JPS62173045U - - Google Patents

Info

Publication number
JPS62173045U
JPS62173045U JP6160586U JP6160586U JPS62173045U JP S62173045 U JPS62173045 U JP S62173045U JP 6160586 U JP6160586 U JP 6160586U JP 6160586 U JP6160586 U JP 6160586U JP S62173045 U JPS62173045 U JP S62173045U
Authority
JP
Japan
Prior art keywords
optical disk
readout signal
measuring device
scratch
reference level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6160586U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6160586U priority Critical patent/JPS62173045U/ja
Publication of JPS62173045U publication Critical patent/JPS62173045U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は本考案の光デイスクのキズ測定装置の
一実施例を示す構成図、第２図はその動作状態を
示す波形図、第３図は従来の光デイスクのキズ測
定装置の一例を示す構成図、第４図および第５図
はその動作状態を示す波形図である。 １……光デイスク、２……測定ヘツド、３……
比較回路、４……ハイパスフイルタ、５……キズ
パルス分析器。 Fig. 1 is a configuration diagram showing an embodiment of the optical disc scratch measuring device of the present invention, Fig. 2 is a waveform diagram showing its operating state, and Fig. 3 is an example of a conventional optical disc scratch measuring device. The configuration diagram, FIGS. 4 and 5 are waveform diagrams showing the operating state thereof. 1... Optical disk, 2... Measuring head, 3...
Comparison circuit, 4...high pass filter, 5...flaw pulse analyzer.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 光デイスクの反射率に比例した読出し信号を一
定の基準レベルと比較し読出し信号のレベル変化
からキズの有無を検出するようにした光デイスク
のキズ測定装置において、前記読出し信号を基準
レベルと比較する比較回路の前にハイパスフイル
タを挿入してなる光デイスクのキズ測定装置。 In an optical disk scratch measuring device that compares a readout signal proportional to the reflectance of the optical disk with a constant reference level and detects the presence or absence of a scratch from a change in the level of the readout signal, the readout signal is compared with the reference level. An optical disk scratch measuring device that has a high-pass filter inserted before the comparison circuit.
JP6160586U 1986-04-23 1986-04-23 Pending JPS62173045U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6160586U JPS62173045U (en) 1986-04-23 1986-04-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6160586U JPS62173045U (en) 1986-04-23 1986-04-23

Publications (1)

Publication Number Publication Date
JPS62173045U true JPS62173045U (en) 1987-11-04

Family

ID=30895091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6160586U Pending JPS62173045U (en) 1986-04-23 1986-04-23

Country Status (1)

Country Link
JP (1) JPS62173045U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008111830A (en) * 2006-10-02 2008-05-15 Hitachi High-Technologies Corp Method and device for detecting peripheral surface defect of disk
JP2008122365A (en) * 2006-10-16 2008-05-29 Hitachi High-Technologies Corp Optical system for detecting peripheral surface defect of glass disk, and device for detecting peripheral surface defect thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008111830A (en) * 2006-10-02 2008-05-15 Hitachi High-Technologies Corp Method and device for detecting peripheral surface defect of disk
JP2008122365A (en) * 2006-10-16 2008-05-29 Hitachi High-Technologies Corp Optical system for detecting peripheral surface defect of glass disk, and device for detecting peripheral surface defect thereof

Similar Documents

Publication Publication Date Title
JPS62173045U (en)
JPS62173046U (en)
JPS6027347U (en) Appearance test device for striatum
JPS6444453U (en)
JPS5842752U (en) Cow blood measurement color chart
JPS59180296U (en) magnetic storage device
JPS62175457U (en)
JPS60183832U (en) Vibration measuring device
JPH0195652U (en)
JPS5871895U (en) Gas leak alarm device
JPH0349628U (en)
JPH01104859U (en)
JPS5812820U (en) waveform recording device
JPS6085746U (en) Tape recorder reel stand rotation detection device
JPS60149228U (en) FM demodulator
JPH01179240U (en)
JPS6023985U (en) tape cassette
JPS60143306U (en) Light reflective distance sensor
JPS5985959U (en) Ultrasonic flaw detection probe
JPS614329U (en) optical fiber sensor
JPS62201016U (en)
JPS6415334U (en)
JPS6132934U (en) Liquid level detection device
JPS5925489U (en) Ultrasonic receiving circuit
JPS5825102U (en) pulse detection circuit