JPS62128304U - - Google Patents
Info
- Publication number
- JPS62128304U JPS62128304U JP1531386U JP1531386U JPS62128304U JP S62128304 U JPS62128304 U JP S62128304U JP 1531386 U JP1531386 U JP 1531386U JP 1531386 U JP1531386 U JP 1531386U JP S62128304 U JPS62128304 U JP S62128304U
- Authority
- JP
- Japan
- Prior art keywords
- anvil
- spindle
- probe
- collar
- shaped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 3
Landscapes
- Length-Measuring Instruments Using Mechanical Means (AREA)
Description
第１図は、この考案の一実施例を示す溝測定マ
イクロメータの概略図、第２図は、この考案に係
る溝測定マイクロメータでの測定例を示す図、第
３図は、この考案の他の実施例を示す図、第４図
は従来の溝測定マイクロメータを示す概略図、第
５図は従来の溝測定マイクロメータでの測定例を
示す図、第６図は、底面を有する被測定物、突起
を有する被測定物を示す図である。
図において、１はスピンドル、２はツバ形状の
スピンドル測定子、３はアンビル、４はツバ形状
のアンビル測定子、５はスリーブ、６はシンプル
である。なお、図中同一符号は同一または相当部
分を示す。
FIG. 1 is a schematic diagram of a groove measuring micrometer according to an embodiment of this invention, FIG. 2 is a diagram showing an example of measurement using the groove measuring micrometer according to this invention, and FIG. 4 is a schematic diagram showing a conventional groove measuring micrometer, FIG. 5 is a diagram showing an example of measurement using a conventional groove measuring micrometer, and FIG. 6 is a diagram showing a measurement example using a conventional groove measuring micrometer. FIG. 3 is a diagram illustrating an object to be measured and an object to be measured having protrusions. In the figure, 1 is a spindle, 2 is a collar-shaped spindle probe, 3 is an anvil, 4 is a collar-shaped anvil probe, 5 is a sleeve, and 6 is a simple probe. Note that the same reference numerals in the figures indicate the same or corresponding parts.
Claims (1)
に移動するスピンドルと、アンビルと、上記スピ
ンドルの先端に設けられた鍔形状のスピンドル測
定子と、上記アンビルの先端に設けられた鍔形状
のアンビル測定子とを備えたマイクロメータにお
いて、上記スピンドル測定子の外周形状を、上記
アンビル測定子の外周形状より小さくした事を特
徴とするマイクロメータ。 a thimble, a spindle coupled to the thimble and movable in the axial direction, an anvil, a collar-shaped spindle gauge provided at the tip of the spindle, and a collar-shaped anvil gauge provided at the tip of the anvil. A micrometer characterized in that the outer circumferential shape of the spindle probe is smaller than the outer circumferential shape of the anvil probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1531386U JPS62128304U (en) | 1986-02-05 | 1986-02-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1531386U JPS62128304U (en) | 1986-02-05 | 1986-02-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62128304U true JPS62128304U (en) | 1987-08-14 |
Family
ID=30806128
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1531386U Pending JPS62128304U (en) | 1986-02-05 | 1986-02-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62128304U (en) |
-
1986
- 1986-02-05 JP JP1531386U patent/JPS62128304U/ja active Pending