JPS62168333A - Mass spectrometry - Google Patents
Mass spectrometryInfo
- Publication number
- JPS62168333A JPS62168333A JP28708085A JP28708085A JPS62168333A JP S62168333 A JPS62168333 A JP S62168333A JP 28708085 A JP28708085 A JP 28708085A JP 28708085 A JP28708085 A JP 28708085A JP S62168333 A JPS62168333 A JP S62168333A
- Authority
- JP
- Japan
- Prior art keywords
- ion
- mass
- grandchild
- electric field
- field intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004949 mass spectrometry Methods 0.000 title claims abstract description 10
- 230000005684 electric field Effects 0.000 claims abstract description 14
- 238000004458 analytical method Methods 0.000 claims description 12
- 150000002500 ions Chemical class 0.000 abstract description 94
- 238000003776 cleavage reaction Methods 0.000 abstract description 21
- 230000007017 scission Effects 0.000 abstract description 13
- 238000000034 method Methods 0.000 abstract description 9
- 230000001133 acceleration Effects 0.000 abstract description 7
- 238000005259 measurement Methods 0.000 abstract description 6
- 238000001228 spectrum Methods 0.000 abstract description 5
- 230000003213 activating effect Effects 0.000 abstract 1
- 238000004611 spectroscopical analysis Methods 0.000 abstract 1
- 230000004913 activation Effects 0.000 description 3
- 230000007935 neutral effect Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000001819 mass spectrum Methods 0.000 description 2
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000005015 mass analyzed ion kinetic energy spectroscopy Methods 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
【発明の詳細な説明】
イ 産業上の利用分野
本発明は質量分析の一手法でイオンの開裂反応を追跡す
る方法に関する。DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a method for tracking ion cleavage reactions using a mass spectrometry technique.
口 従来の技術
質量分析で試料をイオン化した場合多種のイオンが生成
されるが、それらの中には更に自然に新しいイオンと中
性分子とに開裂する準安定イオンがある。またイオンに
適当な分子を衝突させると、その衝撃でイオンが開裂し
て新しいイオンと中性分子とになる。ごのようなイオン
の開裂反応で開裂前のイオンを親イオン、解裂によって
生じたイオンを娘イオンと呼ぶ。所でこの娘イオンの中
にも更に開裂するものがあって孫イオンが生成される。When a sample is ionized using conventional mass spectrometry techniques, a wide variety of ions are generated, among which are metastable ions that spontaneously cleave into new ions and neutral molecules. Furthermore, when an appropriate molecule collides with an ion, the ion is cleaved by the impact and becomes a new ion and a neutral molecule. In an ion cleavage reaction like this, the ion before cleavage is called the parent ion, and the ion produced by the cleavage is called the daughter ion. By the way, some of these daughter ions are further cleaved and grandchild ions are generated.
従って一種類のイオンから解裂によって生成されるイオ
ンの系列ができるが、このようなイオンの系図を調べる
ことによって有機分析上有益な情報が得られる。Therefore, a series of ions are generated by dissociation from one type of ion, and useful information for organic analysis can be obtained by examining the family tree of such ions.
上述したような調査を行うためには、先づ質量分析によ
って特定質量のイオンを選別し、このイオンの開裂によ
って生じた娘イオンから更に別の特定質量のイオンを選
別し、このようにして選別された特定質量の娘イオンの
開裂によって生ずる孫イオンの質量スペクトルを測定す
ることになる。In order to conduct the above-mentioned investigation, first select an ion with a specific mass by mass spectrometry, then select another ion with a specific mass from the daughter ions generated by the cleavage of this ion, and perform the selection in this way. The mass spectrum of the grandchild ions produced by the cleavage of the daughter ions of a specific mass will be measured.
従って従来このような分析を行うための装置は一つの質
量分析部とそれに続く第1のエネルギー分析部と、第1
のエネルギー分析部に続く第くのエネルギー分析部の三
部分の配置が必要で、一台の二重収束型質量分析計では
測定ができなかった。Therefore, conventional equipment for performing such analysis consists of one mass spectrometry section, a first energy analysis section following it, and a first energy analysis section.
This required the arrangement of three energy analysis sections, one followed by a third energy analysis section, and measurements could not be performed with a single double-focusing mass spectrometer.
ハ 発明が解決しようとする問題点
本発明は磁場先行二重収束型質量分析計一台を用いて、
上述した孫イオンの質量分析を可能にしようとするもの
である。C. Problems to be Solved by the Invention The present invention uses a single magnetic field leading double focusing mass spectrometer to
This is intended to enable mass spectrometry of the grandchild ions mentioned above.
二 問題点解決のための手段
イオン源と質量分析部との間(第1自由空間)で開裂反
応により生じた種々な娘イオンのうち、質量Mpの親イ
オンから生じた質量Mdの娘イオンが質量分析部を通過
できるように磁場設定を行い、質量分析部とエネルギー
分析部との間の空間(第2自由空間)で上記娘イオンの
開裂によって生じた孫イオンについてエネルギー分析部
で運動エネルギーの分析を行うようにした。2. Means for solving the problem Among the various daughter ions generated by the cleavage reaction between the ion source and the mass spectrometer (first free space), the daughter ion with mass Md generated from the parent ion with mass Mp is The magnetic field is set so that it can pass through the mass spectrometer, and the kinetic energy of the grandchild ion generated by the cleavage of the daughter ion is measured in the space between the mass spectrometer and the energy analyzer (second free space) in the energy analyzer. I started doing analysis.
ホ 作用
イオン開裂反応は試料がイオン化されたときから始まっ
てイオンの種類によって決まる一定の反応速度で進行す
るものであるから、質量分析計内のイオン軌道上どの位
置でも開裂反応は起っている。このうち本発明はイオン
源と質量分析部との間の第1自由空間で起る開裂を測定
に利用するのである。開裂反応によってイオンの速度は
変らないので、親イオンの質量をMp、イオン加速電圧
によって決まる運動のエネルギーをEpとし、娘イオン
の質量をMd、運動のエネルギーをEd、孫イオンの質
量をMg、運動のエネルギーをEgとすると、
今イオン加速電圧Vにおいて質11LMpのイオンが磁
場を通過できるための磁場強度をBpとする。E The ion cleavage reaction starts when the sample is ionized and proceeds at a constant reaction rate determined by the type of ion, so the cleavage reaction can occur at any position on the ion trajectory within the mass spectrometer. . Of these, the present invention utilizes the cleavage that occurs in the first free space between the ion source and the mass spectrometer for measurement. Since the speed of the ion does not change due to the cleavage reaction, the mass of the parent ion is Mp, the kinetic energy determined by the ion acceleration voltage is Ep, the mass of the daughter ion is Md, the kinetic energy is Ed, the mass of the grandchild ion is Mg, If the kinetic energy is Eg, then let Bp be the magnetic field strength that allows an ion of quality 11LMp to pass through the magnetic field at the ion acceleration voltage V.
第1自由空間で生じた娘イオンMdは質量Mlの親イオ
ンが加速電圧Vで加速されたよりもエネルギーが少く、
そのエネルギーEdは
である。つまり娘イオンMdは質量Mfの親イオンを加
速電圧を
なるV′に下げたのと同じ運動のエネルギーを持ってい
る。従ってこのような娘イオンが質量分析部を通過でき
るようにするための磁場強度Bdはで与えられる。磁場
強度を上式に従って決める代りに磁場強度をBpに設定
してイオン加速電圧の万をVのMp/Md倍に設定する
ようにしてもよい。このようにして質量分析部によって
第1自由間空で質量Mpの親イオンから生じた娘イオン
のうち質ffiMdのイオンが選択される。この娘イオ
ンが第2自由空間で開裂して生じる孫イオンの運動エネ
ルギーと質量との関係は前述したようにであるからエネ
ルギー分析部の印加電圧を掃引してエネルギースペクト
ルを測定すれば、エネルギーと質量とが比例しており、
エネルギースペクトルが孫イオンの質量スペクトルを表
わt。The daughter ion Md generated in the first free space has less energy than the parent ion with mass Ml accelerated by the acceleration voltage V,
Its energy Ed is. In other words, the daughter ion Md has the same kinetic energy as the parent ion with mass Mf whose acceleration voltage is lowered to V'. Therefore, the magnetic field strength Bd for allowing such daughter ions to pass through the mass spectrometer is given by: Instead of determining the magnetic field strength according to the above formula, the magnetic field strength may be set to Bp, and the ion acceleration voltage may be set to Mp/Md times V. In this way, the mass spectrometer selects ions of quality ffiMd among the daughter ions generated from the parent ion of mass Mp in the first free space. The relationship between the kinetic energy and mass of the grandchild ions produced by this daughter ion cleavage in the second free space is as described above, so if the applied voltage of the energy analyzer is swept and the energy spectrum is measured, the energy and mass can be measured. It is proportional to the mass,
The energy spectrum represents the mass spectrum of the grandchild ion.
へ 実施例 図は本発明方法を実施する装置の一例を示す。Example The figure shows an example of a device for carrying out the method of the invention.
Isはイオン源、Bは質量分析用磁場、Eはエネルギー
分析用電場、Dはイオン検出器で、全体は、磁場先行型
二重収束質量分析計を構成している。Is is an ion source, B is a magnetic field for mass analysis, E is an electric field for energy analysis, and D is an ion detector, and the whole constitutes a magnetic field leading type double focus mass spectrometer.
図で1st、FFRとあるのが第1自由空間、2ndF
FRとあるのが第2自由空間である。イオンの開裂反応
はイオン源から検出器りに至るイオン軌道上のどこでで
も起っているが、本発明は第1自由空間で親イオンが開
裂して生じた娘イオンのうち第2自由空間迄来た娘イオ
ンが第2自由空間で開裂して生じた孫イオンを選別して
検出するものである。In the figure, 1st and FFR are the 1st free space and 2ndF.
FR is the second free space. Ion cleavage reactions occur anywhere on the ion trajectory from the ion source to the detector, but the present invention deals with daughter ions generated by the cleavage of parent ions in the first free space up to the second free space. This is to select and detect grandchild ions produced by cleavage of the incoming daughter ions in the second free space.
今第1図の装置を通常の質量分析に用いて、質量Mpの
イオンを検出するように設定したときのイオン加速電圧
をV、磁場強度をBp、エネルギー分析部の電場強度を
Fpとする。こ\で親イオンの質量をMp、娘イオンの
質量をMd、孫イオンの質量をMgとし、夫々の運動の
エネルギーをEl)t Ed、Egとすると、作用の
項で述べた(1)。Now, when the apparatus shown in FIG. 1 is used for normal mass spectrometry and is set to detect ions of mass Mp, the ion acceleration voltage is V, the magnetic field strength is Bp, and the electric field strength of the energy analysis section is Fp. Here, the mass of the parent ion is Mp, the mass of the daughter ion is Md, the mass of the grandchild ion is Mg, and the kinetic energies of each are El)t, Ed, and Eg, as described in the action section (1).
(2)式が成立つ。葭記(3)式により磁場強度B(l
を設定したとき質量Mdの娘イオンが電場Eを通過する
ようにした場合の電場強度Fdは
孫イオンの質量MgはMdより小さいから、孫イオンの
エネルギースペクトルは電場強度を掃引したとき、電場
強度がFdより低い所に現れる。そして質量Mgの孫イ
オンが検出されるときの電場強度Fgは
で与えられる。Equation (2) holds true. The magnetic field strength B(l
When the daughter ion with mass Md is set to pass through the electric field E, the electric field strength Fd is the grandchild ion's mass Mg is smaller than Md, so the energy spectrum of the grandchild ion is the electric field strength when the electric field strength is swept. appears below Fd. The electric field strength Fg when a grandchild ion of mass Mg is detected is given by:
なお上の説明では親イオンも娘イオンも準安定イオンで
自然開裂する場合を扱っているが、イオンに中性分子を
衝突させて強制的に開裂反応を起させる衝突活性化法を
用いる場合でも本発明が適用できることは云うまでもな
い。例えば娘イオンの開裂に衝突活性化法を利用すると
きは図の点線位置に衝突室CCを設置すればよい。衝突
室は前後にイオン通過孔を有する箱でHe等の衝突ガス
が導入されるようになっている。親イオンの開裂に衝突
活性化法を用いるときは、図のイオン源■。Although the above explanation deals with the case where both the parent ion and the daughter ion are metastable ions and undergo spontaneous cleavage, it is also possible to use the collisional activation method in which the ion is bombarded with a neutral molecule to force a cleavage reaction. It goes without saying that the present invention is applicable. For example, when using the collisional activation method to cleave daughter ions, the collision chamber CC may be installed at the position indicated by the dotted line in the figure. The collision chamber is a box having ion passage holes at the front and rear, into which a collision gas such as He is introduced. When using the collisional activation method to cleave the parent ion, use the ion source ■ in the figure.
Sの前方の入口スリットSの直後に衝突室を設置すれば
よい。A collision chamber may be installed immediately after the entrance slit S in front of the S.
ト 効果
本発明方法によれば二重収束型質量分析計一台で一つの
親イオンが開裂を繰返して行く反応の追跡が可能となり
、通常の質量分析、一つの親イオンから生ずる娘イオン
の質量スペクトルの測定(MIKES測定)と合せて三
通りの測定が一台の質量分析計で可能となる。G. Effects According to the method of the present invention, it is possible to track the reaction in which one parent ion undergoes repeated cleavage with a single double-focusing mass spectrometer. Including spectrum measurement (MIKES measurement), three types of measurements are possible with one mass spectrometer.
図面は本発明の一実施例装置の平面図である。 The drawing is a plan view of an apparatus according to an embodiment of the present invention.
Claims (1)
質量分析装置を用い、質量Mpの親イオンが検出される
場合の磁場強度Bp、エネルギー分析部の電場強度Fp
に対して、質量分析部の磁場Bdを Bd=(Md/Mp)Bp Md<Mp に設定し、エネルギー分析部の設定電場をFgとすると
き、検出されるイオンの質量Mgを Fg=(Mg/Mp)Fp によつて決定することを特徴とする質量分析方法。[Claims] Magnetic field strength Bp and electric field strength Fp of the energy analysis section when a parent ion with mass Mp is detected using a mass spectrometer in which a mass spectrometry section precedes and an energy analysis section follows.
In contrast, when the magnetic field Bd of the mass spectrometer is set as Bd=(Md/Mp)Bp Md<Mp and the electric field set in the energy analyzer is Fg, the mass Mg of the detected ion is Fg=(Mg /Mp)Fp.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28708085A JPS62168333A (en) | 1985-12-20 | 1985-12-20 | Mass spectrometry |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28708085A JPS62168333A (en) | 1985-12-20 | 1985-12-20 | Mass spectrometry |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62168333A true JPS62168333A (en) | 1987-07-24 |
Family
ID=17712795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28708085A Pending JPS62168333A (en) | 1985-12-20 | 1985-12-20 | Mass spectrometry |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62168333A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105209897A (en) * | 2013-03-15 | 2015-12-30 | 史密斯探测-沃特福特有限公司 | Ion modification |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5546420A (en) * | 1978-09-29 | 1980-04-01 | Hitachi Ltd | Mass spectroscope |
-
1985
- 1985-12-20 JP JP28708085A patent/JPS62168333A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5546420A (en) * | 1978-09-29 | 1980-04-01 | Hitachi Ltd | Mass spectroscope |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105209897A (en) * | 2013-03-15 | 2015-12-30 | 史密斯探测-沃特福特有限公司 | Ion modification |
CN105209897B (en) * | 2013-03-15 | 2018-10-16 | 史密斯探测-沃特福特有限公司 | ion modification |
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