JPS62168331A - Mass spectrograph - Google Patents

Mass spectrograph

Info

Publication number
JPS62168331A
JPS62168331A JP60287078A JP28707885A JPS62168331A JP S62168331 A JPS62168331 A JP S62168331A JP 60287078 A JP60287078 A JP 60287078A JP 28707885 A JP28707885 A JP 28707885A JP S62168331 A JPS62168331 A JP S62168331A
Authority
JP
Japan
Prior art keywords
collision chamber
ion
ions
slit
base plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60287078A
Other languages
Japanese (ja)
Inventor
Toshiya Kubodera
窪寺 俊也
Takehiro Takeda
武弘 竹田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP60287078A priority Critical patent/JPS62168331A/en
Publication of JPS62168331A publication Critical patent/JPS62168331A/en
Pending legal-status Critical Current

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  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

PURPOSE:To simplify the putting in and out works of a collision chamber and shorten the time of evacuation, by installing a slit and the collision chamber side by side on a same base plate, and making the base plate slide in a direction vertical to the orbit of ions from the outside of a vacuum receptacle. CONSTITUTION:A collision chamber (C) is installed on a base plate (P) beside a slit (S). The collision chamber is one box, and its front and rear walls in an ion transmission direction are provided with openings (a) through which ions are able to be transmitted, so that a gas for activating the cillision can be introduced. Then, either the slit (S) or the collision chamber (C) can be located on the orbit (Ob) of ions, by sliding the base plate (P). Thus, they can be switched simply and quickly, and the vacuum of a mass spectrograph is not broken, so that the time of evacuation can be shortened.

Description

【発明の詳細な説明】 イ 産業上の利用分野 本発明は質量分析の一手法であるM I K E S 
CMass  analysed  Ion  Kin
e【旨 E n e r g y  S p e c 
t ’W)の測定を行う装置に関する。
[Detailed Description of the Invention] A. Field of Industrial Application The present invention is a method of mass spectrometry.
CMass analyzed Ion Kin
e [effect E n e r g y Spec
The present invention relates to an apparatus for measuring t'W).

口 従来の技術 通常の質量分析法は試料をイオン化し、それらのイオン
の質量スペクトルを測定するものであるが、試料をイオ
ン化することによって生成される多種のフラグメントイ
オンの中には、それ自身が更に自然に新しいイオンと中
性分子とに開裂する準安定イオンが存在する。またイオ
ンに適当な分子を衝突させると、その衝撃によりイオン
が活性化されて上述したような開裂反応を起す。そこで
指定したもとのイオン(親イオン〕から開裂によってど
のようなイオンC娘イオン)が生ずるかを調べることに
よって分析上の有力な情報が得られる。このような調査
に用いられる手法がMIKES測定法であって、質量分
析によって特定の質量のイオンを選別し、その選別され
たイオンの開裂によって生じた娘イオンの運動エネルギ
ーのスペクトルを測定するのである。イオンの開裂反応
の荊後で親イオンの速度と娘イオンの速度は同じである
から、親イオンの質量をMO1運動のエネルギーをEO
%娘イオンの質量をM、運動のエネルこ\でEoはイオ
ンの加速電圧で決まり既知であるから、運動エネルギー
Eのスペクトルは娘イオンの質量スペクトルを表わすこ
とになる。
Conventional technology Conventional mass spectrometry involves ionizing a sample and measuring the mass spectra of those ions. Additionally, there are metastable ions that spontaneously cleave into new ions and neutral molecules. Furthermore, when an appropriate molecule collides with the ion, the ion is activated by the impact and causes the above-mentioned cleavage reaction. Therefore, useful analytical information can be obtained by investigating what kind of ion (C daughter ion) is produced by cleavage from the specified original ion (parent ion). The method used for such investigations is the MIKES measurement method, which selects ions with a specific mass using mass spectrometry and measures the kinetic energy spectrum of daughter ions generated by the cleavage of the selected ions. . After the ion cleavage reaction, the velocity of the parent ion and the velocity of the daughter ion are the same, so the mass of the parent ion is MO1, the energy of motion is EO
% The mass of the daughter ion is M, and the kinetic energy Eo is determined by the acceleration voltage of the ion and is known, so the spectrum of the kinetic energy E represents the mass spectrum of the daughter ion.

MIKESの測定には磁場先行型二重収束質量分析計を
用いるが、前述したようにMIKES測定には準安定状
態の親イオンの自然開裂によって生じる娘イオンのスペ
クトルを測定する場合と、衝突活性化によって強制的に
親イオンの開裂を起させて娘イオンのスペクトルを測定
する場合とがある。後者の測定を行うには質量分析部と
エネルギー分析部との間のイオン軌道上に前後にイオン
が通過する開口を有する衝突室を設け、この室内にHe
等の適当なガスを導入して同室を通過するイオンと衝突
させるようにする。
MIKES measurements use a magnetic field-leading double-focusing mass spectrometer, but as mentioned above, MIKES measurements involve two methods: measuring the spectrum of daughter ions generated by spontaneous cleavage of a parent ion in a metastable state, and two methods using collisional activation. In some cases, the parent ion is forcibly cleaved and the spectrum of the daughter ion is measured. To perform the latter measurement, a collision chamber with an opening through which ions pass back and forth on the ion trajectory between the mass spectrometer and the energy analyzer is provided, and He is placed in this chamber.
A suitable gas such as ions is introduced to collide with the ions passing through the same chamber.

ハ 発明が解決しようとする問題点 上述したように衝突活性化を用いたMIKES測定には
装置内に衝突室を設ける必要がある。このため従来一つ
の質量分析計で何れのMIKES測定も実施しようとす
ると、両方のM I K E S測定の切換えの度に衝
突室を質量分析計に出入れしなくてはならず、質量分析
計は高真空を要する装置であるから、乙の衝突室の出入
れの作業は大変面倒であり、真空排犠に時間がか\って
甚だ非能率であった。
C. Problems to be Solved by the Invention As mentioned above, it is necessary to provide a collision chamber within the apparatus for MIKES measurement using collision activation. For this reason, conventionally, when attempting to perform either MIKES measurement with a single mass spectrometer, the collision chamber must be moved in and out of the mass spectrometer every time both MIKES measurements are switched, and the mass spectrometer Since the analyzer is a device that requires high vacuum, the work of moving it in and out of the collision chamber was very troublesome, and it was extremely inefficient as it took time to evacuate the vacuum.

本発明は上述した2種のMIKES測定の切換えに関す
る問題点を解消しようとするものである。
The present invention attempts to solve the above-mentioned problems regarding switching between the two types of MIKES measurements.

二 問題点解決のための手段 質量分析部とエネルギー分析部との間のイオン軌道上に
設置されるべきスリットと衝突室とを同一基板上に並べ
て取付け、真空容器の外から上記基板を上記イオン軌道
と直角の方向にスライドさせるようにした。
2. Means for solving the problem: A slit to be installed on the ion trajectory between the mass spectrometry section and the energy analysis section and a collision chamber are installed side by side on the same substrate, and the above substrate is connected to the ion beam from outside the vacuum container. Made it slide in a direction perpendicular to the orbit.

ホ 作用 スリットと衝突室とは同一基板上に取付けられ、基板が
真空容器外からイオン軌道と直角の方向ζこスライドで
きるので、スリット、衝突室の何れかを任意にイオン軌
道上に位置させろことができ、従って通常の質量分析及
び準安定イオンの自然解裂におけるMIKES測定時に
はスリットをイオン軌道上に位置させ、衝突活性化によ
るtKES測定には衝突室をイオン軌道上に位置させれ
ばよく、この切換操作は真空容器外からの基板のスライ
ド操作だけでできるので大へに簡単であり、質I分析計
の真空を破る必要もなく能率的である〇へ 実施例 図は本発明の一実施例の平面図である。この実施例は質
量分析部及びエネルギー分析部が共に磁場及び電場で構
成されたBE@EB型の二重収束型質量分析計である。
E. The working slit and the collision chamber are mounted on the same substrate, and the substrate can be slid in the direction perpendicular to the ion trajectory from outside the vacuum chamber, so either the slit or the collision chamber can be positioned on the ion trajectory as desired. Therefore, for MIKES measurements in normal mass spectrometry and spontaneous dissociation of metastable ions, the slit should be located on the ion trajectory, and for tKES measurements by collisional activation, the collision chamber should be located on the ion trajectory. This switching operation can be performed by simply sliding the substrate from outside the vacuum container, so it is extremely simple and efficient without the need to break the vacuum of the quality I analyzer. FIG. 2 is a plan view of an example. This embodiment is a BE@EB type double convergence mass spectrometer in which both the mass spectrometry section and the energy analysis section are composed of a magnetic field and an electric field.

■はイオン源、B1は質量分析部の磁場、Elは質量分
析部の電場で、B2はエネルギー分析部の電場、B2は
エネルギー分析部の磁場である3Dはイオン検出器、P
は真空容器Vの外からスライド操作される基板で、その
スライド方向はイオン軌道obと直角の方向である。基
板PにはスリットSが設けられ、このスリットのイオン
軌道上の位置はBl、Elよりなる質量分析部を出たイ
オン束の収束点になっている。
■ is the ion source, B1 is the magnetic field of the mass spectrometer, El is the electric field of the mass spectrometer, B2 is the electric field of the energy analyzer, B2 is the magnetic field of the energy analyzer, 3D is the ion detector, P
is a substrate that is slid from outside the vacuum vessel V, and its sliding direction is perpendicular to the ion trajectory ob. A slit S is provided in the substrate P, and the position of this slit on the ion trajectory is the convergence point of the ion flux leaving the mass spectrometer composed of Bl and El.

基板PにはスリットSの横に衝突室Cが取付けられてい
る。衝突室は一つの箱でイオン通過方向の前後の壁にイ
オンが通過できる開口aが設けられており、衝突活性化
用のガスが導入できるようになっている。基板Pをスラ
イドさせることにより、スリットS、衝突室Cの何れか
をイオン軌道ob上に位置させることができる。
A collision chamber C is attached to the substrate P beside the slit S. The collision chamber is a single box, and openings a through which ions can pass are provided in the front and rear walls in the ion passing direction, so that gas for collision activation can be introduced. By sliding the substrate P, either the slit S or the collision chamber C can be positioned on the ion trajectory ob.

ト 効果 本発明によれば、二種のMIKES測定の切換えが基板
Pのスライド操作だけで出来るので、簡単迅速に切換え
可能で、分析装置の真空を破ることもないから、二種の
MIKES測定更には通常の質量分析も含む一連の分析
が安定した同一条件のもとて能率的に行われるようにな
る。
G. Effect According to the present invention, the two types of MIKES measurements can be switched simply by sliding the substrate P, so switching can be done easily and quickly, and there is no need to break the vacuum of the analyzer. A series of analyzes including conventional mass spectrometry can now be performed efficiently under stable and identical conditions.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明の一実施例の平面図である。 The drawing is a plan view of one embodiment of the present invention.

Claims (1)

【特許請求の範囲】[Claims] 質量分析部とエネルギー分析部とよりなり、質量分析部
とエネルギー分析部との間のイオン軌道上に、真空容器
の外からスライド操作可能に基板を設け、この基板上に
スリットとイオンの衝突活性化用の衝突室を設け、同基
板のスライド操作により、スリットと衝突室の何れかを
任意に選択して上記イオン軌道上に位置させ得るように
した質量分析装置。
It consists of a mass spectrometry section and an energy analysis section, and a substrate is provided on the ion trajectory between the mass spectrometry section and the energy analysis section, so that it can be slid from outside the vacuum container. A mass spectrometer is provided with a collision chamber for ionization, and by sliding the substrate, either the slit or the collision chamber can be arbitrarily selected and positioned on the ion trajectory.
JP60287078A 1985-12-20 1985-12-20 Mass spectrograph Pending JPS62168331A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60287078A JPS62168331A (en) 1985-12-20 1985-12-20 Mass spectrograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60287078A JPS62168331A (en) 1985-12-20 1985-12-20 Mass spectrograph

Publications (1)

Publication Number Publication Date
JPS62168331A true JPS62168331A (en) 1987-07-24

Family

ID=17712768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60287078A Pending JPS62168331A (en) 1985-12-20 1985-12-20 Mass spectrograph

Country Status (1)

Country Link
JP (1) JPS62168331A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002110081A (en) * 2000-06-09 2002-04-12 Micromass Ltd Mass spectrometry and device
US9697995B2 (en) 2002-07-24 2017-07-04 Micromass Uk Limited Mass spectrometer with bypass of a fragmentation device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002110081A (en) * 2000-06-09 2002-04-12 Micromass Ltd Mass spectrometry and device
JP4588925B2 (en) * 2000-06-09 2010-12-01 マイクロマス・ユーケイ・リミテッド Mass spectrometry method and apparatus
US9697995B2 (en) 2002-07-24 2017-07-04 Micromass Uk Limited Mass spectrometer with bypass of a fragmentation device
US10083825B2 (en) 2002-07-24 2018-09-25 Micromass Uk Limited Mass spectrometer with bypass of a fragmentation device

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