JPS62153579U - - Google Patents
Info
- Publication number
- JPS62153579U JPS62153579U JP4075186U JP4075186U JPS62153579U JP S62153579 U JPS62153579 U JP S62153579U JP 4075186 U JP4075186 U JP 4075186U JP 4075186 U JP4075186 U JP 4075186U JP S62153579 U JPS62153579 U JP S62153579U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- measured
- elastic body
- axis
- sleeve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図ａは本考案の一実施例のコンタクトピン
を示す要部側面図、第１図ｂは本考案の一実施例
のコンタクトピンを示す平面図、第２図は従来の
コンタクトピンの使用状態を示す一部断面図であ
る。
２……スリーブ、９……接触子、９ａ……中心
軸、１０……先端部。
Fig. 1a is a side view of a main part showing a contact pin according to an embodiment of the present invention, Fig. 1b is a plan view showing a contact pin according to an embodiment of the present invention, and Fig. 2 is a conventional use of a contact pin. It is a partial sectional view showing a state. 2... Sleeve, 9... Contact, 9a... Center shaft, 10... Tip.
Claims (1)
能な接触子と、その接触子を前記被測定部方向へ
押圧する弾性体部と、前記接触子と弾性体部とを
保持するスリーブとを有し、かつ、前記被測定部
と接触可能な前記接触子の先端部を前記接触子の
回転中心軸上以外に偏心させてなることを特徴と
するコンタクトピン。 A contact that can move toward and away from the part to be measured and can rotate about an axis, an elastic body that presses the contact toward the part to be measured, and the contact and the elastic body are held. 1. A contact pin, comprising a sleeve, and wherein a tip end of the contact that is capable of contacting the part to be measured is eccentric to a position other than the rotation center axis of the contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986040751U JPH065639Y2 (en) | 1986-03-20 | 1986-03-20 | Contact pin |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986040751U JPH065639Y2 (en) | 1986-03-20 | 1986-03-20 | Contact pin |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62153579U true JPS62153579U (en) | 1987-09-29 |
| JPH065639Y2 JPH065639Y2 (en) | 1994-02-09 |
Family
ID=30855111
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986040751U Expired - Lifetime JPH065639Y2 (en) | 1986-03-20 | 1986-03-20 | Contact pin |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH065639Y2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007093216A (en) * | 2005-09-27 | 2007-04-12 | Japan Electronic Materials Corp | Contact probe and probe card |
| WO2007132739A1 (en) * | 2006-05-15 | 2007-11-22 | Nidec-Read Corporation | Substrate inspecting jig, and electrode structure of connecting electrode unit in the jig |
| JP2009270836A (en) * | 2008-04-30 | 2009-11-19 | Totoku Electric Co Ltd | Probe needle and manufacturing method thereof |
| JP2013061186A (en) * | 2011-09-12 | 2013-04-04 | Nidec-Read Corp | Connection terminal and connection tool |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5256287U (en) * | 1975-10-22 | 1977-04-22 | ||
| JPS5978976U (en) * | 1982-11-17 | 1984-05-28 | 株式会社リコー | Rotary contact for checking electrical connections |
| JPS6112072A (en) * | 1984-06-27 | 1986-01-20 | Hitachi Ltd | Semiconductor device |
-
1986
- 1986-03-20 JP JP1986040751U patent/JPH065639Y2/en not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5256287U (en) * | 1975-10-22 | 1977-04-22 | ||
| JPS5978976U (en) * | 1982-11-17 | 1984-05-28 | 株式会社リコー | Rotary contact for checking electrical connections |
| JPS6112072A (en) * | 1984-06-27 | 1986-01-20 | Hitachi Ltd | Semiconductor device |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007093216A (en) * | 2005-09-27 | 2007-04-12 | Japan Electronic Materials Corp | Contact probe and probe card |
| JP4627024B2 (en) * | 2005-09-27 | 2011-02-09 | 日本電子材料株式会社 | Contact probe and probe card |
| WO2007132739A1 (en) * | 2006-05-15 | 2007-11-22 | Nidec-Read Corporation | Substrate inspecting jig, and electrode structure of connecting electrode unit in the jig |
| JP2009270836A (en) * | 2008-04-30 | 2009-11-19 | Totoku Electric Co Ltd | Probe needle and manufacturing method thereof |
| JP2013061186A (en) * | 2011-09-12 | 2013-04-04 | Nidec-Read Corp | Connection terminal and connection tool |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH065639Y2 (en) | 1994-02-09 |