JPS6215418A - Spectral fluorophotometer - Google Patents

Abstract

PURPOSE:To easily calibrate the wavelength of a fluorospectroscope by providing an optical system which bypasses an excitation spectroscope and sample cell from a light source chamber and respectively providing shutters thereto to select the incident optical paths on the fluorospectroscope. CONSTITUTION:The optical system B which introduces light to the fluorospectroscope Mf by bypassing the excitation spectroscope Me and the sample cell Ce is provided to a spectral fluorophotometer which makes incident the light from the light source chamber 1 on the fluorospectroscope Mf through the sample cell Ce. The shutters 2 and 3 are respectively provided to the optical system B and the optical path of the light from the cell Ce so that the incident light on the spectroscope Mf can be selected. The wavelength calibration of the spectroscope Mf is thus made executable simply by closing the shutter 3 and opening the shutter 2 so as to directly introduce the light from the light source 1 into said spectroscope.

Description

DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a spectrofluorometry system, and particularly to wavelength calibration means for an excitation spectrometer and a fluorescence spectrometer.

BACKGROUND OF THE INVENTION Conventionally, there has been a method of calibrating the wavelength of a spectrofluorometer using the bright line of a mercury lamp, and methods have also been implemented in which a mercury lamp is automatically inserted into the optical path of a spectrophotometer. However, this method requires a mercury lamp in addition to the light source for fluorescence measurement, and it is necessary to insert the mercury lamp into the optical path with some kind of device, which is one factor that drives up the price of spectrofluorometers. . As another method, I of the 1-senone lamp
A calibration method using M is used. As shown in Fig. 3, a mirror m is set at the sample position in the sample chamber C,
Set the excitation spectrometer M e to 0 wavelength, and set the fluorescence spectrometer Mf.
The wavelength is scanned and wavelength calibration is performed by detecting the n gland of the xenon lamp Xe, and the wavelength calibration of the excitation spectrometer Me is performed by using the monitoring photodetector Dm or by setting the fluorescence spectrometer Mf to the O wavelength. , the excitation spectrometer Me is wavelength scanned to detect the bright line of the xenon lamp. This method requires fewer parts for wavelength calibration than the conventional example described above (and its structure may be simple, but it still requires the installation and operation of the mirror m and the installation of some accessory equipment in the sample chamber). The disadvantage is that wavelength calibration cannot be performed while the device is installed.

C2 Problems to be Solved by the Invention The present invention eliminates the drawbacks of the conventional example described above, eliminates the need for an extra light source such as a mercury lamp, its entrance/exit mechanism, installation of a mirror, etc. I installed the attached equipment on
However, the present invention aims to provide a wavelength calibration means for a spectrofluorometer that can perform wavelength calibration.

29 Means for Solving Problems As shown in Figure 1, there is an optical system B that guides light from the light source chamber 1 of the spectrofluorometer to the fluorescence spectrometer Mf without passing through the excitation spectrometer h4e, and this optical system. The spectrofluorometer was equipped with a shutter 2 for passing light passing through the sample cell, and a shutter 3 for passing the light path from the position of the sample cell to the fluorescence spectrometer.

Since a xenon lamp is used as the light source of the HO action spectrofluorometer, wavelength calibration is performed using that light.

When calibrating the wavelength of the fluorescence spectrometer, close the shutter 3 that passes the optical path from the sample cell position to the fluorescence spectrometer.
The wavelength scanning of the fluorescence spectrometer Mf may be performed by opening the shutter 2 that cuts off the optical path of the optical system that guides light from the light source chamber to the fluorescence spectrometer. The wavelength calibration of the excitation spectrometer is performed using the M e of the excitation spectrometer.
What is necessary is to perform wavelength scanning and detect the bright line of the xenon lamp using the monitoring photodetector Dm.

Embodiment FIG. 1 shows an embodiment of the present invention. Me is an excitation spectrometer,
Mf is a fluorescence spectrometer, the emission side optical axis of the excitation spectrometer and the input side optical axis of the fluorescence spectrometer are perpendicular to each other, the intersection is the sample cell position, and Ce J'J (sample cell.■ is X in the light source room
e is the light source Ku1! It is a non-lamp. Reference numeral 4 denotes a beam splitter made of a transparent quartz plate, which is arranged in the optical path of the emitted light of the spectrometer Me, and splits a part of the Me emitted light toward the monitoring light-receiving element Dm. Reference numeral 5 denotes an optical fiber, which constitutes a part of an optical system B that guides light from a 4-7 lamp Xe as a light source to a fluorescence spectrometer Mf. A beam splitter 6 made of a transparent plate is arranged at an angle of 45° between the sample cell position and the fluorescence spectrometer Mf, so that the light emitted from the light output end of the optical fiber 5 is made to enter the fluorescence spectrometer Mf. There is. A shutter 2 is located between the output end of the optical fiber 5 and the beam splitter 6, and is opened and closed by a drive motor 2m. A shutter 3 is located between the sample cell position and the beam splitter 6, and is opened and closed by a drive motor 3m. DO is the photodetector of the fluorescence spectrometer Mf.

FIG. 2 shows the configuration of the control system of the above-mentioned device. Excitation spectrometer M
In e, me is a pulse motor for sending the wavelength of the spectrometer, and Pe
is a wavelength reduction detection element of a spectrometer. Fluorescence spectrometer Mf
, mf is a pulse motor for wavelength feeding, and Pf is an element for detecting the wavelength origin of the spectrometer. Other parts that are the same as those in FIG. 1 are given the same reference numerals. The configuration of the device will be explained as well as an explanation of the operation in the case of wavelength calibration of the excitation spectrometer Me. M'P'U is a microprocessor, 10 is a memory, 1
1 is a data bus, and I'f'l is an interface. In the excitation spectrometer wavelength calibration mode, the MPU closes the switch Sw1 and opens the switch Sw2 to open the monitoring photodetector Dm.
Import the output of MPU first uses excitation spectrometer M
'e Drive to the G wavelength origin. Next, set the count of the wavelength counter for the excitation spectrometer to 0 (origin wavelength). This is a configuration in which the driving pulses sent to the pulse motor me are counted by a wavelength counter and the counted value indicates the wavelength, and the MPU detects the wavelength of the spectrometer based on the counted value of this counter. Next, wavelength scanning of Me is performed, and wavelength 430
The output of the photodetector Dm in the range of ~470 nm is taken into the RAM area of the memory 10 via the A/D converter AD. After that, from the data stored in this RAM area, the wavelength of xenon is 450. Search for the peak of the lnm emission line. The count value Y of the wavelength counter corresponding to the peak of this bright line is usually 450.
．． It is slightly off from 1. Therefore, MPU drives Me so that the count value of the wavelength counter for Me becomes Y,
At that position, set the count value of the wavelength counter to the correct wavelength value of 45.
Reset to 0.1. This completes the wavelength calibration of the excitation spectrometer Me. Furthermore, bright lines having other wavelengths may be used.

Next, the operation of wavelength calibration of the fluorescence spectrometer Mf will be explained. In this case, the MPU opens the switch Swl and closes the switch Sw2 to take in the -0- output of the photodetector DO for the fluorescence spectrometer. Next, signals are sent to shutter drive motors 2m and 3m to open shutter 2 and close shutter 3. Next, drive the fluorescence spectrometer Mf to the wavelength origin, set the wavelength counter for the fluorescence spectrometer to the origin wavelength, perform wavelength scanning, and collect the output data of the photodetector F) at a wavelength of 430 to 470 nm. The data is stored in the RAM area of the capture memory 10. After that, from the data in this RAM, search for a peak at wavelength 45r') and 1 nm, and as in the case of the excitation spectrometer M e, set the wavelength counter #
The fluorescence spectrometer is driven so that the 1 value corresponds to the 1st peak, and at that position the wavelength counter is set to the correct wavelength value of 450. ]. Note that an emission line other than 4.50.1 nm may be used.

In the above embodiment, the shutter 3 is placed between the sample cell position and the fluorescence spectrometer Mf, but it may be placed between the beam splitter 4 and the sample cell position.

1. Effect The device of the present invention has the above-mentioned configuration and uses the light source of a spectrofluorophotometer, so it is necessary to prepare another light source and provide a mechanism for moving the light source into and out of the measurement optical path. There is no need for it, and the attached optical path and shutter are used, but it is structurally simpler and cheaper than the light source and entry/exit mechanism described in F. It is not necessary to place a wavelength calibration element such as a mirror at the sample position, so the wavelength can be easily adjusted. The calibration operation is carried out in the cylinder, and the wavelength calibration can be performed by placing a sample cell and other optional accessories in the sample chamber.

[Brief explanation of drawings]

FIG. 1 is a plan view of an optical system according to an embodiment of the present invention, FIG. 2 is a block diagram of a control system according to the same embodiment, and FIG. 3 is a plan view of a conventional optical system.

Claims (1)

[Claims] An optical system that guides light from the light source chamber to the fluorescence spectrometer without passing through the excitation spectrometer, a shutter that blocks the light passing through this optical system, and an optical path from the excitation spectrometer to the fluorescence spectrometer through the sample cell position. A spectrofluorometer characterized by having a shutter that allows light to pass through.