上に設けられたIn0.53Ga0.47Asからなる
コンタクト層、(90)はこのコンタクト層(80)、
ヒに設けられた金fIj4電極である。[Function] In this invention, the three basic semiconductor components of the semiconductor laser device are In0.53G which is lattice matched to InP.
It is composed of a0.47As, ■no, 52Alo, 48As, and a superlattice or quantum well structure in which they are stacked alternately, and only a ternary mixed crystal semiconductor is used, making the manufacturing method and 5CI (structural combinations easy). , the yield, reproducibility, and performance of the device are improved. (30) is an In0.52Al0.48A semiconductor substrate provided on this semiconductor substrate (20).
A first cladding layer (40) of the first conductivity type consisting of S is provided on this first cladding layer (2υ) and has a larger forbidden band width and a smaller refractive index than the first cladding layer (30). This first optical waveguide layer (4(+) is a quantum well "layer" is a 0.53Ga0.47As layer (10U) and a barrier layer. 0.48As layer (11
0) are alternately laminated with the same film thickness in a superlattice or cell well structure. (50) is In01 provided on the first optical waveguide layer (40) and having a larger forbidden band width and a smaller refractive index than the optical waveguide layer (40).
A non-doped or second conductivity type active layer (60) made of 52Ga0.47As is a second conductive layer (50) having approximately the same forbidden band width and refractive index as the optical waveguide layer (40). This second optical waveguide layer (60) is a two-conductivity type or non-doped second optical waveguide layer, and has the same structure as the first optical waveguide layer (40). (70) is provided on the second optical waveguide layer (60) and has approximately the same forbidden band width and refractive index as the first cladding layer (20).
The second of the second isoelectric type consisting of n0.52A40.48As
The cladding layer (80) is this second cladding layer (70)
A contact layer (90) made of In0.53Ga0.47As provided on the contact layer (80),
Gold fIj4 electrodes were provided at the top.
上記の様に構成された半導体レーザ装置に於ては、4元
混晶半導体を用いることなく、2種類の3元混晶半導体
のみを用いて、SCH半辱体レーザの3つの半導体基本
構成要素を得ている。、E記SCH半導体し−ザ忙おい
て、上記光導波層(40)(60)の量子井戸層(to
o)厚さlzkよび障壁層(11(1)IIIMIBf
:、量子サイズ効果(R、Dingle、 Festk
orperprobleme edited by H
%J 、 Queisaer %Pergamon−V
ieweg、 1975、V o 1 、 XV +
P 21 )が生じるように、f<定すれば禁1111
I帯幅馳をIn0.53Ga0.47As (Eg〜0
.8eV )とIn0.52Al0.48As (E
g〜1.5eV )との中間の値とすることができる。In the semiconductor laser device configured as described above, only two types of ternary mixed crystal semiconductors are used without using a quaternary mixed crystal semiconductor, and the three basic semiconductor components of the SCH semicircular body laser are I am getting . , E-book SCH semiconductor, the quantum well layer (to
o) Thickness lzk and barrier layer (11(1)IIIMIBf
:, quantum size effect (R, Dingle, Festk
orperprobleme edited by H
%J, Queisaer%Pergamon-V
ieweg, 1975, V o 1, XV +
P 21 ) occurs, if f<, then 1111
I band width is In0.53Ga0.47As (Eg~0
.. 8eV) and In0.52Al0.48As (E
g to 1.5 eV).
クレーニヒ・ベニ−モデルを用いた量子準位の計算の結
果によると、lzとして20A程度の値を採用すれば、
SCH半導体レーザとして機能させるのに必要な禁制帯
幅の差0.2 eVが容易に得られることがわかる。According to the results of quantum level calculation using the Kroenig-Benny model, if a value of about 20A is adopted as lz,
It can be seen that the difference in forbidden band width of 0.2 eV required for functioning as an SCH semiconductor laser can be easily obtained.
また、光導波層(40) (60)における屈折率は、
In0.53Gao、47As層(100)とIn0.
52Al0.48As 層(IILI)とからなる積層
構造の平均組成(/B/(/Z+7B) ) Kよって
近似すると、In0.53Ga0.47AsとIn0.
52Ga0.48肋との中間の値とすることができる。Moreover, the refractive index in the optical waveguide layer (40) (60) is
In0.53Gao, 47As layer (100) and In0.
52Al0.48As layer (IILI) is approximated by the average composition (/B/(/Z+7B)) K of the laminated structure consisting of In0.53Ga0.47As and In0.53Ga0.47As.
It can be set to an intermediate value between 52 Ga and 0.48 ribs.
以上に述べたように、InPと格子整合している4元混
晶半導体を用いる代わりに、InPと格子整合している
3元混晶半導体であるIn0.53Ga0.47Asと
In0.52Al0.48Asからなる超格子または量
子井戸構造を用いると、禁制帯幅や屈折率を選択する自
由度を確保しながら、1.3〜1.6μm長波長帯5C
I(半導体レーザを構成するために必要な活性層(SO
) 、光導波層(40) (60)をつくることができ
、E記SCH半導体し−デ製造上有利な方法を提供する
ことがoT能となる。As described above, instead of using a quaternary mixed crystal semiconductor that is lattice-matched to InP, In0.53Ga0.47As and In0.52Al0.48As, which are ternary mixed crystal semiconductors that are lattice-matched to InP, are used. By using a superlattice or quantum well structure, the 1.3-1.6 μm long wavelength band 5C can be achieved while ensuring the freedom to select the forbidden band width and refractive index.
I (active layer (SO) necessary to construct a semiconductor laser
), optical waveguide layers (40) (60) can be made, and it is possible to provide an advantageous method for manufacturing E-SCH semiconductors.
なお、上記の実施例では光導波層(40) (60)に
E記2種類の3元混晶牛専体からなる超格子または量子
弁7″′構造を用いたが、上記超格子または量子井戸構
造は必要とされる素子のa能に応じて例えばレーザ発振
f長を1.3〜1.6pa1頭域で選択する必要があれ
ば、活性層(5o)に用いることもI2T能である。こ
の場合、活性層(50)と光導波層(40) (60)
との間で量子共F層のlzと障壁層の1Ht−選択し禁
制帯幅が急性層(50)、光導波層(4(1) (6υ
)、クラッド層の順に大きくなり、かつ屈折率は逆に小
さくなるように設定することができる。In the above embodiment, the optical waveguide layer (40) (60) used a superlattice or quantum valve 7'' structure consisting exclusively of two types of ternary mixed crystals listed in E. If it is necessary to select the laser oscillation f-length in the range of 1.3 to 1.6 pa depending on the required a performance of the element, the well structure can also be used for the active layer (5o) with I2T performance. In this case, the active layer (50) and the optical waveguide layer (40) (60)
The quantum co-F layer lz and the barrier layer 1Ht are selected between the acute layer (50) and the optical waveguide layer (4 (1) (6υ
), the refractive index can be set so that it increases in the order of the cladding layer, and conversely, the refractive index decreases.
〔発明の効果]
以上のように、この発明によれば、4元混晶半導体の代
わりにInPに格子整合している3元混晶半導体、すな
わちIn0.53Ga0.47As及びIn0.52A
j0.48Asからなる超格子または量子井戸構造を用
いて1.3〜1.6μm帯のSCH半導体し〜デを構成
したので、E記し−デの製作が容易になり、再現性、歩
留りに優れた長波長帯のSCH半専体レーザ装置が得ら
れる効果がある。[Effects of the Invention] As described above, according to the present invention, ternary mixed crystal semiconductors that are lattice-matched to InP, namely In0.53Ga0.47As and In0.52A, are used instead of the quaternary mixed crystal semiconductor.
Since the SCH semiconductor in the 1.3 to 1.6 μm band was constructed using a superlattice or quantum well structure made of 0.48 As, the fabrication of the SCH semiconductor shown in E is easy and has excellent reproducibility and yield. This has the effect of providing a long wavelength band SCH semi-dedicated laser device.
第1図はこの発明の一実施例にょる5CI(半導体レー
ザの構造を示す図、第2図は従来の5CFl半導体レー
ザの構造を示す図である。
図にオイて(20)はInP基板、(3o)と(7o)
il−1′In0..52Al0.48Asのクラッド
層、(4o)と(6o)は光導波層、(5りは活性W、
(80)はIn0.53Ga0.47As tD コン
タクト層、(100)はt子井戸層、(110)は障壁
層である。
なお図中同一符号は同−又4相当部分を示す。FIG. 1 is a diagram showing the structure of a 5CI (semiconductor laser) according to an embodiment of the present invention, and FIG. 2 is a diagram showing the structure of a conventional 5CFI semiconductor laser. In the figure, (20) is an InP substrate; (3o) and (7o)
il-1′In0. .. 52Al0.48As cladding layer, (4o) and (6o) are optical waveguide layers, (5 is active W,
(80) is an In0.53Ga0.47As tD contact layer, (100) is a t-well layer, and (110) is a barrier layer. Note that the same reference numerals in the drawings indicate the same or four equivalent parts.
Claims (3)
52Al0.48Asの第1導電型クラツド層、この第
1導電型クラツド層上に設けられ上記第1導電型クラツ
ド層よりも禁制帯幅が大きくかつ屈折率が小さくされた
ノンドープまたは第2導電型の活性層、この活性層上に
設けられた上記第1導電型クラツド層と同じ禁制帯幅及
び屈折率を有するIn0.52Al0.48Asの第2
導電型クラツド層、上記第1導電型クラツド層と活性層
との間または上記第2導電型クラツド層と活性層との間
の少なくとも一方に設けられて上記第1及び第2導電型
クラツド層と活性層との中間の禁制帯幅及び屈折率を有
し、上記InP基板と格子整合しているIn0.53G
a0.47Asからなる量子井戸層と、上記InP基板
と格子整合しているIn0.52Al0.48Asから
なる障壁層とを交互に積層して構成された光導波層、上
記第2導電型クラツド層上に設けられた第2導電型のコ
ンタクト層を備えたことを特徴とする半導体レーザ装置
。(1) In0.
a first conductivity type cladding layer of 52Al0.48As; a non-doped or second conductivity type cladding layer provided on the first conductivity type cladding layer and having a larger forbidden band width and a lower refractive index than the first conductivity type cladding layer; an active layer, a second layer of In0.52Al0.48As having the same forbidden band width and refractive index as the first conductivity type cladding layer provided on the active layer;
a conductive type clad layer, which is provided between the first conductive type clad layer and the active layer or between the second conductive type clad layer and the active layer, and is connected to the first and second conductive type clad layers; In0.53G has a forbidden band width and refractive index intermediate to that of the active layer, and is lattice matched to the InP substrate.
an optical waveguide layer configured by alternately stacking quantum well layers made of a0.47As and barrier layers made of In0.52Al0.48As that are lattice-matched to the InP substrate; on the second conductivity type cladding layer; A semiconductor laser device comprising a second conductivity type contact layer provided in the semiconductor laser device.
ことを特徴とする特許請求の範囲第1項記載の半導体レ
ーザ装置。(2) The semiconductor laser device according to claim 1, wherein the active layer is made of In0.53Ga0.47As.
3Ga0.47Asからなる量子井戸層と、Inpと格
子整合しているIn0.52Al0.48Asからなる
障壁層とを交互に積層してなることを特徴とする特許請
求範囲第1項記載の半導体レーザ装置。(3) The active layer is made of In0.5 which is lattice matched to InP.
A semiconductor laser device according to claim 1, characterized in that quantum well layers made of 3Ga0.47As and barrier layers made of In0.52Al0.48As lattice-matched to Inp are laminated alternately. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3408786A JPS62190886A (en) | 1986-02-18 | 1986-02-18 | semiconductor laser equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3408786A JPS62190886A (en) | 1986-02-18 | 1986-02-18 | semiconductor laser equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62190886A true JPS62190886A (en) | 1987-08-21 |
Family
ID=12404480
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3408786A Pending JPS62190886A (en) | 1986-02-18 | 1986-02-18 | semiconductor laser equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62190886A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01264286A (en) * | 1988-04-15 | 1989-10-20 | Omron Tateisi Electron Co | Semiconductor quantum well laser |
| JPH0374891A (en) * | 1989-08-17 | 1991-03-29 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor light emitting element |
| US5132981A (en) * | 1989-05-31 | 1992-07-21 | Hitachi, Ltd. | Semiconductor optical device |
-
1986
- 1986-02-18 JP JP3408786A patent/JPS62190886A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01264286A (en) * | 1988-04-15 | 1989-10-20 | Omron Tateisi Electron Co | Semiconductor quantum well laser |
| US5132981A (en) * | 1989-05-31 | 1992-07-21 | Hitachi, Ltd. | Semiconductor optical device |
| JPH0374891A (en) * | 1989-08-17 | 1991-03-29 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor light emitting element |
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