JPS62173063U - - Google Patents
Info
- Publication number
- JPS62173063U JPS62173063U JP6063986U JP6063986U JPS62173063U JP S62173063 U JPS62173063 U JP S62173063U JP 6063986 U JP6063986 U JP 6063986U JP 6063986 U JP6063986 U JP 6063986U JP S62173063 U JPS62173063 U JP S62173063U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- integrated circuit
- tip
- main body
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 7
- 238000007689 inspection Methods 0.000 claims 1
- 239000012212 insulator Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第1図は本考案の一実施例のプローブの構成図
、第2図は従来のプローブの構成図である。 1……プローブ本体、2……プローブ針、3…
…ガード、4,5……集積回路の端子。
、第2図は従来のプローブの構成図である。 1……プローブ本体、2……プローブ針、3…
…ガード、4,5……集積回路の端子。
Claims (1)
- 集積回路パツケージ検査用プローブにおいて、
本体の先端部分にプローブ針に対する絶縁体のカ
ードを有することを特徴とするプローブ。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6063986U JPS62173063U (ja) | 1986-04-21 | 1986-04-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6063986U JPS62173063U (ja) | 1986-04-21 | 1986-04-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62173063U true JPS62173063U (ja) | 1987-11-04 |
Family
ID=30893224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6063986U Pending JPS62173063U (ja) | 1986-04-21 | 1986-04-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62173063U (ja) |
-
1986
- 1986-04-21 JP JP6063986U patent/JPS62173063U/ja active Pending