JPS62182468U - - Google Patents
Info
- Publication number
- JPS62182468U JPS62182468U JP7166286U JP7166286U JPS62182468U JP S62182468 U JPS62182468 U JP S62182468U JP 7166286 U JP7166286 U JP 7166286U JP 7166286 U JP7166286 U JP 7166286U JP S62182468 U JPS62182468 U JP S62182468U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- sleeve
- utility
- measuring
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 8
- 238000005452 bending Methods 0.000 claims 1
- 230000002093 peripheral effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図はこの考案のピンプローブの一実施例の
正面図、第２図は第１図のＡ―Ａ線断面図、第３
図はピンプローブと被測定点との関係を示す説明
図、第４図ないし第７図はそれぞれこの考案の他
の実施例の断面図、第８図は従来のピンプローブ
の正面図、第９図は第８図のＢ―Ｂ線断面図、第
１０図は従来のピンプローブで極小間隔の測定点
を測定した場合の説明図である。
５，５１〜５４……スリーブ、６，６１〜６４
……測定用ピン。
Fig. 1 is a front view of an embodiment of the pin probe of this invention, Fig. 2 is a sectional view taken along the line A--A in Fig. 1, and Fig.
The figure is an explanatory diagram showing the relationship between the pin probe and the measured point, Figures 4 to 7 are sectional views of other embodiments of this invention, Figure 8 is a front view of the conventional pin probe, and Figure 9 is a front view of the conventional pin probe. The figure is a sectional view taken along the line BB in FIG. 8, and FIG. 10 is an explanatory diagram when measuring points at extremely small intervals using a conventional pin probe. 5, 51-54...Sleeve, 6, 61-64
...Measurement pin.
Claims (1)
スリーブに摺動自在に挿通させてなるピンプロー
ブにおいて、前記スリーブを、その切断内周面を
非円形の形状に形成するとともに、前記測定用ピ
ンを、前記スリーブの切断面に対応する断面形状
としたことを特徴とするピンプローブ。 ２ 測定用ピンを屈曲してその先端を該ピンとス
リーブとの同軸中心線より偏位させてなる実用新
案登録請求の範囲第１項記載のピンプローブ。[Claims for Utility Model Registration] 1. A pin probe in which a measuring pin that is brought into point contact with a point to be measured is slidably inserted into a stationary sleeve, and the sleeve is cut with a non-circular inner peripheral surface. A pin probe characterized in that the measuring pin is formed into a shape and has a cross-sectional shape corresponding to a cut surface of the sleeve. 2. The pin probe according to claim 1, which is a utility model, and is formed by bending a measuring pin so that its tip is deviated from the coaxial center line between the pin and the sleeve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7166286U JPS62182468U (en) | 1986-05-12 | 1986-05-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7166286U JPS62182468U (en) | 1986-05-12 | 1986-05-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62182468U true JPS62182468U (en) | 1987-11-19 |
Family
ID=30914416
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7166286U Pending JPS62182468U (en) | 1986-05-12 | 1986-05-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62182468U (en) |
-
1986
- 1986-05-12 JP JP7166286U patent/JPS62182468U/ja active Pending