JPS62173889U - - Google Patents

Info

Publication number
JPS62173889U
JPS62173889U JP6212886U JP6212886U JPS62173889U JP S62173889 U JPS62173889 U JP S62173889U JP 6212886 U JP6212886 U JP 6212886U JP 6212886 U JP6212886 U JP 6212886U JP S62173889 U JPS62173889 U JP S62173889U
Authority
JP
Japan
Prior art keywords
section
test pattern
optical path
path length
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6212886U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6212886U priority Critical patent/JPS62173889U/ja
Publication of JPS62173889U publication Critical patent/JPS62173889U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の光学系の概略図、
第2図は第1図の一部分の説明図、第3図は本考
案に係るテストパターンの他の実施例の説明図で
ある。図中1は光源、2はコンデンサーレンズ、
10はテストパターン、3は網点パターン部、4
,30は光路長調整部、5は投影レンズ、6は撮
像素子、26はグレースケール部、32は直線チ
ヤート部である。
FIG. 1 is a schematic diagram of an optical system according to an embodiment of the present invention.
FIG. 2 is an explanatory diagram of a part of FIG. 1, and FIG. 3 is an explanatory diagram of another embodiment of the test pattern according to the present invention. In the figure, 1 is a light source, 2 is a condenser lens,
10 is a test pattern, 3 is a halftone pattern part, 4
, 30 is an optical path length adjustment section, 5 is a projection lens, 6 is an image pickup device, 26 is a gray scale section, and 32 is a linear chart section.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] テストパターンを投影レンズにより所定面上に
投影するテストパターン投影装置において、前記
テストパターンは一平面上に網点を配置したグレ
ースケール部を有する網点パターン部と該網点パ
ターン部のグレースケール部を通過する光束と他
の部分を通過する光束との光学的光路長を異なら
しめる光路長調整部とを有していることを特徴と
するテストパターン投影装置。
In a test pattern projection device that projects a test pattern onto a predetermined surface using a projection lens, the test pattern includes a halftone dot pattern section having a grayscale section in which halftone dots are arranged on one plane, and a grayscale section of the halftone dot pattern section. 1. A test pattern projection device comprising: an optical path length adjustment section that makes the optical path length of a light beam passing through the area different from that of a light beam passing through another part.
JP6212886U 1986-04-24 1986-04-24 Pending JPS62173889U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6212886U JPS62173889U (en) 1986-04-24 1986-04-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6212886U JPS62173889U (en) 1986-04-24 1986-04-24

Publications (1)

Publication Number Publication Date
JPS62173889U true JPS62173889U (en) 1987-11-05

Family

ID=30896104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6212886U Pending JPS62173889U (en) 1986-04-24 1986-04-24

Country Status (1)

Country Link
JP (1) JPS62173889U (en)

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